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@article{555296,
author = {Humlíček, Josef and Bernhard, Christian},
article_location = {Oxford},
article_number = {1},
keywords = {Infrared ellipsometry; Diffraction; Metals},
language = {eng},
issn = {0040-6090},
journal = {Thin Solid Films},
title = {Diffraction effects in infrared ellipsometry of conducting samples},
volume = {455-456},
year = {2004}
}
TY - JOUR
ID - 555296
AU - Humlíček, Josef - Bernhard, Christian
PY - 2004
TI - Diffraction effects in infrared ellipsometry of conducting samples
JF - Thin Solid Films
VL - 455-456
IS - 1
SP - 177-182
EP - 177-182
PB - Elsevier
SN - 00406090
KW - Infrared ellipsometry
KW - Diffraction
KW - Metals
N2 - We investigate theoretically polarization effects occurring in infrared spectra of finite-size conducting samples. In ellipsometric data taken at grazing incidence, a strong influence of sample edges is observed even for sample dimensions of several hundreds of a wavelength. As usual, the ellipsometric technique is found to be very efficient in supplying both magnitudes and phases of the polarized light waves. We present a comparison of the calculations with experimental far-infrared data of copper.
ER -
HUMLÍČEK, Josef a Christian BERNHARD. Diffraction effects in infrared ellipsometry of conducting samples. \textit{Thin Solid Films}. Oxford: Elsevier, 2004, roč.~455-456, č.~1, s.~177-182. ISSN~0040-6090.
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