Výpis publikací

YU, Li, Dominik MUNZAR, A. V. BORIS, P. YORDANOV, Jiří CHALOUPKA, Th. WOLF, C. T. LIN, B. KEIMER a C. BERNHARD. Evidence for Two Separate Energy Gaps in Underdoped High-Temperature Cuprate Superconductors from Broadband Infrared Ellipsometry. Physical Review Letters. USA: The Americal Physical Society, 2008, roč. 100, č. 17, s. 177004-177007. ISSN 0031-9007.

HUMLÍČEK, Josef a Vlastimil KŘÁPEK. Infrared Response of Heavily Doped p-type Si and SiGe Alloys from Ellipsometric Measurements. In CP772, Physics of Semiconductors: 27th International Conference on the Physics of Semiconductors. USA: American Institute of Physics, 2005, s. 113-114. ISBN 0-7354-0257--4.

HUMLÍČEK, Josef a Christian BERNHARD. Diffraction effects in infrared ellipsometry of conducting samples. Thin Solid Films. Oxford: Elsevier, 2004, roč. 455-456, č. 1, s. 177-182. ISSN 0040-6090.

DUBROKA, Adam, G. CRISTIANI, H.-U. HABERMEIER a Josef HUMLÍČEK. Infrared study of YBa2Cu3O7/La0.67Ca0.33MnO3 superlattices. Thin Solid Films. Oxford, UK: Elsevier science, 2004, roč. 2004, č. 455, s. 172-176. ISSN 0040-6090.