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@inproceedings{600224, author = {Humlíček, Josef and Křápek, Vlastimil}, address = {USA}, booktitle = {CP772, Physics of Semiconductors: 27th International Conference on the Physics of Semiconductors}, keywords = {silico-germanium alloys; infrared ellipsometry}, language = {eng}, location = {USA}, isbn = {0-7354-0257--4}, pages = {113-114}, publisher = {American Institute of Physics}, title = {Infrared Response of Heavily Doped p-type Si and SiGe Alloys from Ellipsometric Measurements}, year = {2005} }
TY - JOUR ID - 600224 AU - Humlíček, Josef - Křápek, Vlastimil PY - 2005 TI - Infrared Response of Heavily Doped p-type Si and SiGe Alloys from Ellipsometric Measurements PB - American Institute of Physics CY - USA SN - 0735402574 KW - silico-germanium alloys KW - infrared ellipsometry N2 - We report here ellipsometric spectra of Si and SiGe alloys heavily doped with boron. In the mid-infrared range, the response can be separated into the contributions of free-hole plasma and direct intervalence transitions. The first contribution extrapolates correctly to the zero-frequency resistance, the second is in a good agreement with the 8-band k.p calculation. ER -
HUMLÍČEK, Josef a Vlastimil KŘÁPEK. Infrared Response of Heavily Doped p-type Si and SiGe Alloys from Ellipsometric Measurements. In \textit{CP772, Physics of Semiconductors: 27th International Conference on the Physics of Semiconductors}. USA: American Institute of Physics, 2005, s.~113-114. ISBN~0-7354-0257--4.
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