| ROCH, Tomáš, Mojmír MEDUŇA, Julian STANGL, Anke HESSE, Rainer T LECHNER, Guenther BAUER, G. DEHLINGER, L. DIEHL, U. GENNSER, Elisabeth MÜLLER a Detlev GRÜTZMACHER. Interface roughness in SiGe quantum-cascade structures from x-ray reflectivity studies. Journal of Applied Physics. USA: American Institute of Physics, 2001, roč. 91, č. 11, s. 8974-8978. ISSN 0021-8979. |
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@article{753444,
author = {Roch, Tomáš and Meduňa, Mojmír and Stangl, Julian and Hesse, Anke and Lechner, Rainer T and Bauer, Guenther and Dehlinger, G. and Diehl, L. and Gennser, U. and Müller, Elisabeth and Grützmacher, Detlev},
article_location = {USA},
article_number = {11},
keywords = {superlatitces; multilayers; scattering; quality},
language = {eng},
issn = {0021-8979},
journal = {Journal of Applied Physics},
title = {Interface roughness in SiGe quantum-cascade structures from x-ray reflectivity studies},
volume = {91},
year = {2001}
}
TY - JOUR
ID - 753444
AU - Roch, Tomáš - Meduňa, Mojmír - Stangl, Julian - Hesse, Anke - Lechner, Rainer T - Bauer, Guenther - Dehlinger, G. - Diehl, L. - Gennser, U. - Müller, Elisabeth - Grützmacher, Detlev
PY - 2001
TI - Interface roughness in SiGe quantum-cascade structures from x-ray reflectivity studies
JF - Journal of Applied Physics
VL - 91
IS - 11
SP - 8974-8978
EP - 8974-8978
PB - American Institute of Physics
SN - 00218979
KW - superlatitces
KW - multilayers
KW - scattering
KW - quality
N2 - We have investigated the structural properties of Si/SiGe electroluiminescent quantum-cascade structures, by means of x-ray reflectivity and diffraction.
ER -
ROCH, Tomáš, Mojmír MEDUŇA, Julian STANGL, Anke HESSE, Rainer T LECHNER, Guenther BAUER, G. DEHLINGER, L. DIEHL, U. GENNSER, Elisabeth MÜLLER a Detlev GRÜTZMACHER. Interface roughness in SiGe quantum-cascade structures from x-ray reflectivity studies. \textit{Journal of Applied Physics}. USA: American Institute of Physics, 2001, roč.~91, č.~11, s.~8974-8978. ISSN~0021-8979.
|
