Výpis publikací

MEDUŇA, Mojmír; Jiří NOVÁK; Günther BAUER; Claudiu FALUB a Detlev GRÜTZMACHER. Interdiffusion in SiGe alloys with Ge contents of 25% and 50% studied by x-ray reflectivity. Physica stat.sol.(a). 2008, roč. 205, č. 10, s. 2441-2448. ISSN 1862-6300.

BURŠÍKOVÁ, Vilma; Jaroslav SOBOTA; Tomáš FOŘT; Jan GROSSMAN; Adrian STOICA; Jiří BURŠÍK; Petr KLAPETEK a Vratislav PEŘINA. Optimisation of mechanical properties of plasma deposited graded multilayer diamond-like carbon coatings. Journal of Optoelectronics and Advanced Materials. Bucharest: INOE & INFM, 2008, roč. 10/2008, č. 12, s. 3229-3232. ISSN 1454-4164.

MEDUŇA, Mojmír; Jiří NOVÁK; Václav HOLÝ; Günther BAUER; Claudiu FALUB; Soichiro TSUJINO a Detlev GRÜTZMACHER. In-situ investigations of Si and Ge interdiffusion in Si cascade structures. Synchrotron Radiation in Natural Sciences. Warsaw: Polish Synchrotron Radiation Society, 2006, roč. 5, 1-2, s. 76. ISSN 1644-7190.

CAHA, Ondřej; Václav HOLÝ a Kevin BASSLER. Nonlinear Evolution of Surface Morphology in InAs/AlAs Superlattices via Surface Diffusion. Physical Review Letters. USA: The Americal Physical Society, 2006, roč. 96, č. 13, s. 136102-136105. ISSN 0031-9007.

HOLY, V.; T. ROCH; J. STANGL a G. BAUER. Grazing incidence small-angle x-ray scattering study of self-organized SiGe wires. Phys. Rev. B. USA: The American Phys. Society, 2001, roč. 63, č. 20, s. 5318-5327. ISSN 0163-1829.

ROCH, Tomáš; Mojmír MEDUŇA; Julian STANGL; Anke HESSE; Rainer T LECHNER; Guenther BAUER; G. DEHLINGER; L. DIEHL; U. GENNSER; Elisabeth MÜLLER a Detlev GRÜTZMACHER. Interface roughness in SiGe quantum-cascade structures from x-ray reflectivity studies. Journal of Applied Physics. USA: American Institute of Physics, 2001, roč. 91, č. 11, s. 8974-8978. ISSN 0021-8979.

BOCHNÍČEK, Zdeněk a Ivo VÁVRA. Thermal stability of partially crystalline Nb/Si multilayers. J. Phys. D: Appl. Phys. 2001, roč. 34, 10A, s. A214, 5 s. ISSN 0022-3727.

JERGEL, M.; Petr MIKULÍK; E. MAJKOVÁ; Š. LUBY; R. SENDERÁK; E. PINČÍK; M. BRUNEL; P. HUDEK; I. KOSTIČ a A. KONEČNÍKOVÁ. Structural characterization of a lamellar W/Si multilayer grating. J. Appl. Phys. USA: American Institute of Physics, 1999, roč. 85, č. 2, s. 1225-1227. ISSN 0021-8979.

JERGEL, M.; Petr MIKULÍK; E. MAJKOVÁ; Š. LUBY; R. SENDERÁK; E. PINČÍK; M. BRUNEL; I. KOSTIČ a A. KONEČNÍKOVÁ. Structural characterization of lamellar multilayer gratings by X-ray reflectivity and scanning electron microscopy. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 1999, roč. 32, č. 9999, s. A220, 4 s. ISSN 0022-3727.

MIKULÍK, Petr. Scattering on aperiodic superlattices. In Beyond Quasicrystals. Les Ulis: Les Editions de Physique, 1995, s. 229-247. ISBN 3540592512.