| KLAPETEK, Petr, Jiří BURŠÍK, Miroslav VALTR a Jan MARTÍNEK. Near-field scanning optical microscope probe analysis. Ultramicroscopy. Amsterdam: Elsevier, 2008, roč. 108, č. 7, s. 671-676. ISSN 0304-3991. Dostupné z: https://dx.doi.org/10.1016/j.ultramic.2007.10.014. |
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@article{767721,
author = {Klapetek, Petr and Buršík, Jiří and Valtr, Miroslav and Martínek, Jan},
article_location = {Amsterdam},
article_number = {7},
doi = {http://dx.doi.org/10.1016/j.ultramic.2007.10.014},
keywords = {NSOM;Artifacts},
language = {eng},
issn = {0304-3991},
journal = {Ultramicroscopy},
title = {Near-field scanning optical microscope probe analysis},
volume = {108},
year = {2008}
}
TY - JOUR
ID - 767721
AU - Klapetek, Petr - Buršík, Jiří - Valtr, Miroslav - Martínek, Jan
PY - 2008
TI - Near-field scanning optical microscope probe analysis
JF - Ultramicroscopy
VL - 108
IS - 7
SP - 671-676
EP - 671-676
PB - Elsevier
SN - 03043991
KW - NSOM;Artifacts
N2 - In this article results of a comparison of two NSOM probe characterization methods are presented. Scanning electron microscopy analysis combined with electromagnetic field modeling using the finite difference in time domain method are compared with measured far-field radiation diagrams of NSOM probes. It is shown that measurement of far-field radiation diagrams can be an efficient tool for daily checking of the NSOM probes quality. Moreover, it is shown that the inner probe geometry has large influence on the directional radiation of an NSOM probe and the far-field radiation diagram can be used as a simple method to distinguish between different probe geometries.
ER -
KLAPETEK, Petr, Jiří BURŠÍK, Miroslav VALTR a Jan MARTÍNEK. Near-field scanning optical microscope probe analysis. \textit{Ultramicroscopy}. Amsterdam: Elsevier, 2008, roč.~108, č.~7, s.~671-676. ISSN~0304-3991. Dostupné z: https://dx.doi.org/10.1016/j.ultramic.2007.10.014.
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