X-ray diffracted intensity for double-reflection channel-cut Ge
monochromators at extremely asymmetric diffraction conditions

J 2011

X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions

FERRARI, C.; F. GERMINI; D. KORYTÁR; Petr MIKULÍK; L. PEVERINI et al.

Základní údaje

Originální název

X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions

Autoři

FERRARI, C.; F. GERMINI; D. KORYTÁR; Petr MIKULÍK a L. PEVERINI

Vydání

Journal of Applied Crystallography, 2011, 0021-8898

Další údaje

Jazyk

angličtina

Typ výsledku

Článek v odborném periodiku

Obor

10302 Condensed matter physics

Stát vydavatele

Velká Británie a Severní Irsko

Utajení

není předmětem státního či obchodního tajemství

Odkazy

URL

Impakt faktor

Impact factor: 5.152

Označené pro přenos do RIV

Ano

Kód RIV

RIV/00216224:14310/11:00054738

Organizační jednotka

Přírodovědecká fakulta

DOI

https://doi.org/10.1107/S0021889811001439

UT WoS

000288758500012

Klíčová slova anglicky

X-ray diffraction; X-ray optics; Monochromators

Štítky

AKR, rivok

Příznaky

Mezinárodní význam, Recenzováno

Změněno: 20. 4. 2012 11:49, Ing. Andrea Mikešková

Anotace

V originále

The width and integrated intensity of the 220 X-ray double-diffraction profile and the shift of the Bragg condition due to refraction have been measured in a channel-cut Ge crystal in an angular range near the critical angle of total external reflection. The Bragg angle and incidence condition were varied by changing the X-ray energy. In agreement with the extended dynamical theory of X-ray diffraction, the integrated intensity of the double diffraction remained almost constant, even for the grazing-incidence condition very close to the critical angle for total external reflection. A broadening of the diffraction profile not predicted by the extended theory of X-ray diffraction was observed when the Bragg condition was at angles of incidence lower than 0.6 deg. Plane wave topographs revealed a contrast that could be explained by a slight residual crystal surface undulation of 0.3 deg due to etching to remove the cutting damage and the increasing effect of refraction at small glancing angles.

Návaznosti

MSM0021622410, záměr

Název: Fyzikální a chemické vlastnosti pokročilých materiálů a struktur

Investor: Ministerstvo školství, mládeže a tělovýchovy ČR, Fyzikální a chemické vlastnosti pokročilých materiálů a struktur

Citovat

FERRARI, C.; F. GERMINI; D. KORYTÁR; Petr MIKULÍK a L. PEVERINI. X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions. Journal of Applied Crystallography. 2011, roč. 44, č. 44, s. 353-358. ISSN 0021-8898. Dostupné z: https://doi.org/10.1107/S0021889811001439.

@article{964880,
   author = {Ferrari, C. and Germini, F. and Korytár, D. and Mikulík, Petr and Peverini, L.},
   article_number = {44},
   doi = {https://doi.org/10.1107/S0021889811001439},
   keywords = {X-ray diffraction; X-ray optics; Monochromators},
   language = {eng},
   issn = {0021-8898},
   journal = {Journal of Applied Crystallography},
   title = {X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions},
   url = {http://scripts.iucr.org/cgi-bin/paper?S0021889811001439},
   volume = {44},
   year = {2011}
}

TY  - JOUR
ID  - 964880
AU  - Ferrari, C. - Germini, F. - Korytár, D. - Mikulík, Petr - Peverini, L.
PY  - 2011
TI  - X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions
JF  - Journal of Applied Crystallography
VL  - 44
IS  - 44
SP  - 353-358
EP  - 353-358
SN  - 00218898
KW  - X-ray diffraction
KW  - X-ray optics
KW  - Monochromators
UR  - http://scripts.iucr.org/cgi-bin/paper?S0021889811001439
L2  - http://scripts.iucr.org/cgi-bin/paper?S0021889811001439
N2  - The width and integrated intensity of the 220 X-ray double-diffraction profile and the shift of the Bragg condition due to refraction have been measured in a channel-cut Ge crystal in an angular range near the critical angle of total external reflection. The Bragg angle and incidence condition were varied by changing the X-ray energy. In agreement with the extended dynamical theory of X-ray diffraction, the integrated intensity of the double diffraction remained almost constant, even for the grazing-incidence condition very close to the critical angle for total external reflection. A broadening of the diffraction profile not predicted by the extended theory of X-ray diffraction was observed when the Bragg condition was at angles of incidence lower than 0.6 deg. Plane wave topographs revealed a contrast that could be explained by a slight residual crystal surface undulation of 0.3 deg due to etching to remove the cutting damage and the increasing effect of refraction at small glancing angles.
ER  -

FERRARI, C.; F. GERMINI; D. KORYTÁR; Petr MIKULÍK a L. PEVERINI. X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions. \textit{Journal of Applied Crystallography}. 2011, roč.~44, č.~44, s.~353-358. ISSN~0021-8898. Dostupné z: https://doi.org/10.1107/S0021889811001439.

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