Výpis publikací

ŠTOUDEK, Richard. Infrared Absorption Spectroscopy of Defects in Floating Zone Silicon. In Marta Kořenská and Luboš Pazdera. 8th Interantional Conference NDT 2010 - Non-Destructive Testing in Engineering Practice (id 18982). Brno: CERM, 2010, s. 199-204. ISBN 978-80-7204-723-9.

ŠTOUDEK, Richard a Josef HUMLÍČEK. Infrared spectroscopy of oxygen interstitials and precipitates in nitrogen-doped silicon. Physica B condensed matter. Amsterdam: Elsevier Science, 2006, roč. 376-377, č. 6, s. 150-153. ISSN 0921-4526.

HUMLÍČEK, Josef, Richard ŠTOUDEK a Adam DUBROKA. Infrared vibrations of interstitial oxygen in silicon-rich SiGe alloys. Physica B. Amsterdam: Elsevier Science, 2006, roč. 376-377, č. 6, s. 212-215. ISSN 0921-4526.

ŠTOUDEK, Richard, Pavel KLANG, Alan KUBĚNA a Josef KUBĚNA. Nucleation and Precipitation of Interstitial Oxygen in Czochralski Silicon. In Proceedings of The Tenth Scientific and Business Conference SILICON 2006. Rožnov pod Radhoštěm, Česká republika: TECON Scientific, s.r.o., 2006, s. 283-284. ISBN 80-239-7781-4.

KLANG, Pavel, Václav HOLÝ, Josef KUBĚNA, Richard ŠTOUDEK a Jan ŠIK. X-ray diffuse scattering from defects in nitrogen-doped Czochralski grown silicon wafers. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2005, roč. 2005, č. 38, s. A105-A110, 6 s. ISSN 0022-3727.

ŠTOUDEK, Richard a Josef HUMLÍČEK. Infrared Absorption Spectroscopy of Oxygen Precipitates in Czochralski Silicon. In WDS'04 Proceedings of Contributed Papers. Praha, Česká republika: MATFYZPRESS, 2004, s. 475-479, 4 s. ISBN 80-86732-32-0.

ŠTOUDEK, Richard, Michal LORENC a Josef HUMLÍČEK. Infrared Absorption Spectroscopy of Oxygen Precipitates in Nitrogen-doped Czochralski Silicon. In Proceedings of The Ninth Scientific and Business Conference SILICON 2004. Rožnov pod Radhoštěm, Česká republika: TECON Scientific, s.r.o., 2004, s. 146-150.

KLANG, Pavel, Václav HOLÝ, Richard ŠTOUDEK a Jan ŠIK. X-ray Diffuse Scattering from Defects in Nitrogen-doped Czochralski Grown Silicon Wafers. In Proceedings of The Ninth Scientific and Business Conference SILICON 2004. 2004. vyd. Rožnov pod Radhoštěm, Česká republika: TECON Scientific, s.r.o., 2004, s. 53.

ŠIK, Jan, Michal LORENC a Richard ŠTOUDEK. Nitrogen in Czochralski-grown silicon. In SILICON 2002, Rožnov pod Radhostěm, TECON Scientific, editor K. Vojtěchovský. Neuveden: Neuveden, 2002, s. 125-128.