Masaryk University

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    2007

    1. Interdiffusion in SiGe alloys studied by x-rays
      MEDUŇA, Mojmír, Jiří NOVÁK, Günther BAUER, Václav HOLÝ, Claudiu FALUB, Soichiro TSUJINO and Detlev GRÜTZMACHER. Interdiffusion in SiGe alloys studied by x-rays. Materials Structure in Chemistry, Biology, Physics and Technology. Praha, 2007, vol. 14, No 2, p. 122-123. ISSN 1211-5894.
      Name in Czech: Interdifúze v SiGe slitinách studovaná pomocí rtg
      RIV/00216224:14310/07:00020385 Article in a journal. Solid-state physics and magnetism. English. Czech Republic.
      Meduňa, Mojmír (203 Czech Republic, guarantor) -- Novák, Jiří (203 Czech Republic) -- Bauer, Günther (40 Austria) -- Holý, Václav (203 Czech Republic) -- Falub, Claudiu (642 Romania) -- Tsujino, Soichiro (392 Japan) -- Grützmacher, Detlev (276 Germany)
      Keywords in English: x-ray reflectivity; interdiffusion; SiGe
      International impact: yes
      Changed by: Mgr. Mojmír Meduňa, Ph.D., učo 7898. Changed: 31/1/2008 14:21.
      More: https://is.muni.cz/publication/720786/en

    2006

    1. In-situ investigations of Si and Ge interdiffusion in Si cascade structures
      MEDUŇA, Mojmír, Jiří NOVÁK, Václav HOLÝ, Günther BAUER, Claudiu FALUB, Soichiro TSUJINO and Detlev GRÜTZMACHER. In-situ investigations of Si and Ge interdiffusion in Si cascade structures. Synchrotron Radiation in Natural Sciences. Warsaw: Polish Synchrotron Radiation Society, 2006, vol. 5, 1-2, p. 76. ISSN 1644-7190.
      Name in Czech: In-situ studie Si a Ge interdifuse v Si kaskádových strukturách
      RIV/00216224:14310/06:00016352 Article in a journal. Solid-state physics and magnetism. English. Poland.
      Meduňa, Mojmír (203 Czech Republic, guarantor) -- Novák, Jiří (203 Czech Republic) -- Holý, Václav (203 Czech Republic) -- Bauer, Günther (40 Austria) -- Falub, Claudiu (642 Romania) -- Tsujino, Soichiro (392 Japan) -- Grützmacher, Detlev (276 Germany)
      Keywords in English: x-ray reflectivity; multilayers; interdiffusion; SiGe
      International impact: yes
      Changed by: Mgr. Mojmír Meduňa, Ph.D., učo 7898. Changed: 24/1/2007 14:21.
      More: https://is.muni.cz/publication/710328/en
    2. IN-SITU INVESTIGATIONS OF SI AND GE INTERDIFFUSION IN SI CASCADE STRUCTURES
      MEDUŇA, Mojmír, Jiří NOVÁK, Václav HOLÝ, Claudiu FALUB, Günther BAUER and Detlev GRÜTZMACHER. IN-SITU INVESTIGATIONS OF SI AND GE INTERDIFFUSION IN SI CASCADE STRUCTURES. Materials Structure in Chemistry, Biology, Physics and Technology. Praha, 2006, vol. 13, No 3, p. 161. ISSN 1211-5894.
      Name in Czech: In-situ studie Si a Ge interdifuse v Si kaskádových strukturách
      RIV/00216224:14310/06:00016353 Article in a journal. Solid-state physics and magnetism. English. Czech Republic.
      Meduňa, Mojmír (203 Czech Republic, guarantor) -- Novák, Jiří (203 Czech Republic) -- Holý, Václav (203 Czech Republic) -- Falub, Claudiu (642 Romania) -- Bauer, Günther (40 Austria) -- Grützmacher, Detlev (276 Germany)
      Keywords in English: x-ray diffraction; interdiffusion; SiGe
      International impact: yes
      Changed by: Mgr. Mojmír Meduňa, Ph.D., učo 7898. Changed: 24/1/2007 15:03.
      More: https://is.muni.cz/publication/710342/en

    2005

    1. High temperature investigations of Si/SiGe based cascade structures using x-ray scattering methods
      MEDUŇA, Mojmír, Jiří NOVÁK, Claudiu FALUB, Gang CHEN, Günther BAUER, Soichiro TSUJINO, Detlev GRÜTZMACHER, Elisabeth MÜLLER, Yves CAMPIDELLI, Olivier KERMARREC, Daniel BENSAHEL and Norbert SCHELL. High temperature investigations of Si/SiGe based cascade structures using x-ray scattering methods. J. Phys. D: Appl. Phys. Bristol, UK: IOP Publishing, Ltd., 2005, vol. 38, 10A, p. A121-A125, 5 pp. ISSN 0022-3727.
      Name in Czech: Vysokoteplotní studia kaskádových struktur na bázi Si/SiGe za použití metod rtg rozptylu
      RIV/00216224:14310/05:00014587 Article in a journal. Solid-state physics and magnetism. English. United Kingdom of Great Britain and Northern Ireland.
      Meduňa, Mojmír (203 Czech Republic, guarantor) -- Novák, Jiří (203 Czech Republic) -- Falub, Claudiu (642 Romania) -- Chen, Gang (156 China) -- Bauer, Günther (40 Austria) -- Tsujino, Soichiro (392 Japan) -- Grützmacher, Detlev (276 Germany) -- Müller, Elisabeth (756 Switzerland) -- Campidelli, Yves (250 France) -- Kermarrec, Olivier (250 France) -- Bensahel, Daniel (250 France) -- Schell, Norbert (276 Germany)
      Keywords in English: X-ray reflectivity; SiGe; Annealing; Diffusion
      International impact: yes
      Reviewed: yes
      Changed by: Mgr. Mojmír Meduňa, Ph.D., učo 7898. Changed: 14/2/2007 09:39.
      More: https://is.muni.cz/publication/617865/en

    2000

    1. RTG reflexe laterálních struktur SiGe (X-ray reflection on lateral structures SiGe)
      MEDUŇA, Mojmír, Václav HOLÝ, Josef KUBĚNA, Julian STANGL, Gunter BAUER, Jian-hong ZHU and Karl BRUNNER. RTG reflexe laterálních struktur SiGe (X-ray reflection on lateral structures SiGe). In 13. konference slovenských a českých fyzikov. Zvolen: Slovenská fyzikálna spoločnosť, 2000, p. 237-239. ISBN 80-228-0876-8.
      Name (in English): X-ray reflection on lateral structures SiGe
      RIV/00216224:14310/00:00002224 Proceedings paper. Solid-state physics and magnetism. Czech. Slovakia.
      Meduňa, Mojmír (203 Czech Republic, guarantor) -- Holý, Václav (203 Czech Republic) -- Kuběna, Josef (203 Czech Republic)
      Keywords in English: SiGe; self-assembled structures; x-ray scattering; AFM
      Changed by: Mgr. Mojmír Meduňa, Ph.D., učo 7898. Changed: 14/2/2007 09:51.
      More: https://is.muni.cz/publication/257711/en

    1999

    1. Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high resolution x-ray diffraction and grazing incidence diffraction
      ZHUANG, Y., Václav HOLÝ, J. STANGL, A.A. DARHUBER, Petr MIKULÍK, S. ZERLAUTH, F. SCHÄFFLER, G. BAUER, N. DAROWSKI, D. LÜBBERT and U. PIETSCH. Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high resolution x-ray diffraction and grazing incidence diffraction. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 1999, vol. 32, No 9999, p. A224, 6 pp. ISSN 0022-3727.
      URL
      Name (in English): Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high resolution x-ray diffraction and grazing incidence diffraction
      RIV/00216224:14310/99:00001016 Article in a journal. Solid-state physics and magnetism. English. United Kingdom of Great Britain and Northern Ireland.
      Holý, Václav (203 Czech Republic) -- Mikulík, Petr (203 Czech Republic, guarantor)
      Keywords in English: quantum wires; SiGe; x-ray diffraction; GID
      International impact: yes
      Reviewed: yes
      Changed by: doc. RNDr. Petr Mikulík, Ph.D., učo 855. Changed: 12/2/2007 18:57.
      More: https://is.muni.cz/publication/205589/en
    2. X-ray diffraction from quantum wires and quantum dots
      ZHUANG, Y., J. STANGL, A.A. DARHUBER, G. BAUER, Petr MIKULÍK, Václav HOLÝ, N, DAROWSKI and U. PIETSCH. X-ray diffraction from quantum wires and quantum dots. Journal of Materials Science: Materials in Electronics. Great Britain: Kluwer Academic Publishers, 1999, (10)1999, -, p. 215-221. ISSN 0957-4522.
      Name (in English): X-ray diffraction from quantum wires and quantum dots
      RIV/00216224:14310/99:00000037 Article in a journal. Solid-state physics and magnetism. English. United States of America.
      Mikulík, Petr (203 Czech Republic, guarantor) -- Holý, Václav (203 Czech Republic)
      Keywords in English: quantum wires; quantum dots; SiGe; x-ray diffraction
      International impact: yes
      Reviewed: yes
      Changed by: doc. RNDr. Petr Mikulík, Ph.D., učo 855. Changed: 12/2/2007 18:55.
      More: https://is.muni.cz/publication/215971/en
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