Publication Records

MEDUŇA, Mojmír, Jiří NOVÁK, Günther BAUER, Václav HOLÝ, Claudiu FALUB, Soichiro TSUJINO and Detlev GRÜTZMACHER. Interdiffusion in SiGe alloys studied by x-rays. Materials Structure in Chemistry, Biology, Physics and Technology. Praha, 2007, vol. 14, No 2, p. 122-123. ISSN 1211-5894.

MEDUŇA, Mojmír, Jiří NOVÁK, Václav HOLÝ, Günther BAUER, Claudiu FALUB, Soichiro TSUJINO and Detlev GRÜTZMACHER. In-situ investigations of Si and Ge interdiffusion in Si cascade structures. Synchrotron Radiation in Natural Sciences. Warsaw: Polish Synchrotron Radiation Society, 2006, vol. 5, 1-2, p. 76. ISSN 1644-7190.

MEDUŇA, Mojmír, Jiří NOVÁK, Václav HOLÝ, Claudiu FALUB, Günther BAUER and Detlev GRÜTZMACHER. IN-SITU INVESTIGATIONS OF SI AND GE INTERDIFFUSION IN SI CASCADE STRUCTURES. Materials Structure in Chemistry, Biology, Physics and Technology. Praha, 2006, vol. 13, No 3, p. 161. ISSN 1211-5894.

MEDUŇA, Mojmír, Jiří NOVÁK, Claudiu FALUB, Gang CHEN, Günther BAUER, Soichiro TSUJINO, Detlev GRÜTZMACHER, Elisabeth MÜLLER, Yves CAMPIDELLI, Olivier KERMARREC, Daniel BENSAHEL and Norbert SCHELL. High temperature investigations of Si/SiGe based cascade structures using x-ray scattering methods. J. Phys. D: Appl. Phys. Bristol, UK: IOP Publishing, Ltd., 2005, vol. 38, 10A, p. A121-A125, 5 pp. ISSN 0022-3727.

MEDUŇA, Mojmír, Václav HOLÝ, Josef KUBĚNA, Julian STANGL, Gunter BAUER, Jian-hong ZHU and Karl BRUNNER. RTG reflexe laterálních struktur SiGe (X-ray reflection on lateral structures SiGe). In 13. konference slovenských a českých fyzikov. Zvolen: Slovenská fyzikálna spoločnosť, 2000, p. 237-239. ISBN 80-228-0876-8.

ZHUANG, Y., Václav HOLÝ, J. STANGL, A.A. DARHUBER, Petr MIKULÍK, S. ZERLAUTH, F. SCHÄFFLER, G. BAUER, N. DAROWSKI, D. LÜBBERT and U. PIETSCH. Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high resolution x-ray diffraction and grazing incidence diffraction. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 1999, vol. 32, No 9999, p. A224, 6 pp. ISSN 0022-3727.

ZHUANG, Y., J. STANGL, A.A. DARHUBER, G. BAUER, Petr MIKULÍK, Václav HOLÝ, N, DAROWSKI and U. PIETSCH. X-ray diffraction from quantum wires and quantum dots. Journal of Materials Science: Materials in Electronics. Great Britain: Kluwer Academic Publishers, 1999, (10)1999, -, p. 215-221. ISSN 0957-4522.