Výpis publikací

KAGANER, V.M.; B. JENICHEN; G. PARIS; K.H. PLOOG; O. KONOVALOV; Petr MIKULÍK a S. ARAI. Strain in buried quantum wires: Analytical calculations and x-ray diffraction study. Phys. Rev. B. USA: The American Phys. Society, 2002, roč. 2002, č. 66, s. 035310-35316. ISSN 0163-1829.

ULYANENKOV, A.; K. INABA; Petr MIKULÍK; N. DAROWSKI; K. OMOTE; J. GRENZER a A. FORCHEL. X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2001, roč. 34, 10A, s. A179, 4 s. ISSN 0022-3727.

ZHUANG, Y.; Václav HOLÝ; J. STANGL; A.A. DARHUBER; Petr MIKULÍK; S. ZERLAUTH; F. SCHÄFFLER; G. BAUER; N. DAROWSKI; D. LÜBBERT a U. PIETSCH. Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high resolution x-ray diffraction and grazing incidence diffraction. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 1999, roč. 32, č. 9999, s. A224, 6 s. ISSN 0022-3727.

ZHUANG, Y.; J. STANGL; A.A. DARHUBER; G. BAUER; Petr MIKULÍK; Václav HOLÝ; N, DAROWSKI a U. PIETSCH. X-ray diffraction from quantum wires and quantum dots. Journal of Materials Science: Materials in Electronics. Great Britain: Kluwer Academic Publishers, 1999, (10)1999, -, s. 215-221. ISSN 0957-4522.