| ULYANENKOV, A., K. INABA, Petr MIKULÍK, N. DAROWSKI, K. OMOTE, J. GRENZER a A. FORCHEL. X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2001, roč. 34, 10A, s. A179, 4 s. ISSN 0022-3727. |
Další formáty:
BibTeX
LaTeX
RIS
@article{362932,
author = {Ulyanenkov, A. and Inaba, K. and Mikulík, Petr and Darowski, N. and Omote, K. and Grenzer, J. and Forchel, A.},
article_location = {Velká Britanie},
article_number = {10A},
keywords = {reflectivity; diffraction; xrd; gid; xrr; quantum wires; GaAs; GaInAs},
language = {eng},
issn = {0022-3727},
journal = {J. Phys. D: Appl. Phys.},
title = {X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires},
url = {http://www.sci.muni.cz/~mikulik/Publications.html#UlyanenkovInabaMikulikDOPGF-JPD-2001},
volume = {34},
year = {2001}
}
TY - JOUR
ID - 362932
AU - Ulyanenkov, A. - Inaba, K. - Mikulík, Petr - Darowski, N. - Omote, K. - Grenzer, J. - Forchel, A.
PY - 2001
TI - X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires
JF - J. Phys. D: Appl. Phys.
VL - 34
IS - 10A
SP - A179
EP - A179
PB - IOP Publishing Ltd
SN - 00223727
KW - reflectivity
KW - diffraction
KW - xrd
KW - gid
KW - xrr
KW - quantum wires
KW - GaAs
KW - GaInAs
UR - http://www.sci.muni.cz/~mikulik/Publications.html#UlyanenkovInabaMikulikDOPGF-JPD-2001
N2 - Combined x-ray diffraction and reflectivity experiments have been performed on free-standing trapezoidal GaAs/InGaAs quantum wires using a conventional x-ray tube. Interpreting the intensity distribution around (004) by curve simulation of the extracted coherent grating truncation rods on the basis of a semikinematical diffraction theory (DWBA) the shape and geometric parameters as well as the strain within the wires could be determined taking the results of a finite element calculation of the atomic displacements into account. The map of the coplanar x-ray reflectivity around (000), as well as the intensity profiles of the coherent grating truncation rods, located equidistantly around the specularly reflected beam, have been recorded in order to estimate the roughness properties of the sample interfaces as well as the wire shape and layer set-up without the influence of strain. All small-angle as well as wide-angle scattering experimental results went in to the mutually consistent estimate of the sample properties. The experiments performed for a conventional x-ray tube supply a parameter set comparable in completeness and precision to that obtained from similar samples by interpreting synchrotron experiments.
ER -
ULYANENKOV, A., K. INABA, Petr MIKULÍK, N. DAROWSKI, K. OMOTE, J. GRENZER a A. FORCHEL. X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires. \textit{J. Phys. D: Appl. Phys.}. Velká Britanie: IOP Publishing Ltd, 2001, roč.~34, 10A, s.~A179, 4 s. ISSN~0022-3727.
|
