Filtrování

    2004

    1. Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy
      FRANTA, Daniel; Ivan OHLÍDAL; Petr KLAPETEK a Miloslav OHLÍDAL. Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy. Surface and Interface Analysis. USA: John Wiley & Sons., 2004, roč. 36, č. 8, s. 1203-1206. ISSN 0142-2421.
      Podrobněji: https://is.muni.cz/publication/562878/cs
    2. Optical properties of ZnTe films prepared by molecular beam epitaxy
      FRANTA, Daniel; Ivan OHLÍDAL; Petr KLAPETEK; Alberto MONTAIGNE-RAMIL; Alberta BONANNI; David STIFTER a Helmut SITTER. Optical properties of ZnTe films prepared by molecular beam epitaxy. Thin Solid Films. Oxford, UK: Elsevier, 2004, roč. 468, 1-2, s. 193-202. ISSN 0040-6090.
      Podrobněji: https://is.muni.cz/publication/562879/cs

    1999

    1. Optical characterization of multilayer systems with randomly rough boundaries
      OHLÍDAL, Ivan; František VIŽĎA a Miloslav OHLÍDAL. Optical characterization of multilayer systems with randomly rough boundaries. In 18th Congress of the International Commision for Optics: Optics for the Next Millennium. Billingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1999, s. 150-151. SPIE Volume 3749. ISBN 0-8194-3234-2.
      Podrobněji: https://is.muni.cz/publication/207732/cs
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