F6530 Spectroscopy techniques

Faculty of Science
Autumn 2014
Extent and Intensity
2/1/0. 3 credit(s) (plus extra credits for completion). Type of Completion: z (credit).
doc. Mgr. Adam Dubroka, Ph.D. (lecturer)
doc. Mgr. Adam Dubroka, Ph.D. (seminar tutor)
Guaranteed by
prof. RNDr. Josef Humlíček, CSc.
Department of Condensed Matter Physics - Physics Section - Faculty of Science
Contact Person: doc. Mgr. Adam Dubroka, Ph.D.
Supplier department: Department of Condensed Matter Physics - Physics Section - Faculty of Science
Mon 14:00–15:50 F1,01014
  • Timetable of Seminar Groups:
F6530/01: Mon 16:00–16:50 F1,01014
Prerequisites (in Czech)
F3060 Oscillations, waves, optics || F3100 Oscillations, waves, optics
Course Enrolment Limitations
The course is offered to students of any study field.
Course objectives
The main objective of the course is to explain to students the construction of spectroscopic systems, principles of measurements and basics of data analysis. The main focus is on optical spectroscopy from infrared to ultraviolet range, the lecture includes the X-ray spectroscopy and nuclear magnetic resonance as well.
  • Spectroscopic units and conversions
    Sources of radiation: broadband, calibration, lasers
    Detectors: photomultiplier, photoconducting, CCD, photon counting. Lock in amplifier.
    Optical components: lenses, mirrors (spherical, parabolic, toroidal, elliptical), optical fibers, polarizers, retarders, filters
    Dispersion spectrometers (prism, grating), construction, resolution
    Fourier spectrometer
    Propagation of electromagnetic wave in medium and the incidence on boundary, Lorentz oscillator
    Techniques of optical spectroscopy:
    Transmission (Beer-Lambert law, vibration in IR
    Reflection (normals, phonons, Kramers-Kronig relations)
    basics of data analysis
    ellipsometry (principle, configuration PSA, PSCA, sensitivity, surface roughness, determination of thickness and optical constants of a layer on substrate, multiangle ellipsometry, inversion problem)
    IR microscopy (objectives, single element and focal plane array)
    grazing incidence spectroscopy (TO, LO frequency, Berreman effect)
    Attenuate total reflection - ATR, surface plasma resonance
    Specromicroscopy: far field, near field techniques (with aperture and apertureless)
    Time resolved spectroscopy, pump-probe spectroscopy, THz time domain spectroscopy
    Profiles of spectral lines (Lorentz, asymmetric Lorentz, Gauss, Gauss-Lorentz) Raman spectroscopy
    Group theory, symmetry and vibration
    X-ray spectroscopy 1: X-ray sources, monochromatisation, index of refraction, absorption, imaging
    X-ray spectroscopy 2: fluorescence spectroscopy, X-ray detectors, photoemission spectroscopy, X-ray absorption spectroscopy, fine structure of absorption edge
    Nuclear magnetic resonance
    Excursion to laboratories
  • KUZMANY, Hans. Solid-state spectroscopy : an introduction. Berlin: Springer-Verlag, 1998. xv, 450. ISBN 3540639136. info
Teaching methods
lecture, seminary
Assessment methods
active attendance at the seminars
Language of instruction
Further Comments
Study Materials
The course is taught annually.
The course is also listed under the following terms Spring 2008 - for the purpose of the accreditation, Spring 2000, Spring 2002, Spring 2004, Spring 2006, Spring 2008, Spring 2010, Autumn 2011, Autumn 2011 - acreditation, spring 2012 - acreditation, Autumn 2012, Autumn 2013, Autumn 2015, Autumn 2016, autumn 2017, Autumn 2018, Autumn 2019.
  • Enrolment Statistics (Autumn 2014, recent)
  • Permalink: https://is.muni.cz/course/sci/autumn2014/F6530