Výpis publikací

MRKYVKOVA, Nada, Adrian CERNESCU, Zdenek FUTERA, Alois NEBOJSA, Adam DUBROKA, Michaela SOJKOVA, Martin HULMAN, Eva MAJKOVA, Matej JERGEL, Peter SIFFALOVIC a Frank SCHREIBER. Nanoimaging of Orientational Defects in Semiconducting Organic Films. Journal of Physical Chemistry C. Washington D.C.: American Chemical Society, 2021, roč. 125, č. 17, s. 9229-9235. ISSN 1932-7447. Dostupné z: https://dx.doi.org/10.1021/acs.jpcc.1c00059.

KASPAR, P., D. SOBOLA, R. DALLAEV, S. RAMAZANOV, Alois NEBOJSA, S. REZAEE a L. GRMELA. Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS. Applied Surface Science. AMSTERDAM: Elsevier Science BV, 2019, roč. 493, NOV 1 2019, s. 673-678. ISSN 0169-4332. Dostupné z: https://dx.doi.org/10.1016/j.apsusc.2019.07.058.

SOBOLA, Dinara, Pavel KASPAR, Alois NEBOJSA, Dušan HEMZAL, Lubomir GRMELA a Steve SMITH. Characterization of the native oxide on CdTe surfaces. Materials Science-Poland. Warsaw: SCIENDO, 2019, roč. 37, č. 2, s. 206-211. ISSN 2083-1331. Dostupné z: https://dx.doi.org/10.2478/msp-2019-0030.

HUMLÍČEK, Josef, Alois NEBOJSA, Filip MÜNZ, Milka MIRIC a Rados GAJIC. Infrared ellipsometry of highly oriented pyrolytic graphite. Thin Solid Films. Elsevier, 2011, roč. 519, č. 9, s. 2624-2626. ISSN 0040-6090. Dostupné z: https://dx.doi.org/10.1016/j.tsf.2010.12.091.

FIKAROVÁ ZRZAVECKÁ, Olga, Alois NEBOJSA, Karel NAVRÁTIL, Stanislav NEŠPŮREK a Josef HUMLÍČEK. Dynamics of UV degradation of PMPSi in vacuum and in the air using in-situ ellipsometry. physica status solidi (c). 2008, roč. 5, č. 5, s. 1176-1179. ISSN 1610-1642.

NEBOJSA, Alois, Olga FIKAROVÁ ZRZAVECKÁ, Karel NAVRÁTIL a Josef HUMLÍČEK. Temperature dependence of ellipsometric spectra of Fe and CrNiAl steel. physica status solidi (c). 2008, roč. 5, č. 5, s. 1176-1179. ISSN 1610-1642.

ČECHAL, Jan, Petr TICHOPÁDEK, Alois NEBOJSA, Olga BONAVENTUROVÁ ZRZAVECKÁ, Michal URBÁNEK, Jiří SPOUSTA, Karel NAVRÁTIL a Tomáš ŠIKOLA. In situ analysis of PMPSi by spectroscopic ellipsometry and XPS. Surface and Interface Analysis. USA: John Wiley & Sons, 2004, roč. 2004, č. 36, s. 1218-1221. ISSN 0142-2421.

BRANDEJSOVÁ, Eva, Jan ČECHAL, Olga BONAVENTUROVÁ ZRZAVECKÁ, Alois NEBOJSA, Petr TICHOPÁDEK, Michal URBÁNEK, Karel NAVRÁTIL, Tomáš ŠIKOLA a Josef HUMLÍČEK. In situ analysis of PMPSi thin films by spectroscopic ellipsometry. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 2004, roč. 9/2004, č. 9, s. 260-262. ISSN 0447-6441.

BONAVENTUROVÁ ZRZAVECKÁ, Olga, Alois NEBOJSA, Karel NAVRÁTIL, Stanislav NEŠPŮREK a Josef HUMLÍČEK. Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane). Thin Solid Films. Elsevier, 2004, roč. 455/2004, may, s. 278-282. ISSN 0040-6090.

LORENC, Michal, Jan ŠIK, Alois NEBOJSA, Karel NAVRÁTIL, Josef HUMLÍČEK, V. VORLIČEK a E. HULICIUS. Optical characterisation of a thick MOVPE InSb film on GaAs. In Workshop proceedings EW MOVPE VIII. Prague: Institute of Physics ASCR, CR, 1999, s. 369-372. ISBN 80-238-3551-3.

ŠIKOLA, T., J. SPOUSTA, R. ČEŠKA, J. ZLÁMAL, L. DITTRICHOVÁ, Alois NEBOJSA, Karel NAVRÁTIL, D. RAFAJA, J. ZEMEK a V. PEŘINA. Deposition of metal nitrides by IBAD. Surface & coatings technology. Elsevier Science, 1998, roč. 1998, 108-109, s. 284-291. ISSN 0257-8972.

HUMLÍČEK, Josef, Alois NEBOJSA, J. HORA, M. STRÁSKÝ, J. SPOUSTA a T. ŠIKOLA. Ellipsometry and transport studies of thin-film metal nitrides. Thin Solid Films. UK Oxford: Elsevier science, 1998, roč. 1998, č. 332, s. 25-29. ISSN 0040-6090.