Publication Records

MAZAL, Ctibor, Ondřej ŠKARKA, Jiří KALETA and Josef MICHL. Cis-endo-Bicyclo[1.1.1]pentane-1,2,3,4-tetracarboxylic Acid and Its Derivatives. Organic Letters. 2006, vol. 8, No 4, p. 749-752. ISSN 1523-7060.

NOVÁK, Jiří, Václav HOLÝ, Julian STANGL, Thomas FROMHERZ, Zhong ZHENYANG, Chen GANG, Günther BAUER and Bernd STRUTH. Ge/Si islands in a three-dimensional island crystal studied by x-ray diffraction. Journal of Applied Physics. USA: American institute of physics, 2005, vol. 98, No 7, p. 073517-73525. ISSN 0021-8979.

DVOŘÁK, Vojtěch, Jiří KALVODA and Rostislav MELICHAR. Variské deformace ve vybraných vrtech v paleozoiku u Hranic (Variscan deformation in selected boreholes of Hranice Paleozoic area). Geologické výzkumy na Moravě a ve Slezsku v roce 2004. Brno: Masarykova univerzita, 2005, vol. 12, -, p. 52-54. ISSN 1212-6209.

NOVÁK, Jiří, Václav HOLÝ, Julian STANGL, Günther BAUER, Eugen WINTENSBERGER, Suwit KIRAVITTAYA and Oliver G. SCHMIDT. A method for the charcterization of strain fields in burid quantum dots using X-ray standing waves. Journal of physics D: Applied physics. Bristol, England: IOP Publishing Ltd., 2004, vol. 38, 10A, p. A137-A142, 6 pp. ISSN 0022-3727.

HOLÝ, Václav. Effect of overgrowth temperature on shape, strain, and composition of buried Ge islands deduced from x-ray diffraction. Applied Physics Letters. USA: American Institute of Physics, 2003, vol. 82, No 11, p. 2251-2253. ISSN 0003-6951.

HOLY, V., T. ROCH, J. STANGL and G. BAUER. Grazing incidence small-angle x-ray scattering study of self-organized SiGe wires. Phys. Rev. B. USA: The American Phys. Society, 2001, vol. 63, No 20, p. 5318-5327. ISSN 0163-1829.

ROCH, T., Václav HOLÝ and J. STANGL. Structural investigations on self-organized Si/SiGe islands by grazing incidence small angle X-ray scattering. physica status solidi (b). Berlin: J. Wiley, 2001, vol. 224, No 1, p. 241-245. ISSN 0370-1972.

KANG, H.H., G. SPRINGHOLZ, V. HOLY and G. BAUER. TEM investigation of self-organized PbSe quantum dots as a function of spacer layer thickness and growth temperature. Materials Science and Engineering. Lausanne: ELSEVIER SCIENCE SA, 2001, vol. 80, 1-3, p. 104-108. ISSN 0921-5107.