Filtrování

    2006

    1. Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy
      FRANTA, Daniel; Ivan OHLÍDAL; Petr KLAPETEK; Růžena NEPUSTILOVÁ a Svatopluk BAJER. Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy. Surface and Interface Analysis. USA: John Wiley & Sons, 2006, roč. 38, č. 4, s. 842-846. ISSN 0142-2421.
      Podrobněji: https://is.muni.cz/publication/711185/cs
    2. Optical characterization of carbon films prepared by PECVD using ellipsometry and reflectometry
      VALTR, Miroslav; Ivan OHLÍDAL a Daniel FRANTA. Optical characterization of carbon films prepared by PECVD using ellipsometry and reflectometry. Czech. J. Phys. Praha: Institute of Physics Academy of Sciences, 2006, roč. 56/2006, Suppl. B, s. 1103 - 1109. ISSN 0011-4626.
      Podrobněji: https://is.muni.cz/publication/694025/cs

    2005

    1. Evidence of refractive index change in glass substrates induced by high-density reactive ion plating deposition of SiO2 films
      JAN, Mistrík; Ivan OHLÍDAL; Roman ANTOŠ; Mitsuru AOYAMA a Tomuo YAMAGUCHI. Evidence of refractive index change in glass substrates induced by high-density reactive ion plating deposition of SiO2 films. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 51-54. ISSN 0169-4332.
      Podrobněji: https://is.muni.cz/publication/630338/cs
    2. Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions
      FRANTA, Daniel; Ivan OHLÍDAL; Jan MISTÍK; Tomuo YAMAGUCHI; Gu Jin HU a Ning DAI. Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 338-342. ISSN 0169-4332.
      Podrobněji: https://is.muni.cz/publication/621464/cs
    3. Optical properties of NiO thin films prepared by pulsed laser deposition technique
      FRANTA, Daniel; Beatrice NEGULESCU; Luc THOMAS; Pierre Richard DAHOO; Marcel GUYOT; Ivan OHLÍDAL; Jan MISTRÍK a Tomuo YAMAGUCHI. Optical properties of NiO thin films prepared by pulsed laser deposition technique. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 426-430. ISSN 0169-4332.
      Podrobněji: https://is.muni.cz/publication/621484/cs
    4. Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry
      MISTRÍK, Jan; Tomuo YAMAGUCHI; Daniel FRANTA; Ivan OHLÍDAL; Gu Jin HU a Ning DAI. Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 431-434. ISSN 0169-4332.
      Podrobněji: https://is.muni.cz/publication/621519/cs

    2001

    1. Optical Characterization of Chalcogenide Thin Films
      FRANTA, Daniel; Ivan OHLÍDAL; Miloslav FRUMAR a Jaroslav JEDELSKÝ. Optical Characterization of Chalcogenide Thin Films. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2001, roč. 175-176, č. 1, s. 555-561. ISSN 0169-4332.
      Podrobněji: https://is.muni.cz/publication/366091/cs
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