Výpis publikací

FRANTA, Daniel; Ivan OHLÍDAL a David NEČAS. Influence of cross-correlation effects on the optical quantities of rough films. Optics Express. elektronicky: Optical Society of America, 2008, roč. 16, č. 11, s. 7789–7803. ISSN 1094-4087.

FRANTA, Daniel a Ivan OHLÍDAL. Influence of lateral dimensions of the irregularities on the optical quantities of rough surfaces. Journal of Optics A: Pure and Applied Optics. Bristol, GB: IOP Publishing Ltd, 2006, roč. 8, č. 9, s. 763-774. ISSN 1464-4258.

KLAPETEK, Petr; Ivan OHLÍDAL; Alberto MONTAIGNE RAMIL; Alberta BONNANNI a Helmut SITTER. Atomic force microscopy analysis of morphology of the upper boundaries of GaN thin films prepared by MOCVD. Vacuum. USA: ELSEVIER (PERGAMON), 2005, roč. 80, 1-3, s. 53-57. ISSN 0042-207X.

OHLÍDAL, Ivan; Daniel FRANTA a Petr KLAPETEK. Combination of optical methods and atomic force microscopy at characterization of thin film systems. Acta physica slovaca. Bratislava: Institute of Physics, SAS, 2005, roč. 55, č. 3, s. 271-294. ISSN 0323-0465.

FRANTA, Daniel a Ivan OHLÍDAL. Comparison of effective medium approximation and Rayleigh-Rice theory concerning ellipsometric characterization of rough surfaces. Optics Communications. Amsterdam: Elsevier Science, 2005, roč. 248, č. 1, s. 459-467. ISSN 0030-4018.

FRANTA, Daniel a Ivan OHLÍDAL. Characterization of optical thin films exhibiting defects. In Advances in Optical Thin Films II. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2005, s. 59632H-1-59632H-12, 12 s. ISBN 0-8194-5981-X.

HASOŇ, Stanislav a Vladimír VETTERL. Application of thin film mercury electrodes and solid amalgam electrodes in electrochemical analysis of the nucleic acids components: detection of the two-dimensional phase transients of adenosine. Bioelectrochemistry. Elsevier, 2004, roč. 2004, č. 63, s. 37-41. ISSN 1567-5394.

KLAPETEK, Petr; Ivan OHLÍDAL a Jindřich BÍLEK. Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces. Ultramicroscopy. Amsterdam: Elsevier, 2004, roč. 102, č. 1, s. 51-59. ISSN 0304-3991.

KLAPETEK, Petr; Ivan OHLÍDAL a Daniel FRANTA. Applications of atomic force microscopy for thin film boundary measurements. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 2002, roč. 47, 6-7, s. 195-199. ISSN 0447-6441.

FRANTA, Daniel; Ivan OHLÍDAL; Dominik MUNZAR; Jaroslav HORA; Karel NAVRÁTIL; Claudio MANFREDOTTI; Franco FIZZOTTI a Ettore VITTONE. Complete optical characterization of imperfect hydrogenated amorphous silicon layers by spectroscopic ellipsometry and spectroscopic reflectometry. Thin Solid Films. Oxford, UK: Elsevier science, 1999, roč. 343-344, č. 1, s. 295-298. ISSN 0040-6090.