PřF:F7850 Topics in electr. microsc. - Course Information

F7850 Selected topics in electron microscopy

Extent and Intensity

2/0/0. 2 credit(s) (plus extra credits for completion). Type of Completion: k (colloquium).
In-person direct teaching

Teacher(s)

doc. RNDr. Petr Mikulík, Ph.D. (lecturer)
RNDr. Lubomír Tůma (lecturer)
Ing. Tomáš Vystavěl, PhD. (lecturer), doc. RNDr. Petr Mikulík, Ph.D. (deputy)

Guaranteed by

doc. RNDr. Petr Mikulík, Ph.D.
Department of Condensed Matter Physics – Physics Section – Faculty of Science
Contact Person: doc. RNDr. Petr Mikulík, Ph.D.
Supplier department: Department of Condensed Matter Physics – Physics Section – Faculty of Science

Course Enrolment Limitations

The course is also offered to the students of the fields other than those the course is directly associated with.

fields of study / plans the course is directly associated with

there are 9 fields of study the course is directly associated with, display

Abstract

After succesfull passing the course, the students should be able to:
- describe the construction of various types electron microscopes
- characterise individual physical phenomena yielding the image and discuss the function of the aparatus blocks
- evaluate the utility of different types EM for particular sample measurement.

Learning outcomes

After successful passing of the subject the students will be able to:
– describe construction of different types of electron microscopes,
– describe different parts of electron microscopes,
– describe electron sources,
– understand interaction of electrons with samples and measuring of the output signal,
– describe sample stages and chambers as well as sample manipulation.

Key topics

• • 1. Basics of scanning and transmission electron microscopy
  • 2. Applications of electron microscopy
  • 3. Electron and ion optics
  • 4. Sources of electrons and ions
  • 5. Interaction of electrons and ions with solid state matter
  • 6. Signal detection im electron microscopy
  • 7. Vacuum system
  • 8. Sample manipulation inside electron microscope
  • 9. Sample stages
  • 10. Electron microscope as a system
  • 11. Contrast of image 1. (SEM)
  • 12. Contrast of image 2. (TEM)
  • 13. Electron microscope as an analytical lab
  • 14. Mopdern trends in electron microscopy
  • 15. Practical demonstration

Study resources and literature

recommended literature
• REIMER, Ludwig. Scanning electron microscopy : physics of image formation and microanalysis. 2nd ed. Berlin: Springer, 1998, xiv, 527. ISBN 3540639764. info
• REIMER, Ludwig and Helmut KOHL. Transmission electron microscopy : physics of image formation. Fifth edition. New York: Springer, 2008, xvi, 587. ISBN 9780387400938. info
• GOLDSTEIN, Joseph I. Scanning electron microscopy and X-ray microanalysis. 3rd ed. New York: Kluwer Academic/Plenum publishers, 2003, xix, 689 s. ISBN 0-306-47292-9. info
• GOLDSTEIN, Joseph; David C. JOY; Joseph R. MICHAEL; Dale E. NEWBURY; Nicholas W. M. RITCHIE and John Henry J. SCOTT. Scanning electron microscopy and X-ray microanalysis. Fourth edition. New York: Springer, 2018, xxiii, 550. ISBN 9781493966745. info
• EGERTON, R. Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM. Second edition. Switzerland: Springer, 2016, xi, 196. ISBN 9783319398761. info

Approaches, practices, and methods used in teaching

lectures + hands on lesson

Method of verifying learning outcomes and course completion requirements

credits, based on final discussion

Language of instruction

Czech

Further comments (probably available only in Czech)

The course is taught annually.
The course is taught every week.

• Enrolment Statistics (recent)
  
• Permalink: https://is.muni.cz/course/sci/autumn2026/F7850