Filtrování

    2009

    1. Tip-sample relaxation as a source of uncertainty in nanoscale scanning probe microscopy measurements
      CAMPBELLOVÁ, Anna; Petr KLAPETEK a Miroslav VALTR. Tip-sample relaxation as a source of uncertainty in nanoscale scanning probe microscopy measurements. Measurement Science and Technology. Bristol, England: IOP Publishing, 2009, roč. 20, č. 084014, 6 s. ISSN 0957-0233.
      Podrobněji: https://is.muni.cz/publication/840079/cs

    2008

    1. Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge
      VALTR, Miroslav; Petr KLAPETEK; Vilma BURŠÍKOVÁ; Ivan OHLÍDAL a Daniel FRANTA. Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge. Chem. listy. Praha: Česká společnost chemická, 2008, roč. 102, č. 16, s. 1529-1532. ISSN 0009-2770.
      Podrobněji: https://is.muni.cz/publication/798200/cs

    2003

    1. Oriented organic semiconductor thin films
      ANDREEV, A.; R. RESEL; M.D. SMILGIES; H. HOPPE; G. MATT; H. SITTER; N. S. SARICIFTCI; D. MEISSNER; H. PLANK a O. ZRZAVECKA. Oriented organic semiconductor thin films. Synthetic Metals. Elsevier, 2003, roč. 138/2003, 1-2, s. 59-63. ISSN 0379-6779.
      Podrobněji: https://is.muni.cz/publication/567120/cs
    2. Study of Plasma Polymerization from Acetylene in Pulsed RF Discharges
      ZAJÍČKOVÁ, Lenka; Siegmar RUDAKOWSKI; Hans-Werner BECKER; Dirk MEYER; Miroslav VALTR a Klaus WIESEMANN. Study of Plasma Polymerization from Acetylene in Pulsed RF Discharges. Thin Solid Films. Oxford: Elsevier, 2003, roč. 2003, č. 425, s. 72-84. ISSN 0040-6090.
      Podrobněji: https://is.muni.cz/publication/487192/cs
    3. Theoretical analysis of the atomic force microscopy characterization of columnar thin films
      KLAPETEK, Petr a Ivan OHLÍDAL. Theoretical analysis of the atomic force microscopy characterization of columnar thin films. Ultramicroscopy. Amsterdam: Elsevier, 2003, roč. 94, č. 1, s. 19-29. ISSN 0304-3991.
      Podrobněji: https://is.muni.cz/publication/485221/cs

    2002

    1. Applications of atomic force microscopy for thin film boundary measurements
      KLAPETEK, Petr; Ivan OHLÍDAL a Daniel FRANTA. Applications of atomic force microscopy for thin film boundary measurements. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 2002, roč. 47, 6-7, s. 195-199. ISSN 0447-6441.
      Podrobněji: https://is.muni.cz/publication/404728/cs

    2000

    1. Analysis of Slightly Rough Thin Films by Optical Methods and AFM
      FRANTA, Daniel; Ivan OHLÍDAL a Petr KLAPETEK. Analysis of Slightly Rough Thin Films by Optical Methods and AFM. Mikrochim. Acta. Wien: Springer-Verlag, 2000, roč. 132, č. 1, s. 443-447. ISSN 0026-3672.
      Podrobněji: https://is.muni.cz/publication/313891/cs

    1999

    1. Sensing of biological substances based on the bending of microfabricated cantilevers
      RAITERI, Roberto; Gabrielle NELLES; Hans-Jurgen BUTT; Wolfgang KNOLL a Petr SKLÁDAL. Sensing of biological substances based on the bending of microfabricated cantilevers. Sensors and Actuators B Chemical. Amsterdam (Holandsko): Elsevier, 1999, roč. 61, č. 1, s. 213-217. ISSN 0925-4005.
      Podrobněji: https://is.muni.cz/publication/250351/cs

    1998

    1. Analysis of thin films with slightly rough boundaries
      OHLÍDAL, Ivan; Daniel FRANTA; Jaroslav HORA; Karel NAVRÁTIL; Jan WEBER a Pavel JANDA. Analysis of thin films with slightly rough boundaries. Mikrochim. Acta. Wien: Springer-Verlag, 1998, Suppl. 15, č. 1, s. 177-180. ISSN 0026-3672.
      Podrobněji: https://is.muni.cz/publication/200406/cs
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