Publication Records

MAZÁNKOVÁ, Věra, Pavel SŤAHEL, Petra MATOUŠKOVÁ, Antonín BRABLEC, Jan ČECH, Lubomír PROKEŠ, Vilma BURŠÍKOVÁ, Monika STUPAVSKÁ, Marián LEHOCKÝ, Kadir OZALTIN, Petr HUMPOLÍČEK and David TRUNEC. Atmospheric Pressure Plasma Polymerized 2-Ethyl-2-oxazoline Based Thin Films for Biomedical Purposes. Polymers. Basel: MDPI, 2020, vol. 12, No 11, p. 1-15. ISSN 2073-4360. Available from: https://dx.doi.org/10.3390/polym12112679.

HOUŠKA, Jan, Eladia Maria PEÑA-MÉNDEZ, Jakub KOLÁŘ, Jan PŘIKRYL, Martin PVLIŠTA, Miloslav FRUMAR, Tomáš WÁGNER and Josef HAVEL. Laser desorption time-of-flight mass spectrometry of atomic switch memory Ge2Sb2Te5 bulk materials and its thin films. Rapid Communications in Mass Spectrometry. 2014, vol. 28, No 7, p. 699-704. ISSN 0951-4198. Available from: https://dx.doi.org/10.1002/rcm.6833.

HOUŠKA, Jan, Eladia PEÑA-MÉNDEZ, Jakub KOLÁŘ, Miloslav FRUMAR, Tomáš WÁGNER and Josef HAVEL. Laser ablation of AgSbS2 and cluster analysis by time-of-flight mass spectrometry. Rapid Communications in Mass Spectrometry. John Wiley & Sons, Ltd., 2009, vol. 23, No 11, p. 1715-1718. ISSN 0951-4198.

NEČAS, David, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Pavel SŤAHEL, Petr MIKULÍK, Mojmír MEDUŇA and Miroslav VALTR. Optical Characterization of Ultra-Thin Iron and Iron Oxide Films. e-Journal of Surface Science and Nanotechnology. Tokyo: The Surface Science Society of Japan, 2009, vol. 7, březen, p. 486-490. ISSN 1348-0391.

NEČAS, David, Ivan OHLÍDAL and Daniel FRANTA. Reflectance of non-uniform thin films. Journal of Optics A: Pure and Applied Optics. Bristol, GB: IOP Publishing Ltd, 2009, vol. 11, No 4, p. 1-9. ISSN 1464-4258.

ZELENÝ, Martin, Dominik LEGUT and Mojmír ŠOB. Ab initio study of Co and Ni under uniaxial and biaxial loading and in epitaxial overlayers. Physical Review B. USA: The American Physical Society, 2008, vol. 77, No 22, p. 224105-224115. ISSN 1098-0121.

LEHOCKÝ, Marian, Pavel SŤAHEL, Marek KOUTNÝ, Jan ČECH, Jakub INSTITORIS and Aleš MRÁČEK. Adhesion of Rhodococcus sp. S3E2 and Rhodococcus sp. S3E3 to plasma prepared Teflon-like and organosilicon surfaces. Journal of Materials Processing Technology. Elsevier B.V., 2008, vol. 209, No 6, p. 2871–2875. ISSN 0924-0136.

MEDUŇA, Mojmír, Ondřej CAHA, Mario KEPLINGER, Bauer GÜNTHER, Gregor MUSSLER and Detlev GRÜTZMACHER. Interdiffusion in Ge rich SiGe alloys studied by in-situ diffraction. In XTOP 2008 - 9th Biennial Conference on High Resolution X-Ray Diffraction and Imaging. 2008.

ZELENÝ, Martin and Mojmír ŠOB. Theoretical studies of epitaxially grown Co and Ni thin films on (111) metallic substrates. Physical Review B. USA: The American Physical Society, 2008, vol. 77, No 15, p. 155435-155440. ISSN 1098-0121.

ŠÍRA, Martin, Vilma BURŠÍKOVÁ and David TRUNEC. Deposition of thin films on glass substrate in atmospheric pressure glow discharge. In Book of Contributed Papers of The 3rd Seminar on New Trends in Plasma Physics and Solid State Physics. Bratislava, Slovensko: Library and Publishing Centre in collaboration with Department of Experimental Physics, Comenius University, Bratislava, Slovakia; Union of Slovak Mathematicians and Physicists, Bratislava, Slovakia, 2007, p. 144-147. ISBN 978-80-89186-24-2.

ZAJÍČKOVÁ, Lenka, Vilma BURŠÍKOVÁ, Zuzana KUČEROVÁ, Jana FRANCLOVÁ, Pavel SŤAHEL, Vratislav PEŘINA and Anna MACKOVÁ. Organosilicon thin films deposited by plasma enhanced CVD: Thermal changes of chemical structure and mechanical properties. Journal of Physics and Chemistry of Solids. Elsevier, 2007, vol. 68, No 1, p. 1255-1259. ISSN 0022-3697.

VLADOIU, Rodica, V. CIUPINA, C. SURDU-BOB, C.P. LUNGU, Jan JANÍK, J.D. SKALNÝ, Vilma BURŠÍKOVÁ, Jiří BURŠÍK and G. MUSA. Properties of the carbon thin films deposited by thermionic vacuum arc. Journal of Optoelectronics and Advanced Materials. Bucharest: INOE & INFM, 2007, vol. 9, No 4, p. 862-866. ISSN 1454-4164.

KLAPETEK, Petr, Vilma BURŠÍKOVÁ and Miroslav VALTR. Scanning probe microscopy analysis of delaminated thin films. Journal of Physics: Conference Series. Institute of Physics (IoP), 2007, vol. 61, No 1, p. 576-581. ISSN 1742-6588.

ORAVA, Jiří, Tomáš WAGNER, Miloš KRBAL, Tomáš KOHOUTEK, Milan VLČEK, Ludvík BENEŠ, Eva KOTULANOVÁ, Petr BEZDIČKA, Petr KLAPETEK and Miloslav FRUMAR. Selective wet etching of amorphous/crystallized Ag/As/S and Ag/As/S/Se chalcogenide thin films. Journal of Physics and Chemistry of Solids. Elsevier, 2007, vol. 68, 5-6, p. 1008-1013. ISSN 0022-3697.

BURŠÍKOVÁ, Vilma, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Jan JANČA, Jiří BURŠÍK, Petr KLAPETEK, Olga BLÁHOVÁ, Vratislav PEŘINA and Vladislav NAVRÁTIL. Deposition and Characterisation of Nanostructured silicon-oxide Containing Diamond-like Carbon Coatings. In 7th International Balkan Workshop on Applied Physics - Abstracts. 1st ed. Constanta, Romania: Ovidius University, 2006, p. 101-102, 1 pp. ISBN 978-80-214-3460-8.

TRUNEC, David, Martin ŠÍRA, Pavel SŤAHEL, Vilma BURŠÍKOVÁ and Daniel FRANTA. Deposition of thin films at higher substrate temperatures in atmospheric pressure glow discharge. In 10th International Symposium on High Pressure Low Temperature Plasma Chemistry. Saga, Japan: Saga University, 2006, p. 331-334.

MEDUŇA, Mojmír, Jiří NOVÁK, Václav HOLÝ, Günther BAUER, Claudiu FALUB, Soichiro TSUJINO and Detlev GRÜTZMACHER. IN-SITU INVESTIGATIONS OF SI AND GE INTERDIFFUSION IN SIGE MULTILAYERS AND CASCADE STRUCTURES. In XTOP 2006 - 8th Biennial Conference on High Resolution X-Ray Diffraction and Imaging. Karlsruhe: Forchungszentrum Karlsruhe, 2006, p. 124.

HARTMANNOVÁ, Mária, Martin JERGEL, Vladislav NAVRÁTIL, Karel NAVRÁTIL, Katarina GMUCOVÁ, F.C. GANDARILLA, Jan ZEMEK, Stefan CHROMIK and Frantiaek KUNDRACIK. Effect of Structural Imperfections on the Characteristics of YSZ Dielectric Layers Grown by E-beam Evaporation fron the Crystalline Taggets. In Acta Physica Slovaca. I. Bratislava: Institute of Physics, SAS, Bratislava, Slovakia, 2005, p. 247-259. ISBN 5-94691-216-X.

FRANCLOVÁ, Jana, Zuzana KUČEROVÁ and Vilma BURŠÍKOVÁ. Electrical Properties of Plasma Deposited Thin Films. 1st ed. Praha: MATFYZPRESS, 2005, 4 pp. WDS 05, Proceedings of Contributed Papers, Part II. ISBN 80-86732-59-2.

FRANCLOVÁ, Jana, Zuzana KUČEROVÁ and Vilma BURŠÍKOVÁ. Electrical Properties of SiOxHyCz Coatings Prepared by PECVD. In 15th Symposium on Aplications of Plasma Processes. Bratislava: Comenius University Press, 2005, p. 161-162. ISBN 80-223-2018-8.

OHLÍDAL, Ivan, Daniel FRANTA and Petr KLAPETEK. Ellipsometry in characterization of thin films. In Proceedings of the SREN 2005. Bratislava, Slovakia: Comenius University, 2005, p. 81-111. ISBN 80-223-2099-4.

FRANTA, Daniel and Ivan OHLÍDAL. Characterization of optical thin films exhibiting defects. In Advances in Optical Thin Films II. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2005, p. 59632H-1-59632H-12, 12 pp. ISBN 0-8194-5981-X.

BURŠÍKOVÁ, Vilma, Petr KLAPETEK, Angelique BOUSQUET and Marek ELIÁŠ. Study of the mechanical properties of thin films using combined nanoindentation and AFM measurements. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 2005, vol. 50, 11_12, p. 323-326. ISSN 0447-6441.

ZŮDA, Jaroslav, Vilma BURŠÍKOVÁ, Jan ČECH and Pavel SŤAHEL. Thermal stability of diamond like carbon thin films prepared using plasma enhanced chemical vapor deposition. In JUNIORMAT'05. Brno: Faculty of mechanical engineering, BUT, 2005, p. 47-50. ISBN 80-214-2984-4.

HARTMANOVÁ, Marie, Vladislav NAVRÁTIL, Karel NAVRÁTIL, Marian JERGEL, Kateřina GMUCOVA, Fjod Alexandrovič GANDARILLA, Jan ZEMEK, Sergej CHROMIK and František KUNDRACIK. Correlation between microscopic and macroscopic properties of yttria-stabilized zirconia thin films. In Physics and Technology of Thin Films IWTF 2003. I. Teheran, Iran: World Scientific, 2004, p. 158-168.

BURŠÍKOVÁ, Vilma, Jiří BURŠÍK and Vladislav NAVRÁTIL. Study of the Fracture of Coating/Substrate Systems. Engineering Mechanics. Brno: VUT Brno, 2004, 11(2004), No 5, p. 361-365. ISSN 1210-2717.

BURŠÍKOVÁ, Vilma, Jiří BURŠÍK and Vladislav NAVRÁTIL. Study of the Fracture of Coating/Substrate Systems. J. Engineering MECHANICS. Brno, 2004, vol. 11, No 5, p. 361-366, 4 pp.

BRABLEC, Antonín, Jiří BUCHTA, Vilma BURŠÍKOVÁ, Ondřej JAŠEK, Vít KUDRLE, Pavel SLAVÍČEK, David TRUNEC and Lenka ZAJÍČKOVÁ. Advanced methods for deposition of thin films: monitoring, properties, application. Tomsk: E.T.Protasevich, 2002, 157 pp. Tomsk series.

BURŠÍKOVÁ, Vilma and Vladislav NAVRÁTIL. Determination of Mechanical Properties of Thin Films by the Indentation Techniques. In New Trends in Physics. I. Brno: VUT Brno, Fakulta Elektrotechniky a Informatiky, 2001, p. 333-338. ISBN 80-214-1992-X.

OHLÍDAL, Ivan, Daniel FRANTA, Miloslav OHLÍDAL and Karel NAVRÁTIL. Determination of Thicknesses and Spectral Dependences of Refractive Indices of Non-Absorbing and Weakly Absorbing Thin Films Using the Wavelengths Related to Extrema in Spectral Reflectances. Vacuum. USA: ELSEVIER (PERGAMON), 2001, vol. 61, No 1, p. 285-289. ISSN 0042-207X.

ZAJÍČKOVÁ, Lenka, Vratislav PEŘINA, Vilma BURŠÍKOVÁ, Anna MACKOVÁ and Jan JANČA. Influence of Discharge Parameters on Composition of Films Deposited by PECVD from Hexamethyldisiloxane/Oxygen Mixtures. In Abstracts of Invited Lectures and Contributed Papers, XVth Europhysics Conference on Atomic and Molecular Physics of Ionized Gases. Miskolc - Lillafüred, Hungary: European Physical Society, 2000, p. 448-449.

KUČÍRKOVÁ, Assja, Karel NAVRÁTIL and J. ZEMEK. Depth inhomogeneity of deposited thin films: application to semi-insulating polycrystalline silicon films. Thin Solid Films. UK Oxford: Elsevier science, 1998, (323)1998, -, p. 53-58. ISSN 0040-6090.

ČEŠKA, Zbyněk, Jan JANČA and M. DVOŘÁK. ECR plasma deposition of thin films. In WDS 98. 1st ed. Praha: Karlova univerzita, Praha, 1998, p. 327-331. ISBN 80-85863-29-4.

BURŠÍKOVÁ, Vilma, Lenka ZAJÍČKOVÁ and Jan JANČA. Influence of Deposition Parameters on Mechanical Properties opf SiO2-like Protective Coatings. In ICPP. 1st ed. Praha: Ústav fyziky plazmatu ČAV, Praha, 1998, p. 918-921.

BURŠÍKOVÁ, Vilma, Lenka ZAJÍČKOVÁ and Jan JANČA. Mechanical Properties of Thin Films Prepared by PECVD under Various Deposition Conditions. In 11th Symposium on Elementary Processes and Chemical Reactions in Low Temperature Plasma. 1st ed. Bratislava: MFF UK, Bratislava, 1998, p. 192-195. ISBN 80-967454-6-8.

JANČA, Jan and Ladislav SODOMKA. Plasma polymerized organosiloxane thin films as selective gas sensors. Surface & coatings technology. Elsevier Science, 1998, vol. 98, No 2, p. 851-854. ISSN 0257-8972.

PINKAS, Jiří, J. C. HUFFMAN, J. C. BOLLINGER, W. E. STREIB, D. V. BAXTER, M. H. CHISHOLM and K. G. CAULTON. Syntheses, Structures and Thermal Behavior of Cu hfacac Complexes Derived from Ethanolamines. Inorg. Chem. Spojené státy americké: American Chemical Society, 1997, vol. 36, No 14, p. 2930-2937. ISSN 0020-1669.

MUSILOVÁ, Jana and Ivan OHLÍDAL. Influence of defects of thin films on determining their thickness by the method based on white light interference (Influence of defects of thin films on determining their thi ckness by the method based on white light interference). J. Phys. D: Appl. Phys. 1993, 25(1992), No 1, p. 1131-1138. ISSN 0022-3727.