Výpis publikací

ŘIHÁČEK, Tomáš; Michal HORÁK; Thomas SCHACHINGER; Filip MIKA; Milan MATĚJKA; Stanislav KRÁTKÝ; Tomáš FOŘT; Tomáš RADLIČKA; Cameron W. JOHNSON; Libor NOVÁK; SEĎA; Benjamin J. MCMORRAN a Ilona MÜLLEROVÁ. Beam shaping and probe characterization in the scanning electron microscope. Ultramicroscopy. Amsterdam: North Holland, 2021, roč. 225, 9 s. ISSN 0304-3991. Dostupné z: https://doi.org/10.1016/j.ultramic.2021.113268.

KONVALINA, Ivo; Benjamin DANIEL; Martin ZOUHAR; Aleš PATÁK; Ilona MÜLLEROVÁ; Luděk FRANK; Jakub PIŇOS; Lukáš PRŮCHA; Tomáš RADLIČKA; Wolfgang S M WERNER a Eliška Materna MIKMEKOVÁ. Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer. NANOMATERIALS. SWITZERLAND: MDPI, 2021, roč. 11, č. 9, s. 2435-2452. ISSN 2079-4991. Dostupné z: https://doi.org/10.3390/nano11092435.

ŘIHÁČEK, Tomáš a Ilona MÜLLEROVÁ. Optimalizace amplitudové difrakční mřížky pro tvorbu vírových svazků v elektronovém mikroskopu. Jemná mechanika a optika. AV ČR, Fyzikální ústav, 2020, roč. 65, č. 6, s. 185-187. ISSN 0447-6441.

ŘIHÁČEK, Tomáš; Filip MIKA; Michal HORÁK; Thomas SCHACHINGER; Milan MATĚJKA; Stanislav KRÁTKÝ a Ilona MÜLLEROVÁ. Creation and detection of electron vortex beams in a scanning electron microscope. In Microscopy Conference 2019. 2019.

ŘIHÁČEK, Tomáš; Michal HORÁK; Thomas SCHACHINGER; Milan MATĚJKA; Filip MIKA a Ilona MÜLLEROVÁ. Creation of electron vortex beams using the holographic reconstruction method in a scanning electron microscope. In International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /16./ 2018. 2018.

MIKMEKOVÁ, Eliška; Aleš PATÁK; Ilona MÜLLEROVÁ; Luděk FRANK; Benjamin DANIEL; Ivo KONVALINA; Tomáš ŘIHÁČEK; Martin ZOUHAR; Anna ZAPOROZCHENKO a Michaël LEJEUNE. Low and Ultra-low Energy Scanning Electron Microscopy of 2D Transition Metal Dichalcogenides: Experiments and Simulations. Microscopy and Microanalysis. 2018, roč. 24, S1, s. 1564-1565. ISSN 1431-9276. Dostupné z: https://doi.org/10.1017/S1431927618008309.

ŘIHÁČEK, Tomáš a Ilona MÜLLEROVÁ. Effect of axial aberrations on the degree of coherence in SEM. In SIMDALEE2017. 2017.

DANIEL, Benjamin. Very Low Energy STEM / TOF System. In RADLIČKA, Tomáš; Jakub PIŇOS; Luděk FRANK a Ilona MÜLLEROVÁ. Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons 2017. 2017.

ŘIHÁČEK, Tomáš; Filip MIKA; Milan MATĚJKA; Stanislav KRÁTKÝ a Ilona MÜLLEROVÁ. Diffraction in a scanning electron microscope. In International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. 2016.

DANIEL, Benjamin. Very Low Energy STEM / TOF System. In RADLIČKA, Tomáš; Jakub PIŇOS; Luděk FRANK a Ilona MÜLLEROVÁ. Proceedings of 15th Seminar: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. 2016. ISBN 978-80-87441-17-6.

ŘIHÁČEK, Tomáš a Ilona MÜLLEROVÁ. Recent progress in applications of electron vortex beams. In Mikroskopie 2015. 2015.

ŘIHÁČEK, Tomáš; Filip MIKA; Milan MATĚJKA; Stanislav KRÁTKÝ a Ilona MÜLLEROVÁ. Study of the coherence of the primary beam in the low energy scanning electron microscope. In Microscopy Conference 2015. 2015.

ŘIHÁČEK, Tomáš; Michal LENC a Ilona MÜLLEROVÁ. Measurement of coherence properties of scanning electron microscope. In International Conference on Charged Parrticle Optics /9./. 2014.

MÜLLEROVÁ, Ilona a Tomáš ŘIHÁČEK. Electron vortex beams. In Mikroskopie 2013. 2013.

MIKMEKOVÁ, Eliška; J. POLČÁK; Jaroslav SOBOTA; Ilona MÜLLEROVÁ; Vratislav PEŘINA a Ondřej CAHA. Humidity resistant hydrogenated carbon nitride films. Applied Surface Science. Amsterdam: Elsevier Science, 2013, roč. 275, Jun, s. 7-13. ISSN 0169-4332. Dostupné z: https://doi.org/10.1016/j.apsusc.2013.03.033.

POKORNÁ, Zuzana; Šárka MIKMEKOVÁ; Ilona MÜLLEROVÁ a Luděk FRANK. Characterization of the local crystallinity via reflectance of very slow electrons. Applied Physics Letters. 2012, roč. 100, č. 261602. ISSN 0003-6951. Dostupné z: https://doi.org/10.1063/1.4729879.

MÜLLEROVÁ, Ilona; Miloš HOVORKA; Filip MIKA; Eliška MIKMEKOVÁ; Šárka MIKMEKOVÁ; Zuzana POKORNÁ a Luděk FRANK. Very low energy scanning electron microscopy in nanotechnology. Int. J. Nanotechnol. Inderscience Enterprises Ltd., 2012, roč. 9, 8/9, s. 695–716.

MÜLLEROVÁ, Ilona; Miloš HOVORKA; Ivo KONVALINA; Marek UNČOVSKÝ a Luděk FRANK. Scanning transmission low energy electron microscopy. IBM Journal of Research and Development. UNITED STATES: IBM CORP, 2011, v tisku. ISSN 0018-8646.

FRANK, Luděk; Miloš HOVORKA; Ivo KONVALINA; Šárka MIKMEKOVÁ a Ilona MÜLLEROVÁ. Very low energy scanning electron microscopy. Nuclear Instruments & Methods in Physics Research A. NETHERLANDS: Elsevier B.V., 2011, v tisku, 9 s. ISSN 0168-9002.

MÜLLEROVÁ, Ilona; Miloš HOVORKA; Filip MIKA; Eliška MIKMEKOVÁ; Šárka MIKMEKOVÁ; Zuzana POKORNÁ a Luděk FRANK. Very low energy scanning electron microscopy in nanotechnology. International Journal of Nanotechnology. ENGLAND: INDERSCIENCE ENTERPRISES LTD, 2011, v tisku. ISSN 1475-7435.

MIKMEKOVÁ, Šárka; Miloš HOVORKA; Ilona MÜLLEROVÁ; Ondřej MAN; Libor PANTĚLEJEV a Luděk FRANK. Grain Contrast Imaging in UHV SLEEM. Materials Transactions. Japonsko: The Japan Institute of Metals, 2010, roč. 51, č. 2, s. 292-296. ISSN 1345-9678.

MÜLLEROVÁ, Ilona; Miloš HOVORKA; Renáta HANZLÍKOVÁ a Luděk FRANK. Very Low Energy Scanning Electron Microscopy of Free-Standing Ultrathin Films. Materials Transactions. Japonsko: The Japan Institute of Metals, 2010, roč. 51, č. 2, s. 265-270. ISSN 1345-9678.

NOVÁK, Libor a Ilona MÜLLEROVÁ. Single electron response of the scintillator-light guide-photomultiplier detector. Journal of Microscopy. Oxford: Blackwell Science, 2009, roč. 233, č. 1, s. 76-83. ISSN 0022-2720.

FRANK, Luděk; Filip MIKA; Miloš HOVORKA; D. VALDAITSEV; G. SCHÖNHENSE a Ilona MÜLLEROVÁ. Dopant Contrast in Semiconductors as Interpretation Challenge at Imaging by Electrons. Materials Transactions. Japonsko: The Japan Institute of Metals, 2007, roč. 48, č. 5, s. 936-939. ISSN 1345-9678.

KONVALINA, Ivo; Miloš HOVORKA; Petr WANDROL; Filip MIKA a Ilona MÜLLEROVÁ. Strategies for Collection of Secondary Electrons in the SEM. 2007.

MÜLLEROVÁ, Ilona; Ivo KONVALINA a Zuzana POKORNÁ. Acquisition of the Angular Distribution of Backscattered Electrons in the Scanning Low Energy Electron Microscope. Toyama: University of Toyama, 2006, 2 s. ISBN 4-9903248-0-3.

NOVÁK, Libor a Ilona MÜLLEROVÁ. Analyzing the signal transport in the Everhart-Thornley type of detector. Delft, Holandsko: Delft University of Technology, 2006, s. 20-21.

NOVÁK, Libor a Ilona MÜLLEROVÁ. Processing of signal in the Everhart-Thornley detector. Brno, Česká Republika: Institute of Scientific Instruments AS CR, 2006. ISBN 80-239-6285-X.

NOVÁK, Libor a Ilona MÜLLEROVÁ. Signal Processing of Secondary Electron Images in SEM. Československá mikroskopická společnost, 2005. ISBN 978-80-239-9397-4.