Publication Records

HALE, Nathan, Matthias HARTL, Josef HUMLÍČEK, Christoph BRUNE and Morten KILDEMO. Dielectric function and band gap determination of single crystal CuFeS2 using FTIR-VIS-UV spectroscopic ellipsometry. Optical Materials Express. WASHINGTON: Optica Publishing Group, 2023, vol. 13, No 7, p. 2020-2035. ISSN 2159-3930. Available from: https://dx.doi.org/10.1364/OME.493426.

SOPOUŠEK, Jakub, Josef HUMLÍČEK, Antonín HLAVÁČEK, Veronika HORÁČKOVÁ, Petr SKLÁDAL and Karel LACINA. Thick nanoporous matrices of polystyrene nanoparticles and their potential for electrochemical biosensing. Electrochimica Acta. OXFORD: Elsevier, 2021, vol. 368, FEB, p. 137607-137615. ISSN 0013-4686. Available from: https://dx.doi.org/10.1016/j.electacta.2020.137607.

MOHELSKÝ, I., Adam DUBROKA, J. WYZULA, A. SLOBODENIUK, G. MARTINEZ, Y. KRUPKO, B. A. PIOT, Ondřej CAHA, Josef HUMLÍČEK, G. BAUER, G. SPRINGHOLZ and M. ORLITA. Landau level spectroscopy of Bi2Te3. PHYSICAL REVIEW B. AMER PHYSICAL SOC, 2020, vol. 102, No 8, p. 1-11. ISSN 2469-9950. Available from: https://dx.doi.org/10.1103/PhysRevB.102.085201.

CAHA, Ondřej and Josef HUMLÍČEK. Metody analýz polovodičů s širokým zakazáným pásem (Analztical methods of wide band gap semiconductors). ON Semiconductor, 2020.

CAHA, Ondřej and Josef HUMLÍČEK. Metody měření polovodičových součástek: rtg, optická spektroskopie (Masurement methods of semiconductor devices: X-ray, optical spectroscopy). ON Semiconductor, 2020.

KRUMPOLEC, Richard, David Campbell CAMERON, Dominik BAČA, Josef HUMLÍČEK and Ondřej CAHA. Atomic layer deposition of copper (I) chloride using liquid 1-chlorobutane precursor. In ALD/ALE 2019, 19th International Conference on Atomic Layer Deposition. 2019.

KRUMPOLEC, Richard, Dominik BAČA, Jana JURMANOVÁ, Pavel KUNOVSKÝ, Josef HUMLÍČEK and David Campbell CAMERON. Deposition of Copper Halide Films for Optoelectronic Applications. 2019. ISBN 978-80-210-9487-1.

HUMLÍČEK, Josef, Karla KULDOVA, Richard KRUMPOLEC and David Campbell CAMERON. Ellipsometry, reflectance, and photoluminescence of nanocrystalline CuCl thin films on silicon. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. MELVILLE: A V S AMER INST PHYSICS, 2019, vol. 37, No 5, p. 1-5. ISSN 2166-2746. Available from: https://dx.doi.org/10.1116/1.5121240.

HULICIUS, E., K. KULDOVA, A. HOSPODKOVA, J. PANGRAC, F. DOMINEC, Josef HUMLÍČEK, I. PELANT, O. CIBULKA and K. HERYNKOVA. MOVPE GaN/AlGaN HEMT NANO-STRUCTURES. Online. In 10TH ANNIVERSARY INTERNATIONAL CONFERENCE ON NANOMATERIALS - RESEARCH & APPLICATION (NANOCON 2018 (R)). SLEZSKA: TANGER LTD, 2019, p. 30-35. ISBN 978-80-87294-89-5.

HEMZAL, Dušan, Yu Ri KANG, Jan DVOŘÁK, Tomasz KABZINSKI, Karel KUBÍČEK, Kim YOUNG DONG and Josef HUMLÍČEK. Treatment of Surface Plasmon Resonance (SPR) Background in Total Internal Reflection Ellipsometry: Characterization of RNA Polymerase II Film Formation. APPLIED SPECTROSCOPY. Thousand Oaks: SAGE PUBLICATIONS INC, 2019, vol. 73, No 3, p. 261-270. ISSN 0003-7028. Available from: https://dx.doi.org/10.1177/0003702819826280.

KRUMPOLEC, Richard, Tomáš HOMOLA, David Campbell CAMERON, Josef HUMLÍČEK, Ondřej CAHA, Karla KULDOVÁ, Raul ZAZPE, Jan PŘIKRYL and Jan M. MACAK. Structural and Optical Properties of Luminescent Copper (I) Chloride Thin Films Deposited by Sequentially Pulsed Chemical Vapour Deposition. Coatings. 2018, vol. 8, No 10, p. "369-1"-"369-16", 16 pp. ISSN 2079-6412. Available from: https://dx.doi.org/10.3390/coatings8100369.

COLLAR, K., J. LI, W. JIAO, Y. GUAN, M. LOSURDO, Josef HUMLÍČEK and A.S. BROWN. Determination of the impact of Bi content on the valence band energy of GaAsBi using x-ray photoelectron spectroscopy. AIP Advances. MELVILLE: AMER INST PHYSICS, 2017, vol. 7, No 7, p. nestránkováno, 6 pp. ISSN 2158-3226. Available from: https://dx.doi.org/10.1063/1.4986751.

KLENOVSKÝ, Petr, Jaroslav ZŮDA, Petr KLAPETEK and Josef HUMLÍČEK. Ellipsometry of surface layers on a 1-kg sphere from natural silicon. Applied Surface Science. AMSTERDAM: ELSEVIER SCIENCE BV, 2017, vol. 421, January, p. 542-546. ISSN 0169-4332. Available from: https://dx.doi.org/10.1016/j.apsusc.2016.08.135.

DUBROKA, Adam, Ondřej CAHA, Miloš HRONČEK, Pavel FRIŠ, Milan ORLITA, Václav HOLÝ, H. STEINER, Günther BAUER, Günter SPRINGHOLZ and Josef HUMLÍČEK. Interband absorption edge in the topological insulators Bi-2(Te1-xSex)(3). Physical Review B. College PK, MD USA: AMER PHYSICAL SOC, 2017, vol. 96, No 23, p. "235202-1"-"235202-10", 10 pp. ISSN 2469-9950. Available from: https://dx.doi.org/10.1103/PhysRevB.96.235202.

ABERL, Johannes, Petr KLENOVSKÝ, Johannes S. WILDMANN, Javier MARTÍN-SÁNCHEZ, Thomas FROMHERZ, Eugenio ZALLO, Josef HUMLÍČEK, Armando RASTELLI and Rinaldo TROTTA. Inversion of the exciton built-in dipole moment in In(Ga)As quantum dots via nonlinear piezoelectric effect. Physical Review B. COLLEGE PK, MD USA: AMER PHYSICAL SOC, 2017, vol. 96, No 4, p. nestránkováno, 6 pp. ISSN 2469-9950. Available from: https://dx.doi.org/10.1103/PhysRevB.96.045414.

WANG, Chennan, Ondřej CAHA, Filip MÜNZ, Petr KOSTELNÍK, Tomáš NOVÁK and Josef HUMLÍČEK. Mid-infrared ellipsometry, Raman and X-ray diffraction studies of AlxGa1-xN/AlN/Si structures. Applied Surface Science. Amsterdam: Elsevier Science, 2017, vol. 421, November, p. 859-865. ISSN 0169-4332. Available from: https://dx.doi.org/10.1016/j.apsusc.2017.02.056.

KLENOVSKÝ, Petr, Vlastimil KŘÁPEK and Josef HUMLÍČEK. Type-II InAs/GaAsSb/GaAs Quantum Dots as Artificial Quantum Dot Molecules. ACTA PHYSICA POLONICA A. Warsaw: POLISH ACAD SCIENCES INST PHYSICS, 2016, vol. 129, 1A, p. "A62"-"A65", 4 pp. ISSN 0587-4246. Available from: https://dx.doi.org/10.12693/APhysPolA.129.A-62.

HUMLÍČEK, Josef and Jan ŠIK. Optical functions of silicon from reflectance and ellipsometry on silicon-on-insulator and homoepitaxial samples. Journal of Applied Physics. Melville (USA): American Institute of Physics, 2015, vol. 118, No 19, p. nestránkováno, 6 pp. ISSN 0021-8979. Available from: https://dx.doi.org/10.1063/1.4936126.

KLENOVSKÝ, Petr, Dušan HEMZAL, Petr STEINDL, Markéta ZÍKOVA, Vlastimil KŘÁPEK and Josef HUMLÍČEK. Polarization anisotropy of the emission from type-II quantum dots. Physical Review B. COLLEGE PK: The American Physical Society, 2015, vol. 92, No 24, p. "nestránkováno", 5 pp. ISSN 1098-0121. Available from: https://dx.doi.org/10.1103/PhysRevB.92.241302.

WANG, Chennan, Josef HUMLÍČEK and Ondřej CAHA. R&D of x-ray and spectroscopic methods for characterization of TIGBT device. Brno: ON Semiconductor CR, 2015, 40 pp.

HUMLÍČEK, Josef and Ondřej CAHA. SiC characterization using optical and x-ray techniques. Brno: ON Semiconductor CR, 2015, 17 pp.

MÜNZ, Filip and Josef HUMLÍČEK. Imaging in NIR *SOI, GaN. Masarykova univerzita, Brno: ONSEMI, 2014, 20 pp. Report LDDA 2014.

CAHA, Ondřej, Chennan WANG, Filip MÜNZ and Josef HUMLÍČEK. Metrology of epitaxial layers *GaN. Masarykova univerzita, Brno: ONSEMI, 2014, 67 pp. Report LDDA 2014.

HUMLÍČEK, Josef, Dušan HEMZAL, Adam DUBROKA, Ondřej CAHA, Hubert STEINER, Gunther BAUER and Guenther SPRINGHOLZ. Raman and interband optical spectra of epitaxial layers of the topological insulators Bi2Te3 and Bi2Se3 on BaF2 substrates. Physica Scripta. Bristol (England): Royal Swedish Academy of Sciences, 2014, T162, September, p. "nestránkováno", 4 pp. ISSN 0031-8949. Available from: https://dx.doi.org/10.1088/0031-8949/2014/T162/014007.

BOČÁNEK, Luděk and Josef HUMLÍČEK. Zařízení pro měření rekombinačních procesů v epitaxních vrstvách křemíku (Apparatus for measuring recombinant processes in silicon epitaxial layers). 2014.

MÜNZ, Filip and Josef HUMLÍČEK. Zařízení pro měření tloušťky polovodičových vrstevnatých struktur SOI (Apparatus to measure thickness of SOI semiconductor layered structures). 2014.

HUMLÍČEK, Josef. Data Analysis for Nanomaterials: Effective Medium Approximation, Its Limits and Implementations. In Maria Losurdo; Kurt Hingerl. Ellipsometry at the Nanoscale. Berlin: Springer, 2013, p. 145-178. ISBN 978-3-642-33955-4. Available from: https://dx.doi.org/10.1007/978-3-642-33956-1_3.

CAHA, Ondřej, Adam DUBROKA, Josef HUMLÍČEK, Václav HOLÝ, Hubert STEINER, M. UL-HASSAN, Jaime SANCHEZ-BARRIGA, Oliver RADER, T. N. STANISLAVCHUK, Andrei A. SIRENKO, Günther BAUER and Günter SPRINGHOLZ. Growth, Structure, and Electronic Properties of Epitaxial Bismuth Telluride Topological Insulator Films on BaF2 (111) Substrates. Crystal Growth & Design. Washington: American Chemical Society, 2013, vol. 13, No 8, p. 3365-3373. ISSN 1528-7483. Available from: https://dx.doi.org/10.1021/cg400048g.

CHALOUPKA, Jiří, Dominik MUNZAR and Josef HUMLÍČEK. Infrared Ellipsometric Investigations of Free Carriers and Lattice Vibrations in Superconducting Cuprates. In Maria Losurdo; Kurt Hingerl. Ellipsometry at the Nanoscale. Berlin: Springer, 2013, p. 429-451. ISBN 978-3-642-33955-4. Available from: https://dx.doi.org/10.1007/978-3-642-33956-1_12.

CAHA, Ondřej, P. KOSTELNÍK, Jan ŠIK, Y.D. KIM and Josef HUMLÍČEK. Lattice constants and optical response of pseudomorph Si-rich SiGe:B. Applied Physics Letters. USA: American institute of physics, 2013, vol. 103, No 20, p. "nestránkováno", 4 pp. ISSN 0003-6951. Available from: https://dx.doi.org/10.1063/1.4830367.

ROSSLE, Matthias, C.N. WANG, Přemysl MARŠÍK, M. YAZDI-RIZI, K.W. KIM, Adam DUBROKA, I. MAROZAU, C.W. SCHNEIDER, Josef HUMLÍČEK, Dionys BAERISWYL and Christian BERNHARD. Optical probe of ferroelectric order in bulk and thin-film perovskite titanates. Physical Review B. USA: The American Physical Society, 2013, vol. 88, No 10, p. "nestránkováno", 7 pp. ISSN 1098-0121. Available from: https://dx.doi.org/10.1103/PhysRevB.88.104110.

KLENOVSKÝ, Petr, Moritz BREHM, Vlastimil KŘÁPEK, Elisabeth LAUSECKER, Dominik MUNZAR, Florian HACKL, Hubert STEINER, Thomas FROMHERZ, Günther BAUER and Josef HUMLÍČEK. Excitation intensity dependence of photoluminescence spectra of SiGe quantum dots grown on prepatterned Si substrates: Evidence for biexcitonic transition. Physical Review B. USA: The American Physical Society, 2012, vol. 86, No 11, p. "nestránkováno", 8 pp. ISSN 1098-0121. Available from: https://dx.doi.org/10.1103/PhysRevB.86.115305.

VÁVRA, Ivo, Z. KRIZANOVA, J. DERER and Josef HUMLÍČEK. Mo/SiO2 nanocomposite films for optical coatings prepared by vacuum magnetron sputtering. Vacuum. Oxford, UK: ELSEVIER (PERGAMON), 2012, vol. 86, No 6, p. 742-744. ISSN 0042-207X. Available from: https://dx.doi.org/10.1016/j.vacuum.2011.07.034.

JUNG, Yong Woo, J.S. BYUN, Y.D. KIM, Dušan HEMZAL and Josef HUMLÍČEK. Study of the Interaction Between HSA and Oligo-DNA Using Total Internal Reflection Ellipsometry. JOURNAL OF THE KOREAN PHYSICAL SOCIETY. Seoul: Korean Physical Soc, 2012, vol. 60, No 8, p. 1288-1291. ISSN 0374-4884. Available from: https://dx.doi.org/10.3938/jkps.60.1288.

HUMLÍČEK, Josef, Petr KLENOVSKÝ and Dominik MUNZAR. ELECTRONIC STRUCTURE OF INAS/GAAS/GAASSB QUANTUM DOTS. In 3rd International Conference on NANOCON. SLEZSKA: TANGER LTD, 2011, p. 39-44. ISBN 978-80-87294-27-7.

HUMLÍČEK, Josef, Alois NEBOJSA, Filip MÜNZ, Milka MIRIC and Rados GAJIC. Infrared ellipsometry of highly oriented pyrolytic graphite. Thin Solid Films. Elsevier, 2011, vol. 519, No 9, p. 2624-2626. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2010.12.091.

HUMLÍČEK, Josef. Infrared resonances of local fields and ellipsometric spectra of negative-refraction metamaterials. Thin Solid Films. Elsevier, 2011, vol. 519, No 9, p. 2655-2658. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2010.12.055.

MÜNZ, Filip, Josef HUMLÍČEK and Přemysl MARŠÍK. Optimized calibration and measurement procedures in rotating analyzer and rotating polarizer ellipsometry. Thin Solid Films. Elsevier, 2011, vol. 519, No 9, p. 2703-2706. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2010.12.063.

ISIC, Goran, Milka JAKOVLJEVIC, Marko FILIPOVIC, Djordje JOVANOVIC, Borislav VASIC, Sasa LAZOVIC, Nevena PUAC, Zoran PETROVIC, Radmila KOSTIC, Rados GAJIC, Josef HUMLÍČEK, Maria LOSURDO, Giovanni BRUNO, Iris BERGMAIR and Kurt HINGERLT. Spectroscopic ellipsometry of few-layer graphene. Journal of Nanophotonics. Bellingham, USA: SPIE, 2011, vol. 5, No 1, p. 1-7. ISSN 1934-2608. Available from: https://dx.doi.org/10.1117/1.3598162.

GLADKOV, Petar, Josef HUMLÍČEK, Eduard HULICIUS, Tomislav ŠIMEČEK, Tanya PASKOVA and Keith EVANS. Effect of Fe doping on optical properties of freestanding semi-insulating HVPE GaN:Fe. Journal of crystal growth. Amsterdam: Elsevier Science, 2010, vol. 312, No 8, p. 1205-1209. ISSN 0022-0248.

HUMLÍČEK, Josef. Efficient dealing with spectrum line profiles using complex rational functions. JOURNAL OF QUANTITATIVE SPECTROSCOPY & RADIATIVE TRANSFER. Oxford: PERGAMON-ELSEVIER SCIENCE LTD, OXFORD, 2010, vol. 111, No 11, p. 1543–1544. ISSN 0022-4073.

KLENOVSKÝ, Petr, Vlastimil KŘÁPEK, Dominik MUNZAR and Josef HUMLÍČEK. Electronic structure of InAs quantum dots with GaAsSb strain reducing layer: Localization of holes and its effect on the optical properties. Applied Physics Letters. USA: American institute of physics, 2010, vol. 97, No 203107, 3 pp. ISSN 0003-6951.

KLENOVSKÝ, Petr, Vlastimil KŘÁPEK, Dominik MUNZAR and Josef HUMLÍČEK. Modelling of electronic states in InAs/GaAs quantum dots with GaAsSb strain reducing overlayer. Journal of Physics: Conference Series. Institute of Physics Publishing, 2010, vol. 244, No 012086, 4 pp. ISSN 1742-6588.

STARMAN, Stanislav, Vaclav MATZ, Zdenek KVACA, Martin MOHYLA, Vladimir OLSAK, Mariana KLEMENTOVA, Josef HUMLÍČEK and Michal DRSTICKA. PREPARATION OF NANOCOMPOSITE TITANATE NANOTUBES. In NANOCON 2010, 2ND INTERNATIONAL CONFERENCE. SLEZSKA: TANGER LTD, 2010, p. 53-60. ISBN 978-80-87294-19-2.

LOSURDO, Maria, Maria M GIANGREGORIO, Giuseppe V BIANCO, Alexandra A SUVOROVA, C. KONG, S. RUBANOV, Pio CAPEZZUTO, Josef HUMLÍČEK and Giovanni BRUNO. Size dependence of the dielectric function of silicon-supported plasmonic gold nanoparticles. Physical Review B. USA: American Physical Society, 2010, vol. 82, No 15, p. 155451-9, 9 pp. ISSN 1098-0121.

SIKOLA, T., R.D. KEKAPTURE, E.S. BARNARD, J.S. WHITE, P. VAN DORPE, L. BRINEK, O. TOMANEC, J. ZLAMAL, D.Y. LEI, Y. SONNENFRAUD, S.A. MAIER, Josef HUMLÍČEK and M.L. BRONGERSMA. Mid-IR plasmonic antennas on silicon-rich oxinitride absorbing substrates: Nonlinear scaling of resonance wavelengths with antenna length. Applied Physics Letters. USA: American institute of physics, 2009, vol. 95, No 25, p. 3109-3111. ISSN 0003-6951.

LOSURDO, Maria, Michael BERGMAIR, Giovanni BRUNO, D. CATELLAN, C. COBET, A. DE MARTINO, K. FLEISCHER, Z. DOHCEVIC-MITROVIC, N. ESSER, M. GAILLET, R. GAJIC, Dušan HEMZAL, K. HINGERL, Josef HUMLÍČEK, R. OSSIKOVSKI, Z.V. POPOVIC and O. SAXL. Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives. Journal of Nanoparticle Research. Dordrecht: Springer Netherlands, 2009, vol. 11, No 7, p. 1521-1554. ISSN 1388-0764.

FIKAROVÁ ZRZAVECKÁ, Olga, Alois NEBOJSA, Karel NAVRÁTIL, Stanislav NEŠPŮREK and Josef HUMLÍČEK. Dynamics of UV degradation of PMPSi in vacuum and in the air using in-situ ellipsometry. physica status solidi (c). 2008, vol. 5, No 5, p. 1176-1179. ISSN 1610-1642.

HUMLÍČEK, Josef. In-situ spectroscopic ellipsometry: optimization of monitoring and closed-loop-control procedures. physica status solidi (a), Applied research. Berlin: Akademie-Verlag, 2008, vol. 205, No 4, p. 793-796. ISSN 1862-6300.

MARŠÍK, Přemysl and Josef HUMLÍČEK. Multiplate misalignment artifacts in rotating-complensator ellipsometry: Analysis and data treatment. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, vol. 5, No 5, p. 1064-1067. ISSN 1610-1634.

NEBOJSA, Alois, Olga FIKAROVÁ ZRZAVECKÁ, Karel NAVRÁTIL and Josef HUMLÍČEK. Temperature dependence of ellipsometric spectra of Fe and CrNiAl steel. physica status solidi (c). 2008, vol. 5, No 5, p. 1176-1179. ISSN 1610-1642.

KŘÁPEK, Vlastimil, Karla KULDOVÁ, Jiří OSWALD, Alice HOSPODKOVÁ, Eduard HULICIUS and Josef HUMLÍČEK. Electron states and magnetophotoluminescence of elongated InAs/GaAs quantum dots. In CP893, Physics of Semiconductors: 28th International Conference on the Physics of Semiconductors. USA: American Institute of Physics, 2007, p. 901-902. ISBN 978-0-7354-0397-0.

HUMLÍČEK, Josef, Adam DUBROKA, Přemysl MARŠÍK, Dominik MUNZAR, A.V. BORIS and Christian BERNHARD. Frequency- and temperature-dependent conductivity at the metal-insulator transition in phosphorus doped silicon studied by far-infrared ellipsometry. In CP893, Physics of Semiconductors, 28th International Conference. USA: American Institute of Physics, 2007, p. 33-34. ISBN 978-0-7354-0397-0.

HOSPODKOVÁ, Alice, Vlastimil KŘÁPEK, Tomáš MATES, Karla KULDOVÁ, Jiří PANGRÁC, Eduard HULICIUS, Jiří OSWALD, Karel MELICHAR, Josef HUMLÍČEK and Tomislav ŠIMEČEK. Lateral shape of InAs/GaAs quantum dots in vertically correlated structures. Journal of crystal growth. Amsterdam: Elsevier Science, 2007, vol. 298, SI, p. 570-573. ISSN 0022-0248.

DUBROKA, Adam, T. KIRK, H. U. HABERMEIER, G. CHRISTIANI, Josef HUMLÍČEK, Dominik MUNZAR and C. BERNHARD. Optical study of YBa2Cu3O7/LCMO superlattices. In Program and Abstract Book, Yamada Conference LXI SNS2007. Sendai (Japonsko): Neuveden, 2007, p. 225.

HOSPODKOVÁ, Alice, Vlastimil KŘÁPEK, Karla KULDOVÁ and Josef HUMLÍČEK. Photoluminescence and magnetophotoluminescence of vertically stacked InAs/GaAs quantum dot structures. Physica E. Amsterdam: Elsevier Science, 2007, vol. 36, No 1, p. 106-113. ISSN 1386-9477.

KŘÁPEK, Vlastimil, Karla KULDOVÁ, Jiří OSWALD, Alice HOSPODKOVÁ, Eduard HULICIUS and Josef HUMLÍČEK. Elongation of InAs/GaAs quantum dots from magnetophotoluminescence measurements. Applied Physics Letters. USA: American Institute of Physics, 2006, vol. 89, No 15, p. 3108-3110. ISSN 0003-6951.

ŠTOUDEK, Richard and Josef HUMLÍČEK. Infrared spectroscopy of oxygen interstitials and precipitates in nitrogen-doped silicon. Physica B condensed matter. Amsterdam: Elsevier Science, 2006, 376-377, No 6, p. 150-153. ISSN 0921-4526.

HUMLÍČEK, Josef, Richard ŠTOUDEK and Adam DUBROKA. Infrared vibrations of interstitial oxygen in silicon-rich SiGe alloys. Physica B. Amsterdam: Elsevier Science, 2006, 376-377, No 6, p. 212-215. ISSN 0921-4526.

KULDOVÁ, Karla, Vlastimil KŘÁPEK, Alice HOSPODKOVÁ, Olga BONAVENTUROVÁ ZRZAVECKÁ, Jiří OSWALD, Eduard HULICIUS and Josef HUMLÍČEK. Photoluminescence and magnetophotoluminescence of circular and elliptical InAs/GaAs quantum dots. Materials Science & Engineering C-Biomimetic and Supramolecular Systems. Amsterdam: Elsevier, 2006, vol. 26, 5-7, p. 983-986. ISSN 0928-4931.

DUBROKA, Adam, Josef HUMLÍČEK, Miroslav Vergilov ABRASHEV, Zoran POPOVIC, Fernando SAPINA and Andres CANTARERO. Raman and infrared studies of La1-ySryMn1-xMxO3 (M=Cr, Co, Cu, Zn, Sc or Ga): Oxygen disorder and local vibrational modes. Physical Review B. USA: The American Physical Society, 2006, vol. 73, No 22, p. 224401-1 do 22440-10, 10 pp. ISSN 1098-0121.

MAREK, A., L. KAPRÁLKOVÁ, P. SCHMIDT, J. PFLEGER, Josef HUMLÍČEK, J. POSPÍŠIL and J. PILAŘ. Spatial resolution of degradation in stabilized polystyrene and polypropylene plaques exposed to accelerated photodegradation or heat aging. Polymer Degradation and Stability. Elsevier Ltd., 2006, vol. 91, No 2, p. 444-458. ISSN 0141-3910.

EITZINGER, Christian, Jan FIKAR, Christian FORSICH and Josef HUMLÍČEK. Spectroscopic Ellipsometry as a Tool for On-Line Monitoring and Control of Surface Treatment Processes. Materials Science Forum. Trans Tech Publications, 2006, vol. 518, No 4, p. 423-430. ISSN 0255-5476.

KULDOVÁ, Karla, Vlastimil KŘÁPEK, Alice HOSPODKOVÁ, Jiří OSWALD, Jiří PANGRÁC, Karel MELICHAR, Eduard HULICIUS, Marek POTEMSKI and Josef HUMLÍČEK. 1.3 mum emission from InAs/GaAs quantum dots. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2006, vol. 3, No 11, p. 3811-3814. ISSN 1610-1642.

HUMLÍČEK, Josef, Vlastimil KŘÁPEK and Jan FIKAR. Anisotropy of Absorption and Luminescence of Multilayer InAs/GaAs Quantum Dots. In CP772, Physics of Semiconductors: 27th International Conference on the Physics of Semiconductors. USA: American Institute of Physics, 2005, p. 753-754. ISBN 0-7354-0257--4.

HUMLÍČEK, Josef. člen podoborové komise 202 GA ČR. Grantová agentura České republiky, 2005.

HUMLÍČEK, Josef and Vlastimil KŘÁPEK. Infrared Response of Heavily Doped p-type Si and SiGe Alloys from Ellipsometric Measurements. In CP772, Physics of Semiconductors: 27th International Conference on the Physics of Semiconductors. USA: American Institute of Physics, 2005, p. 113-114. ISBN 0-7354-0257--4.

CÁSEK, Petr, Christian BERNHARDT, Josef HUMLÍČEK and Dominik MUNZAR. Interpretation of in-plane infrared response of high-Tc cuprate superconductors involving spin fluctuations using quasiparticle spectral functions. Physical Review B. USA: The American Physical Society, 2005, vol. 72, No 13, p. 134526-134544. ISSN 1098-0121.

HUMLÍČEK, Josef. Polarized light and ellipsometry. In Handbook of Ellipsometry. New York: William Andrew Publishing, 2005, p. 3-91. Handbook of Ellipsometry. ISBN 0-8155-1499-9.

BERNHARD, Christian, Todd HOLDEN, Alexandr BORIS, Natalia KOVALEVA, Alexei PIMENOV and Josef HUMLÍČEK. Anomalous oxygen-isotope effect on the in-plane far-infrared conductivity of detwinned (YBa2Cu3O6.9)-O-16,18. Physical Review B. USA: The American Physical Society, 2004, vol. 69, No 5, p. 2502-4, 4 pp. ISSN 0163-1829.

HUMLÍČEK, Josef. člen oborové komise GA ČR pro Přírodní vědy. Grantová agentura České republiky, 2004.

HUMLÍČEK, Josef. člen podoborové komise 202 GA ČR. Grantová agentura České republiky, 2004.

HUMLÍČEK, Josef and Christian BERNHARD. Diffraction effects in infrared ellipsometry of conducting samples. Thin Solid Films. Oxford: Elsevier, 2004, 455-456, No 1, p. 177-182. ISSN 0040-6090.

KŘÁPEK, Vlastimil, Jan FIKAR and Josef HUMLÍČEK. Electronic Structure and Optical Properties of InAs/GaAs Quantum Dots. In WDS'04 Proceedings of contributed papers. Praha: MFF UK, 2004, p. 469-474. ISBN 80-86732-32-0.

BERNHARD, Christian, Josef HUMLÍČEK and Bernhard KEIMER. Far-infrared ellipsometry using a synchrotron light source - the dielectric response of the cuprate high Tc superconductors. Thin Solid Films. Oxford: Elsevier, 2004, 455-456, No 1, p. 143-149. ISSN 0040-6090.

BRANDEJSOVÁ, Eva, Jan ČECHAL, Olga BONAVENTUROVÁ ZRZAVECKÁ, Alois NEBOJSA, Petr TICHOPÁDEK, Michal URBÁNEK, Karel NAVRÁTIL, Tomáš ŠIKOLA and Josef HUMLÍČEK. In situ analysis of PMPSi thin films by spectroscopic ellipsometry. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 2004, 9/2004, No 9, p. 260-262. ISSN 0447-6441.

ŠTOUDEK, Richard and Josef HUMLÍČEK. Infrared Absorption Spectroscopy of Oxygen Precipitates in Czochralski Silicon. In WDS'04 Proceedings of Contributed Papers. Praha, Česká republika: MATFYZPRESS, 2004, p. 475-479, 4 pp. ISBN 80-86732-32-0.

ŠTOUDEK, Richard, Michal LORENC and Josef HUMLÍČEK. Infrared Absorption Spectroscopy of Oxygen Precipitates in Nitrogen-doped Czochralski Silicon. In Proceedings of The Ninth Scientific and Business Conference SILICON 2004. Rožnov pod Radhoštěm, Česká republika: TECON Scientific, s.r.o., 2004, p. 146-150.

DUBROKA, Adam, G. CRISTIANI, H.-U. HABERMEIER and Josef HUMLÍČEK. Infrared study of YBa2Cu3O7/La0.67Ca0.33MnO3 superlattices. Thin Solid Films. Oxford, UK: Elsevier science, 2004, vol. 2004, No 455, p. 172-176. ISSN 0040-6090.

HOLDEN, Todd, Hanns HABERMEIER, Georg CRISTIANI, Andrzej GOLNIK, Alexander BORIS, Alexei PIMENOV and Josef HUMLÍČEK. Proximity induced metal-insulator transition in YBa2Cu3O7/La2/3Ca1/3MnO3 superlattices. Physical Review B. USA: The American Physical Society, 2004, vol. 69, No 6, p. 4505 1-7, 7 pp. ISSN 1098-0121.

BONAVENTUROVÁ ZRZAVECKÁ, Olga, Alois NEBOJSA, Karel NAVRÁTIL, Stanislav NEŠPŮREK and Josef HUMLÍČEK. Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane). Thin Solid Films. Elsevier, 2004, 455/2004, may, p. 278-282. ISSN 0040-6090.

HUMLÍČEK, Josef. člen oborové komise GA ČR pro Přírodní vědy. Grantová agentura České republiky, 2003.

HUMLÍČEK, Josef. člen podoborové komise 202 GA ČR. Grantová agentura České republiky, 2003.

KŘÁPEK, Vlastimil, Václav HOLÝ and Josef HUMLÍČEK. Strain field in quantum dots. In WDS'03 Proceedings of Contributed Papers. Praha: MFF UK, 2003, p. 581-586. ISBN 80-86732-18-5.

HUMLÍČEK, Josef. člen oborové komise GA ČR pro Přírodní vědy. 2002.

HUMLÍČEK, Josef. člen podoborové komise 202 GA ČR. Grantová agentura České republiky, 2002.

BERNHARD, C., T. HOLDEN, Josef HUMLÍČEK, Dominik MUNZAR and A. GOLNIK. In-plane polarized collective modes in detwinned YBa2Cu3O6.95 observed by spectral ellipsometry. Solid state communications. Velká Britanie: Pergamon-Elsevier Science, 2002, vol. 121, No 2, p. 93-97. ISSN 0038-1098.

HUMLÍČEK, Josef, Dominik MUNZAR, Karel NAVRÁTIL and Michal LORENC. Polarization anisotropy of photoluminescence from multilayer InAs/GaAs quantum dots. Physica E. Amsterdam: Elsevier Science, 2002, vol. 13, No 2, p. 229-232. ISSN 1386-9477.

HUMLÍČEK, Josef and Miquel GARRIGA. Temperature Dependence of the Optical Spectra of SiGe Alloys. In PANTELIDES, Sokrates T. and Stefan ZOLLNER. Silicon-Germanium Carbon Alloys. New York: Taylor & Francis, 2002, p. 483-530. Optoelectronic Properties of Semicond. and SL, 15. ISBN 1-56032-963-7.

MUNZAR, Dominik, Christian BERNHARD, Todd HOLDEN, Andrzej GOLNIK, Josef HUMLÍČEK and Manuel CARDONA. Correlation between the Josephson coupling energy and the condensation energy in bilayer cuprate superconductors. Physical Review B. USA: American Physical Society, 2001, 64(2001), -, p. 024523-1, 14 pp. ISSN 0163-1829.

BERNHARD, C., Dominik MUNZAR, A. GOLNIK,LIN,WITTLIN, Josef HUMLÍČEK and M. CARDONA. Anomaly of oxygen bond-bending mode at 320 cm-1 and additional absorption peak in the c-axis infrared conductivity of underdoped YBa2Cu3O7 single crystals. Physical Review B. USA: The American Physical Society, 2000, vol. 61, No 1, p. 618-626. ISSN 0163-1829.

HUMLÍČEK, Josef, Ralf HENN and Manuel CARDONA. Infrared vibrations in LaSrGaO4 and LaSrAlO4. Phys. Rev. B. USA: The American Phys. Society, 2000, vol. 61, No 21, p. 14554-14563. ISSN 0163-1829.

ŠIK, Jan and Josef HUMLÍČEK. Near-band-gap optical functions spectra and band-gap energies of GaNAs/GaAs superlattice. Appl. Phys. Lett. USA: Institute of Physics, 2000, vol. 76, No 20, p. 2859-2861. ISSN 0003-6951.

MUNZAR, Dominik, C. BERNHARD, A. GOLNIK, Josef HUMLÍČEK and M. CARDONA. Anomalies of the infrared-active phonons in underdoped YBa2Cu30y as evidence for the intra-bilayer Josephson effect. Solid state communications. Velká Britanie: Pergamon, 1999, (112)1999, -, p. 365-369. ISSN 0038-1098.

HUMLÍČEK, Josef. Infrared Spectroscopy of LiF on Ag and Si. Phys.stat.sol.(b). Germany, 1999, 215(1999), -, p. 155-159.

LORENC, Michal, Jan ŠIK, Alois NEBOJSA, Karel NAVRÁTIL, Josef HUMLÍČEK, V. VORLIČEK and E. HULICIUS. Optical characterisation of a thick MOVPE InSb film on GaAs. In Workshop proceedings EW MOVPE VIII. Prague: Institute of Physics ASCR, CR, 1999, p. 369-372. ISBN 80-238-3551-3.

NAVRÁTIL, Karel, Jan ŠIK, Josef HUMLÍČEK and S. NEŠPŮREK. Optical properties of thin films of poly(methyl-phenylsilylene). Optical Materials. Amsterdam: Elsevier, 1999, vol. 1999, No 12, p. 105-113. ISSN 0925-3467.

GOLNIK, A., Ch. BERNHARD, Josef HUMLÍČEK, M. KLAESER and M. CARDONA. The far-infrared in-plane conductiivity of YBaCuO studied by ellipsometry. physics status solidi (b). 1999, vol. 215, No 1, p. 553-556.

HUMLÍČEK, Josef. Ellipsometric study of fano resonance in heavily doped p-type Si and SiGe alloys. Thin Solid Films. UK Oxford: Elsevier science, 1998, vol. 1998, 313-314, p. 656-660. ISSN 0040-6090.

HUMLÍČEK, Josef, Alois NEBOJSA, J. HORA, M. STRÁSKÝ, J. SPOUSTA and T. ŠIKOLA. Ellipsometry and transport studies of thin-film metal nitrides. Thin Solid Films. UK Oxford: Elsevier science, 1998, vol. 1998, No 332, p. 25-29. ISSN 0040-6090.

HUMLÍČEK, Josef. Infrared ellipsometry of LiF. Thin Solid Films. UK Oxford: Elsevier science, 1998, vol. 1998, 313-314, p. 687-691. ISSN 0040-6090.

LORENC, Michal and Josef HUMLÍČEK. Localized vibrational modes of interstitial oxygen in Si x Ge 1-x alloys. Acta physica polonica A. Jaszowiec Polsko: Intern.School on Physics of Semicond.Com, 1998, vol. 1998, No 3, p. 436-441.

ŠIK, Jan, Jaroslav HORA and Josef HUMLÍČEK. Optical functions of silicon at high temperatures. Journal of Applied Physics. USA: American institute of physics, 1998, vol. 1998, No 11, p. 6291-6298. ISSN 0021-8979.

HUMLÍČEK, Josef. Silicon-germanium alloys (Si x Ge 1-x) revisited. In Handbook of optical Constants of solids III. 1st ed. USA: Academic Press, 1998, p. 537-552. ISBN 0-12-544423-0.

BORTCHAGOVSKY, E., I. YURCHENKO, Z. KAZANTSEVA, Josef HUMLÍČEK and J. HORA. Spectroscopic ellipsometry of fullerene embedded langmuir-blodgett films with surface plasmon excitation. Thin Solid Films. UK Oxford: Elsevier science, 1998, vol. 1998, 313-314, p. 795-798. ISSN 0040-6090.

HANDLÍŘOVÁ, Blanka, Josef HUMLÍČEK, Luděk BOČÁNEK, T. NGUYEN MANH and H. SITTER. Thermally modulated optical response of C 60 thin films in the region of absorption edge. Molecular nanostructures. World Scientific Publishing Company, 1997, vol. 1998, -, p. 155-158.

LORENC, Michal and Josef HUMLÍČEK. Vibrational modes in Si x Ge 1-x alloys: temperature and compositional dependence. Acta Physica Polonica A. Jaszowiec Polsko: Inter.School on Physics of Semicond.Comp, 1997, (92)1997, No 5, p. 899-902.

HUMLÍČEK, Josef, R. HENN and M. CARDONA. Far-infrared Ellipsometry of Depleted Surface Layer in Heavily Doped N-type GaAs. Appl. Phys. Lett. USA: Institute of Physics, 1996, 69(1996), No 17, p. 2581-2583. ISSN 0003-6951.

HUMLÍČEK, Josef. Infrared Electrodynamics From Ellipsometric Measurements. Ferroelectrics. Amsterdam: OPA, 1996, vol. 1996, No 176, p. 221-238.

HORA, Jaroslav, Karel NAVRÁTIL and Josef HUMLÍČEK. Optical Anisotropy of SrLaAlO(4) and SrLaAl(0.75)Ga(0.25) O(4) Single Crystals. Phys. Stat. Sol. (b). Berlin: Wiley-VCH, 1996, vol. 1996, No 195, p. 625-635.

HORA, Jaroslav, Petr PÁNEK, Karel NAVRÁTIL and Josef HUMLÍČEK. Optical response of C60 thin films and solutions. Physical Review B. USA: The American Physical Society, 1996, 54(1996), No 7, p. 5106-5113. ISSN 0163-1829.

HORA, Jaroslav, Petr PÁNEK, Karel NAVRÁTIL and Josef HUMLÍČEK. Optical Response of C60 thin Films and Solutions. Physical Review B. USA: The American Physical Society, 1996, vol. 1996, No 54, p. 5106-5113. ISSN 0163-1829.

HUMLÍČEK, Josef, Luděk BOČÁNEK, Karel NAVRÁTIL, Petr PÁNEK and Radoslav ŠVEHLA. Excition-polariton edge of GaAs: MBE layers between multiple-quantum-well structures. Solid State Communications. UK: Elsevier Science, 1995, 93(1995), No 9, p. 725-728. ISSN 0038-1098.

HANDLÍŘOVÁ, Blanka, Václav HOLÝ, Josef HUMLÍČEK, Jana MUSILOVÁ, Petr PÁNEK and František VIŽĎA. Konzultační cvičení II (Consultations II). Brno: Masarykova univerzita v Brně, 1995, 86 pp. ISBN 80-210-1289-7.

HUMLÍČEK, Josef. Optical functions of the relaxed SiGe alloy and influence of strain. In Silicon Germanium. London, UK: University of Stuttgart, Germany, 1995, p. 121-131. INSPEC. ISBN 0-85296-826-4.

HUMLÍČEK, Josef. Optical spectroscopy of SiGe. In Silicon Germanium. London, UK: University of Stuttgart, Germany, 1995, p. 116-120. INSPEC. ISBN 0-85296-826-4.

PÁNEK, Petr, Dominik MUNZAR, Josef HUMLÍČEK and František LUKEŠ. Photoreflectance Study of a Fibonacci Superlattice. physica status solidi (b). Berlin: J. Wiley, 1995, 190(1995), No 1995, p. 579-586. ISSN 0370-1972.

HUMLÍČEK, Josef, C. THOMSEN and M. CARDONA. Far-infrared response of free carriers in YBA 2 Cu 3 O 7 from ellipsometric measurements. Physica C. Holland: Elsevier, 1994, vol. 222, No 1, p. 166-172. ISSN 0921-4534.

MUNZAR, Dominik, Luděk BOČÁNEK, Josef HUMLÍČEK and K. PLOOG. Fractal structure in optical spectra of Fibonacci superlattices. J.Phys.: Condens. Matter. Velká Britanie: IOP Publishing Ltd, 1994, 6(1994), -, p. 4107-4118. ISSN 0953-8984.

HUMLÍČEK, Josef. Transverse and longitudinal vibration modes in alpha-quartz. Philosophical Magazine B. Taylor and Francis, 1994, 70(1994), No 3, p. 699-710.

HUMLÍČEK, Josef, Eduard SCHMIDT, Luděk BOČÁNEK and Radoslav ŠVEHLA. Exciton line shapes of GaAs/AlAs multiple quantum wells. Phys. Rev. B. USA: The American Phys. Society, 1993, 48(1993), No 8, p. 5241-5248. ISSN 0163-1829.

HUMLÍČEK, Josef. Infrared refracctive index of germanium-silicon alloy crystals. Appl. Opt. 1993, 31(1992), No 1, p. 90-94.

KIRCHER, J. and Josef HUMLÍČEK. Interband transitions in YBa 2 Cu 3 O 7. Physica C. 1993, 192(1992), -, p. 473-480. ISSN 0921-4534.

HUMLÍČEK, Josef and Arnulf ROESELER. IR ellipsometry of the highly anisotropic materials alpha - SiO2 and alpha-Al2O3. Thin Solid Films. UK Oxford: Elsevier science, 1993, vol. 234, No 1, p. 332-336. ISSN 0040-6090.

HUMLÍČEK, Josef, A.P. LITVINCHUK and W. KRESS. Lattice vibrations of Y(1-x) Pr( x) Ba(2)Cu(3)O(7): theory and experiment. Physica C. Holland: Elsevier, 1993, vol. 1993, No 3, p. 345-359. ISSN 0921-4534.

HUMLÍČEK, Josef, K. KAMARAS and J. KIRCHER. Mid- and near - IR ellipsometry of Y 1-x Pr x Ba 2 Cu 3 O 7 epitaxial films. Thin Solid Films. UK Oxford: Elsevier science, 1993, vol. 234, No 1, p. 518-521. ISSN 0040-6090.

HUMLÍČEK, Josef. Normal-state infrared response from ellipsometric measurements: YBa(2)Cu(3)O(7) and PrBa(2)Cu(3)O(7). In Electronic Properties of high-Tc Superconductors. 1st ed. Berlin, Heidelberg: Springer Verlag, 1993, p. 244-248. Springer Series in Solid-State Sciences, vol. 113. ISBN 3-540-56195-1.

HUMLÍČEK, Josef. Sensitivity of optical measurements of planar stratified structures and reduction of experimentsl data. 1st ed. Brno: Masaryk University Brno, 1993, 99 pp. FOLIA Fac. Sci. Nat. UM Brunensis, Physica 49. ISBN 80-210-0423-1.

ZOLLNER, S., M. GARRIGA, J. KIRCHER, Josef HUMLÍČEK, M. CARDONA and G. NEUHOLD. Temperature dependence of the dielectric function and the interband critical-point parameters of GaP. Phys. Rev. B. USA: The American Phys. Society, 1993, vol. 48, No 11, p. 7915-7929. ISSN 0163-1829.

ZOLLNER, S. and Josef HUMLÍČEK. Temperature dependence of the dielectric function and the interband critical-point parameters of GaP. Thin Solid Films. UK Oxford: Elsevier science, 1993, vol. 1993, -, p. 185-188. ISSN 0040-6090.

HUMLÍČEK, Josef and Miquel GARRIGA. Temperature dependence of the refractive index of crystalline germanium-silicon alloys. Appl. Phys. A. Springer-Verlag, 1993, vol. 1993, No 2, p. 259-261.

HUMLÍČEK, Josef, Arnulf ROESELER, Thomas ZETTLER, Maria KEKOUA and Elza KHOUTSISHVILI. Infrared refractive index of germanium-silicon alloy crystals. Applied Optics. USA: Optical Society of America, 1992, vol. 31, No 1, p. 90-94. ISSN 0003-6935.

KIRCHER, J., Josef HUMLÍČEK, Miquel GARRIGA and Manuel CARDONA. Interband transitions in YBa(2)Cu(3)O(7). Physica C. Holland: Elsevier, 1992, vol. 192, No 5, p. 473-480. ISSN 0921-4534.

SCHMID, Uwe, Josef HUMLÍČEK, František LUKEŠ and Manuel CARDONA. Optical transitions in strained Ge/Si superlattices. Physical Review B. USA: The American Physical Society, 1992, vol. 45, No 12, p. 6793-6801. ISSN 0163-1829.

SCHMID, U., Josef HUMLÍČEK, F. LUKEŠ and M. CARDONA. Optical transitions in strained Si/Ge superlattices. Thin Solid Films. Oxford, UK: Elsevier science, 1992, vol. 222, No 2, p. 246-250. ISSN 0040-6090.

HUMLÍČEK, Josef and František LUKEŠ. REFLECTANCE AND PHOTOREFLECTANCE SPECTRA OF GAAS/ALAS SUPERLATTICES. Superlattices and Microstructures. London: ACADEMIC PRESS LTD, LONDON, 1991, vol. 9, No 1, p. 133-136. ISSN 0749-6036.

HUMLÍČEK, Josef. OPTICAL-SPECTRA OF SIXGE1-X ALLOYS. J. Appl. Phys. USA: American Institute of Physics, 1989, vol. 65, No 7, p. 2827-2832. ISSN 0021-8979.

HUMLÍČEK, Josef, M. GARRIGA and M. CARDONA. TEMPERATURE-DEPENDENCE OF OPTICAL-EXCITATIONS IN YBA2CU3O6, SMBA2CU3O6. Solid state communications. Velká Britanie: Pergamon, 1988, vol. 67, No 6, p. 589-592. ISSN 0038-1098.

HUMLÍČEK, Josef. TEMPERATURE-DEPENDENCE OF OPTICAL-EXCITATIONS IN YBA2CU3O6, SMBA2CU3O6. SOLID STATE COMMUNICATIONS. OXFORD: PERGAMON-ELSEVIER SCIENCE LTD, 1988, vol. 67, No 6, p. 589-592. ISSN 0038-1098.

HUMLÍČEK, Josef. SENSITIVITY EXTREMA IN MULTIPLE-ANGLE ELLIPSOMETRY. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A. OPTICAL SOC AMER, WASHINGTON, 1985, vol. 2, No 5, p. 713-722. ISSN 0740-3232.

HUMLÍČEK, Josef. EVALUATION OF DERIVATIVES OF REFLECTANCE AND TRANSMITTANCE BY STRATIFIED STRUCTURES AND SOLUTION OF THE REVERSE PROBLEM OF ELLIPSOMETRY. Optica Acta. London: Taylor and Francis, 1983, vol. 30, No 1, p. 97-105. ISSN 0030-3909.

HUMLÍČEK, Josef. Optimized computation of the Voigt and complex probability functions. JOURNAL OF QUANTITATIVE SPECTROSCOPY & RADIATIVE TRANSFER. Oxford: PERGAMON-ELSEVIER SCIENCE LTD, OXFORD, 1982, vol. 27, No 4, p. 437-444. ISSN 0022-4073.

HUMLÍČEK, Josef. An efficient method for evaluation of the complex probability function: the Voigt function and its derivatives. JOURNAL OF QUANTITATIVE SPECTROSCOPY & RADIATIVE TRANSFER. Oxford: PERGAMON-ELSEVIER SCIENCE LTD, OXFORD, 1978, vol. 21, p. 309-313. ISSN 0022-4073.