Výpis publikací

SCHUMI-MAREČEK, David; Florian BERTRAM; Petr MIKULÍK; Devanshu VARSHNEY; Jiří NOVÁK a Stefan KOWARIK. Millisecond X-ray reflectometry and neural network analysis: unveiling fast processes in spin coating. Journal of Applied Crystallography. International Union of Crystallography, 2024, roč. 57, č. 2, s. 314-323. ISSN 1600-5767. Dostupné z: https://doi.org/10.1107/S1600576724001171.

MIKULÍK, Petr a Mojmír MEDUŇA. Rentgenová radiografie a výpočetní tomografie na malém stolním difraktometru. Materials Structure in Chemistry, Biology, Physics and Technology. Czech Republic: Czech and Slovak Crystallographic Associ, 2024, roč. 30, č. 4, s. 295. ISSN 1211-5894.

MEDUŇA, Mojmír; Ondřej CAHA; Jiří NOVÁK a Petr MIKULÍK. Rtg laboratoře a výzkum na ÚFKL. Materials Structure in Chemistry, Biology, Physics and Technology. Czech Republic: Czech and Slovak Crystallographic Associ, 2023, roč. 29, č. 2, s. 95-97. ISSN 1211-5894.

BARTONIČKA, Tomáš; Zdeněk BOCHNÍČEK; Vítězslav BRYJA; Petr BUREŠ; Magdalena BURGR; Martin CULEK; Miloš ČERNÍK; Martin ČERNOHORSKÝ; Dominik ČERNÝ; Martin ČUTA; Jiří DANIHELKA; Jiří DOŠKAŘ; Zuzana DOŠLÁ; Petr FIRBAS; Eduard FUCHS; Milan GELNAR; Jan GLOSER; Michal HÁJEK; Jan HELEŠIC; Ivan HOLOUBEK; Michal HORSÁK; Petr HROUDA; Dagmar CHYTKOVÁ; Magdaléna CHYTRÁ; Milan CHYTRÝ; Zuzana JAYASUNDERA; Jaroslav JONAS; Mikoláš JURDA; Josef KALAS; Tomáš KAŠPAROVSKÝ; Jana KLÁNOVÁ; Jaroslav KOČA; Alois KOZUBÍK; František KUBÍČEK; Radan KUČERA; Aleš LACINA; Kamil LÁSKA; Jaromír LEICHMANN; Zdeněk LOSOS; Přemysl LUBAL; Jaroslav MALINA; Petr MIKULÍK; Dominik MUNZAR; Rudolf MUSIL; Jana MUSILOVÁ; Marek NEČAS; Miroslav NĚMEC; Milan NOVÁK; Kateřina NOVÁKOVÁ; Stanislav PEKÁR; Milan POTÁČEK; Pavel PROŠEK; Antonín PŘICHYSTAL; Jiřina RELICHOVÁ; Jiří ROSICKÝ; Zdeněk ŘEHÁK; Ivo SEDLÁČEK; Jana SCHENKOVÁ; Jiří SCHLAGHAMERSKÝ; Eduard SCHMIDT; Pavlína SLAVÍKOVÁ; Jan SLOVÁK; Josef STANĚK; Kateřina ŠEBKOVÁ; Vladimír ŠIMEK; Roman ŠIMON HILSCHER; Pavel ŠIŠMA; Taťána ŠKARKOVÁ; Petr ŠPAČEK; Magdalena ŠPOKOVÁ; Vladimír ŠTEFL; Jan ŠVANCARA; Andrea ŠPALEK TÓTHOVÁ; Libuše TRNKOVÁ; David TRUNEC; Martin VÁCHA; Jaromír VAŇHARA; Monika VÍTĚZOVÁ; Michaela WIMMEROVÁ; Světlana ZAHRÁDKOVÁ; Petr ZBOŘIL a Josef ZEMAN. Dějiny psané přírodovědci : Vývoj vědních oborů na Přírodovědecké fakultě Masarykovy univerzity. Online. Edited by Milan Gelnar - Z. Jayasundera. 1., elektronické vyd. Brno: Masarykova univerzita, 2022, 997 s. ISBN 978-80-280-0089-9.

BARTONIČKA, Tomáš; Zdeněk BOCHNÍČEK; Vítězslav BRYJA; Petr BUREŠ; Magdalena BURGR; Martin CULEK; Miloš ČERNÍK; Martin ČERNOHORSKÝ; Dominik ČERNÝ; Martin ČUTA; Jiří DANIHELKA; Jiří DOŠKAŘ; Zuzana DOŠLÁ; Petr FIRBAS; Eduard FUCHS; Milan GELNAR; Jan GLOSER; Michal HÁJEK; Jan HELEŠIC; Ivan HOLOUBEK; Michal HORSÁK; Petr HROUDA; Dagmar CHYTKOVÁ; Magdaléna CHYTRÁ; Milan CHYTRÝ; Zuzana JAYASUNDERA; Jaroslav JONAS; Mikoláš JURDA; Josef KALAS; Tomáš KAŠPAROVSKÝ; Jana KLÁNOVÁ; Jaroslav KOČA; Alois KOZUBÍK; František KUBÍČEK; Radan KUČERA; Aleš LACINA; Kamil LÁSKA; Jaromír LEICHMANN; Zdeněk LOSOS; Přemysl LUBAL; Jaroslav MALINA; Petr MIKULÍK; Dominik MUNZAR; Rudolf MUSIL; Jana MUSILOVÁ; Marek NEČAS; Miroslav NĚMEC; Milan NOVÁK; Kateřina NOVÁKOVÁ; Stanislav PEKÁR; Milan POTÁČEK; Pavel PROŠEK; Antonín PŘICHYSTAL; Jiřina RELICHOVÁ; Jiří ROSICKÝ; Zdeněk ŘEHÁK; Ivo SEDLÁČEK; Jana SCHENKOVÁ; Jiří SCHLAGHAMERSKÝ; Eduard SCHMIDT; Pavlína SLAVÍKOVÁ; Jan SLOVÁK; Josef STANĚK; Kateřina ŠEBKOVÁ; Vladimír ŠIMEK; Roman ŠIMON HILSCHER; Pavel ŠIŠMA; Taťána ŠKARKOVÁ; Petr ŠPAČEK; Magdalena ŠPOKOVÁ; Vladimír ŠTEFL; Jan ŠVANCARA; Andrea ŠPALEK TÓTHOVÁ; Libuše TRNKOVÁ; David TRUNEC; Martin VÁCHA; Jaromír VAŇHARA; Monika VÍTĚZOVÁ; Michaela WIMMEROVÁ; Světlana ZAHRÁDKOVÁ; Petr ZBOŘIL a Josef ZEMAN. Dějiny psané přírodovědci : Vývoj vědních oborů na Přírodovědecké fakultě Masarykovy univerzity. Edited by Milan Gelnar - Z. Jayasundera. 1. vyd. Brno: Masarykova univerzita, 2022, 997 s. ISBN 978-80-280-0088-2.

NADAZDY, Peter; Jakub HAGARA; Petr MIKULÍK; Zdenko ZAPRAZNY; Dusan KORYTAR; Eva MAJKOVA; Matej JERGEL a Peter SIFFALOVIC. A high-throughput assembly of beam-shaping channel-cut monochromators for laboratory high-resolution X-ray distraction and small-angle X-ray scattering experiments. Journal of Applied Crystallography. Chester: International Union of Crystallography, 2021, roč. 54, June, s. 730-738. ISSN 0021-8898. Dostupné z: https://doi.org/10.1107/S1600576721002338.

MIKULÍK, Petr; Ondřej CAHA a Mojmír MEDUŇA. Laboratory and synchrotron rocking curve imaging for crystal lattice misorientation mapping. ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES. ENGLAND: INT UNION CRYSTALLOGRAPHY, 2021, A77, supplement, s. "C837", 1 s. ISSN 2053-2733. Dostupné z: https://doi.org/10.1107/S0108767321088619.

ROZBOŘIL, Jakub; Katharina BROCH; Roland RESEL; Ondřej CAHA; Filip MÜNZ; Petr MIKULÍK; John E. ANTHONY; Henning SIRRINGHAUS a Jiří NOVÁK. Annealing Behavior with Thickness Hindered Nucleation in Small-Molecule Organic Semiconductor Thin Films. CRYSTAL GROWTH & DESIGN. WASHINGTON: AMER CHEMICAL SOC, 2019, roč. 19, č. 7, s. 3777-3784. ISSN 1528-7483. Dostupné z: https://doi.org/10.1021/acs.cgd.9b00213.

NÁDAŽDY, Peter; Jakub HAGARA; Matej JERGEL; Eva MAJKOVÁ; Petr MIKULÍK; Zdenko ZÁPRAŽNÝ; Dusan KORYTÁR a Peter ŠIFFALOVIČ. Exploiting the potential of beam-compressing channel-cut monochromators for laboratory high-resolution small-angle X-ray scattering experiments. Journal of Applied Crystallography. Chester: INT UNION CRYSTALLOGRAPHY, 2019, roč. 52, JUN 2019, s. 498-506. ISSN 0021-8898. Dostupné z: https://doi.org/10.1107/S1600576719003674.

ZÁPRAŽNÝ, Zdenko; Dušan KORYTÁR; Matej JERGEL; Yuriy HALAHOVETS; Igor MAT´KO; Peter ŠIFFALOVIČ; Jozef KEČKÉŠ; Petr MIKULÍK; Eva MAJKOVÁ a Thu Nhi Tran THI. Study of surface quality and subsurface damage of germanium optics produced by single point diamond nanomachining. In Proceedings Volume 11032, EUV and X-ray Optics: Synergy between Laboratory and Space VI. SPIE-INT SOC OPTICAL ENGINEERING, 2019, 11 s. ISBN 978-1-5106-2731-4. Dostupné z: https://doi.org/10.1117/12.2520970.

PRAJZLER, V.; M. NERUDA; P. NEKVINDOVÁ a Petr MIKULÍK. Properties of Multimode Optical Epoxy Polymer Waveguides Deposited on Silicon and TOPAS Substrate. Radioengineering. PRAHA: SPOLECNOST PRO RADIOELEKTRONICKE INZENYRSTVI, 2017, roč. 26, č. 1, s. 10-15. ISSN 1210-2512. Dostupné z: https://doi.org/10.13164/re.2017.0010.

FIALOVÁ, Dana; Eva DROZDOVÁ; Radim SKOUPÝ; Petr MIKULÍK a Bohuslav KLÍMA. Scanning electron microscopy of dental calculus from Great Moravian necropolis Znojmo-Hradiště. Anthropologie. Anthropos Institute, 2017, roč. 55, č. 3, s. 343-351. ISSN 0323-1119.

FARAGÓ, Tomáš; Petr MIKULÍK; A. ERSHOV; M. VOGELGESANG; D. HANSCHKE a T. BAUMBACH. syris: a flexible and efficient framework for X-ray imaging experiments simulation. Journal of Synchrotron Radiation. CHESTER: INT UNION CRYSTALLOGRAPHY, 2017, roč. 24, November, s. 1283-1295. ISSN 1600-5775. Dostupné z: https://doi.org/10.1107/S1600577517012255.

VEGSO, Karol; Matej JERGEL; Peter SIFFALOVIC; Eva MAJKOVA; Dusan KORYTAR; Zdenko ZAPRAZNY; Petr MIKULÍK a Patrik VAGOVIC. Towards high-flux X-ray beam compressing channel-cut monochromators. Journal of Applied Crystallography. Chester: INT UNION CRYSTALLOGRAPHY, 2016, roč. 49, December, s. 1885-1892. ISSN 1600-5767. Dostupné z: https://doi.org/10.1107/S1600576716013376.

ZÁPRAŽNÝ, Z.; D. KORYTÁR; M. JERGEL; P. ŠIFFALOVIČ; E. DOBROČKA; P. VAGOVIČ; C. FERRARI; Petr MIKULÍK; M. DEMYDENKO a M. MIKLOŠKA. Calculations and surface quality measurements of high-asymmetry angle x-ray crystal monochromators for advanced x-ray imaging and metrological applications. Optical Engineering. 2015, roč. 54, č. 3, s. "035101-1"-"035101-12", 12 s. ISSN 0091-3286. Dostupné z: https://doi.org/10.1117/1.OE.54.3.035101.

LI, Z.J.; A.N. DANILEWSKY; L. HELFEN; Petr MIKULÍK; D. HAENSCHKE; J. WITTGE; D. ALLEN; P. MCNALLY a T. BAUMBACH. Local strain and defects in silicon wafers due to nanoindentation revealed by full-field X-ray microdiffraction imaging. Journal of Synchrotron Radiation. USA: WILEY-BLACKWELL PUBLISHING, 2015, roč. 22, July, s. 1083-1090. ISSN 0909-0495. Dostupné z: https://doi.org/10.1107/S1600577515009650.

FIALOVÁ, Dana; Eva DROZDOVÁ; Radim SKOUPÝ a Petr MIKULÍK. Scanning electron microscopy (SEM) analysis of ancient human dental calculus treated by chemical conservation. In 16th Annual Conference of the British Association for Biological Anthropology and Osteoarchaeology. 2014.

ZÁPRAŽNÝ, Z.; D. KORYTÁR; P. ŠIFFALOVIČ; M. JERGEL; M. DEMYDENKO; Petr MIKULÍK; E. DOBROČKA; C. FERRARI; P. VAGOVIČ a M. MIKLOŠKA. Simulations and surface quality testing of high asymmetry angle X-ray crystal monochromators for advanced X-ay imaging applications. In C. Morawe, A. Khounsary, and S. Goto. Advances in X-Ray/EUV Optics and Components IX. 9207. vyd. USA: SPIE-INT SOC OPTICAL ENGINEERING, 2014, s. "nestránkováno", 14 s. ISBN 978-1-62841-234-5. Dostupné z: https://doi.org/10.1117/12.2061353.

BARRIER, E.; F.M.B. FERNANDES; M. BUJAN; M.C. FEITERS; A. FROIDEVAL; J. GHIJSEN; T. HASE; M.A. HOUGH; M. JERGEL; I. JIMENEZ; T. KAJANDER; A. KIKAS; M. KOKKINIDIS; L. KOVER; H.B. LARSEN; D.M. LAWSON; K. LAWNICZAK-JABLONSKA; C. MARIANI; Petr MIKULÍK; J. MONNIER; S. MORERA; C. MCGUINNESS; P. MULLER-BUSCHBAUM; M.M. NIELSON; U. PIETSCH; M. TROMP; M. SIMON; J. STANGL a G. ZANOTTI. The benefit of the European User Community from transnational access to national radiation facilities. Journal of Synchrotron Radiation. Hoboken, USA: WILEY-BLACKWELL PUBLISHING, 2014, roč. 21, MAY, s. 638-639. ISSN 0909-0495. Dostupné z: https://doi.org/10.1107/S1600577514007619.

CAHA, Ondřej; Dušan HEMZAL; Jiří CHALOUPKA; Petr MIKULÍK a Filip MÜNZ. Fyzikální praktikum 2. Brno: Masarykova univerzita, 2013, 115 s.

KORYTÁR, D.; P. VAGOVIČ; K. VÉGSÖ; P. ŠIFFALOVIČ; E. DOBROČKA; W. JARK; V. ÁČ; Z. ZÁPRAŽNÝ; C. FERRARI; A. CECILIA; E. HAMANN; Petr MIKULÍK; T. BAUMBACH; M. FIEDERLE a M. JERGEL. Potential use of V-channel Ge(220) monochromators in X-ray metrology and imaging. Journal of Applied Crystallography. Hoboken: WILEY-BLACKWELL, 2013, roč. 46, č. 4, s. 945-952. ISSN 0021-8898. Dostupné z: https://doi.org/10.1107/S0021889813006122.

KORYTÁR, D.; P. VAGOVIČ; C. FERRARI; P. ŠIFFALOVIČ; M. JERGEL; E. DOBROČKA; Z. ZÁPRAŽNÝ; V. ÁČ a Petr MIKULÍK. Process-induced inhomogeneities in higher asymmetry angle X-ray monochromators. In A. Khounsary, S. Goto, and C. Morawe. Advances in X-Ray/EUV Optics and Components VIII. 8848. vyd. USA: SPIE-INT SOC OPTICAL ENGINEERING, 2013, s. "88480U-1-88480U-8", 8 s. ISBN 978-0-8194-9698-0. Dostupné z: https://doi.org/10.1117/12.2025142.

ZÁPRAŽNÝ, Z.; D. KORYTÁR; Petr MIKULÍK a V. ÁČ. Processing of projections containing phase contrast in laboratory micro-computerized tomography imaging. Journal of Applied Crystallography. Hoboken: WILEY-BLACKWELL, 2013, roč. 46, Aug, s. 933-938. ISSN 0021-8898. Dostupné z: https://doi.org/10.1107/S002188981300558X.

FIALOVÁ, Dana; Eva DROZDOVÁ; Radim SKOUPÝ; Petr MIKULÍK a Bohuslav KLÍMA. Výzkum složení zubního kamene u staroslovanských populací. In Přednáška brněnské pobočky České společnosti antropologické. 2013.

FIALOVÁ, Dana; Eva DROZDOVÁ; Radim SKOUPÝ; Petr MIKULÍK a Bohuslav KLÍMA. Zubní kámen jako důležitý bioarcheologický materiál. In Workshop Metody antropologie ARCHEOLOGICKÉ CENTRUM OLOMOUC, p.o. 2013.

OBERTA, P.; J. HRDÝ a Petr MIKULÍK. A proof-of-principle experiment of a novel harmonics separation optics for synchrotron facilities. Journal of Synchrotron Radiation. Hoboken, USA: WILEY-BLACKWELL PUBLISHING, 2012, roč. 19, č. 6, s. 1012-1014. ISSN 0909-0495. Dostupné z: https://doi.org/10.1107/S0909049512036618.

FIALOVÁ, Dana; Eva DROZDOVÁ; Radim SKOUPÝ; Petr MIKULÍK a Bohuslav KLÍMA. Oral bacterial flora studied in old Slavonic populations from 9th century using analysis of dental calculus. In 18th Congress of The European Anthropological Association. Human Evolution and Dispersals. 2012.

HRDÝ, J.; Petr MIKULÍK a P. OBERTA. Diffractive-refractive optics: (+,-,-,+) X-ray crystal monochromator with harmonics separation. Journal of Synchrotron Radiation. 2011, roč. 18, č. 1, s. 299-301. ISSN 0909-0495. Dostupné z: https://doi.org/10.1107/S0909049510049204.

VAGOVIČ, P.; D. KORYTÁR; Petr MIKULÍK; A. CECILIA; C. FERRARI; Y. YANG; D. HANSCHKE; E. HAMANN; D. PELLICCIA; T.A. LAFFORD; M. FIEDERLE a T. BAUMBACH. In-line Bragg magnifier based on V-shaped germanium crystals. Journal of Synchrotron Radiation. 2011, roč. 18, č. 1, s. 753-760. ISSN 0909-0495. Dostupné z: https://doi.org/10.1107/S090904951102989X.

HELFEN, L.; A. MYAGOTIN; Petr MIKULÍK; P. PERNOT; A. VOROPAEV; M. ELYYAN; M. DI MICHIEL; J. BARUCHEL a T. BAUMBACH. On the implementation of computed laminography using synchrotron radiation. Review of Scientific Instruments. Melville (USA): American Institute of Physics, 2011, roč. 82, č. 1, s. "nestrankovano", 8 s. ISSN 0034-6748.

OBERTA, P.; Petr MIKULÍK; M. KITTLER a J. HRDÝ. X-ray collimation by crystals with precise parabolic holes based on diffractive-refractive optics. Journal of Synchrotron Radiation. 2011, roč. 18, č. 1, s. 522-526. ISSN 0909-0495. Dostupné z: https://doi.org/10.1107/S0909049511009083.

FERRARI, C.; F. GERMINI; D. KORYTÁR; Petr MIKULÍK a L. PEVERINI. X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions. Journal of Applied Crystallography. 2011, roč. 44, č. 44, s. 353-358. ISSN 0021-8898. Dostupné z: https://doi.org/10.1107/S0021889811001439.

OBERTA, P.; Petr MIKULÍK; M. KITTLER; J. HRDÝ a L. PEVERINI. Diffractive-refractive optics: low-aberration Bragg-case focusing by precise parabolic surfaces. Journal of Synchrotron Radiation. 2010, roč. 17, č. 1, s. 36-40. ISSN 0909-0495.

OBERTA, P.; Petr MIKULÍK; J. HRDÝ a M. KITTLER. Highly asymmetric Laue focusing monochromator. In SRI 2009: The 10th international conference on synchrotron radiation instrumentation: AIP Conference Proceedings. New York: American Institute of Physics, 2010, s. 724–727. ISBN 978-0-7354-0782-4.

KORYTÁR, D.; C. FERRARI; Petr MIKULÍK; P. VAGOVIČ; E. DOBROČKA; V. ÁČ; P. KONOPKA; A. ERKO a N. ABROSIMOV. Linearly graded GeSi beam-expanding/compressing X-ray monochromator. Journal of Applied Crystallography. 2010, roč. 2010, č. 43, s. 176-178. ISSN 0021-8898.

ČECH, V.; S. LICHOVNÍKOVÁ; R. TRIVEDI; V. PEŘINA; J. ZEMEK; Petr MIKULÍK a Ondřej CAHA. Plasma polymer films of tetravinylsilane modified by UV irradiation. Surface and Coatings Technology. 2010, roč. 205, č. 1, s. S177–S181, 5 s. ISSN 0257-8972.

HOVORKA, Miloš; Filip MIKA; Petr MIKULÍK a Luděk FRANK. Profiling N-Type Dopants in Silicon. Materials Transactions. 2010, roč. 51, č. 2, s. 237-242. ISSN 1345-9678.

CAHA, Ondřej; Mojmír MEDUŇA; Silvie BERNATOVÁ; Jiří RŮŽIČKA; Petr MIKULÍK; Jiří BURŠÍK; Milan SVOBODA a S. BERNSTORFF. X-ray scattering study of oxide precipitates in Cz-Si. 2010. ISBN 978-80-254-7361-0.

KORYTÁR, D.; C. FERRARI; Petr MIKULÍK; E. DOBROČKA; V. ÁČ; P. KONOPKA;; A. ERKO; N. ABROSIMOV a Z. ZÁPRAŽNÝ. 1D X-ray Beam Compressing Monochromators. In 20th International Congress on X-Ray Optics and Microanalysis: AIP Conference Proceedings. New York: American Institute of Physics, 2010, s. 59-62. ISBN 978-0-7354-0764-0.

HUBER, I.; Petr MIKULÍK a T. BAUMBACH. Correctness of a particular solution of inverse problem in rocking curve imaging. physica status solidi (a). Wiley, 2009, roč. 208, č. 8, s. 1860-1864. ISSN 1862-6300.

NEČAS, David; Lenka ZAJÍČKOVÁ; Daniel FRANTA; Pavel SŤAHEL; Petr MIKULÍK; Mojmír MEDUŇA a Miroslav VALTR. Optical Characterization of Ultra-Thin Iron and Iron Oxide Films. e-Journal of Surface Science and Nanotechnology. Tokyo: The Surface Science Society of Japan, 2009, roč. 7, březen, s. 486-490. ISSN 1348-0391.

MIKULÍK, Petr; Zuzana POKORNÁ; Bohdan RŮŽIČKA a Stanislav KOZUBEK. Projekt Středoevropské synchrotronové laboratoře - CESLAB. Československý časopis pro fyziku. Praha: Fyzikální ústav AV ČR, 2009, roč. 58, č. 5, 9 s. ISSN 0009-0700.

BAUMBACH, Tilo a Petr MIKULÍK. X-Ray Reflectivity by Rough Multilayers. In X-Ray and Neutron Reflectivity: Principles and Applications. Berlin: Springer, 2009, s. 235-288. Lecture Notes in Physics: 770. ISBN 978-3-540-88587-0.

KULHA, P.; A. BOURA; M. HUSÁK; Petr MIKULÍK; Milan KUČERA a Stanislav VALENDA. Design and Fabrication of High-Temperature SOI Strain-Gauges. In 7th International Conference on Advanced Semiconductor Devices and Microsystems. New York: IEEE, 2008, s. 175-178. ISBN 978-1-4244-2325-5.

HOLÝ, Václav; T. BAUMBACH; D. LÜBBERT; L. HELFEN; M. ELLYAN; Petr MIKULÍK; S. KELLER; S.P. DENBAARS a J. SPECK. Diffuse x-ray scattering from statistically inhomogeneous distributions of threading dislocations beyond the ergodic hypothesis. Physical Review B. USA: The American Physical Society, 2008, roč. 77, č. 1, s. 094102-94110. ISSN 1098-0121.

KORYTÁR, D.; C. FERRARI; Petr MIKULÍK; F. GERMINI; P. VAGOVIČ a T. BAUMBACH. High Resolution 1D and 2D Crystal Optics Based on Asymmetric Diffractors. In Modern Developments in X-Ray and Neutron Optics. Berlin: Springer, 2008, s. 501-512. Springer Series in Optical Sciences 137. ISBN 978-3-540-74560-0.

LÜBBERT, D.; T. BAUMBACH; Václav HOLÝ; Petr MIKULÍK; L. HELFEN; P. PERNOT; M. ELLYAN; S. KELLER; T.M. KATONA; S.P. DENBAARS a J. SPECK. Microdiffraction imaging of dislocation densities in microstructured samples. Europhysics Letters. Paríž: European Physical Society, 2008, roč. 82, č. 5, s. 56002-56006. ISSN 0295-5075.

ÁČ, V.; P. PERICHTA; D. KORYTÁR a Petr MIKULÍK. Thermal effects under synchrotron radiation power absorption. In Modern Developments in X-Ray and Neutron Optics. Berlín: Springer, 2008, s. 513-524. Springer Series in Optical Sciences 137. ISBN 978-3-540-74560-0.

MIKULÍK, Petr. Central European Synchrotron Laboratory (CESLAB): Conceptual Design and the Proposed Beamlines. Brno: Synchrotron Facilities for the Development of Science and Technology in Central and Eastern Europe, 2007. international conference.

KUBĚNA, Josef; Alan KUBĚNA; Ondřej CAHA a Petr MIKULÍK. Development of oxide precipitates in silicon: calculation of the distribution function of the classical theory of nucleation by a nodal-points approximation. J. Phys. Condens. Matter. IOP Publishing Ltd, 2007, roč. 19, č. 49, s. 496202-496212. ISSN 0953-8984.

MIKULÍK, Petr. Laboratoř polovodičů - čisté prostory pro křemíkovou technologii na MU. Tatranská Štrba (Slovensko): DMS-RE, 2007. international workshop.

VAGOVIČ, P.; D. KORYTÁR; Petr MIKULÍK a C. FERRARI. On the design of a monolithic 4-bounce high resolution X-ray monochromator. Nuclear Instruments and Methods in Physics Research Section B. ELSEVIER (NORTH-HOLLAND), 2007, roč. 265, č. 2, s. 599-604. ISSN 0168-583X.

HELFEN, L.; A. MYAGOTIN; A. RACK; P. PERNOT; Petr MIKULÍK; M. DIMICHIEL a T. BAUMBACH. Synchrotron-radiation computed laminography for high-resolution three-dimensional imaging of flat devices. Physica stat.sol.(a). 2007, roč. 204, č. 8, s. 2760-2765. ISSN 0031-8965.

MIKULÍK, Petr. X-ray reflectometry and diffuse scattering. 2007. vyd. Smolenice (Slovensko): 7th Autumn School on X-ray scattering from surfaces and thin layers, 2007. international workshop.

MIKULÍK, Petr; D. LÜBBERT; P. PERNOT; L. HELFEN a T. BAUMBACH. Crystallite misorientation analysis in semiconductor wafers and ELO samples by rocking curve imaging. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2006, roč. 253, č. 1, s. 188-193. ISSN 0169-4332.

HELFEN, L.; A. MYAGOTIN; P. PERNOT; M. DIMICHIEL; Petr MIKULÍK; A. BERTHOLD a T. BAUMBACH. Investigation of hybrid pixel detector arrays by synchrotron-radiation imaging. Nuclear Instruments & Methods in Physics Research A. 2006, roč. 563, č. 1, s. 163-166. ISSN 0168-9002.

HELFEN, L.; T. BAUMBACH; D. KIEL; P. PERNOT; Petr MIKULÍK; P. CLOETENS a J. BARUCHEL. Three-dimensional Imaging by Synchrotron Radiation Computed Laminography. ESRF Highlights 2005. Francie: ESRF, 2006, roč. 2006, č. 1, s. 107-108.

LÜBBERT, D.; Petr MIKULÍK; P. PERNOT; L. HELFEN; M.D. CRAVEN; S. KELLER; S. DENBAARS a T. BAUMBACH. X-ray microdiffraction imaging investigations of wing tilt in epitaxially overgrown GaN. Physica stat.sol.(a). 2006, roč. 203, č. 7, s. 1733-1738. ISSN 0031-8965.

HRDÝ, J.; Alan KUBĚNA a Petr MIKULÍK. Aberrations of diffractive-refractive optics: Bragg-case sagittal focusing of multiple parabolic elements. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2005, roč. 38, č. 24, s. 4325-4328. ISSN 0022-3727.

LÜBBERT, D.; C. FERRARI; Petr MIKULÍK; P. PERNOT; L. HELFEN; N. VERDI; D. KORYTÁR a T. BAUMBACH. Distribution and Burgers vectors of dislocations in semiconductor wafers investigated by rocking-curve imaging. J. Appl. Crystallography. Velká Britanie: Int. Union of Crystallography, 2005, roč. 38, č. 1, s. 91-96. ISSN 0021-8898.

HELFEN, L.; T. BAUMBACH; Petr MIKULÍK; D. KIEL; P. PERNOT; P. CLOETENS a J. BARUCHEL. High-resolution three-dimensional imaging of flat objects by synchrotron-radiation computed laminography. Applied Physics Letters. USA: American Institute of Physics, 2005, roč. 86, č. 1, s. 071915-1, 3 s. ISSN 0003-6951.

LÜBBERT, D.; T. BAUMBACH; Petr MIKULÍK; P. PERNOT; L. HELFEN; R. KÖHLER; T.M. KATONA; S. KELLER; T.M. KATONA a S.P. DENBAARS. Local wing tilt analysis of laterally overgrown GaN by x-ray rocking curve imaging. Journal of physics D: Applied physics. Bristol, England: IOP Publishing Ltd., 2005, roč. 38, 10A, s. A50-A5, 5 s. ISSN 0022-3727.

KORYTÁR, D.; T. BAUMBACH; C. FERRARI; L. HELFEN; N. VERDI; Petr MIKULÍK; Alan KUBĚNA a P. VAGOVIČ. Monolithic two-dimensional beam compressor for hard x-ray beams. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2005, roč. 38, č. 1, s. A208-A212, 5 s. ISSN 0022-3727.

CAHA, Ondřej; Petr MIKULÍK; Jiří NOVÁK; Václav HOLÝ; Simon C. MOSS a Andrew NORMAN. Spontaneous lateral modulation in short-period superlattices investigated by grazing-incidence X-ray diffraction. Physical Review B. USA: American Physical Society, 2005, roč. 72, č. 3, s. 035313-35322. ISSN 1098-0121.

HELFEN, L.; F. DEHN; Petr MIKULÍK a T. BAUMBACH. Three-dimensional imaging of cement microstructure evolution during hydration Three-dimensional imaging of cement microstructure evolution during hydration. Advances in Cement Research. London, 2005, roč. 17, č. 3, s. 103-111. ISSN 0951-7197.

KÖHLER, B.; J. SCHREIBER; B. BENDJUS; M. HERMS; V. MELOV; L. HELFEN; Petr MIKULÍK a T. BAUMBACH. Micro- and nano-NDE in the laboratory for acoustic diagnosis and quality assurance. Proceedings of SPIE: Testing, Reliability, and Application of Micro- and Nano-Material Systems II. USA: SPIE, 2004, roč. 5392, č. 1, s. 63-77. ISSN 0-8194-5309-9.

MIKULÍK, Petr. Project of a clean room laboratory for silicon device technology at the Masaryk University. In Proceedings of International Conference Silicon-2004. Rožnov pod Radhoštěm: Karel Vojtěchovský, 2004, s. 54-55.

BAUMBACH, T.; L. HELFEN; Petr MIKULÍK a F. DEHN. Synchrotron-radiation X-ray tomography: a method for 3D imaging of cement microstructure and its evolution during hydration. In Proceedings of XIV. International Symposium SANACE 2004. Brno: Sdružení pro sanace betonových konstrukcí, 2004, s. 71-80. ISSN 1211-3700.

FERRARI, C.; N. VERDI; D. LÜBBERT; D. KORYTÁR; Petr MIKULÍK; T. BAUMBACH; L. HELFEN a P. PERNOT. Determination of lattice plane curvature and dislocation Burgers vector density in crystals by rocking curve imaging technique. Proceedings of SPIE: Crystals, Multilayers, and Other Synchrotron Optics. USA: SPIE, 2003, roč. 5195, č. 1, s. 84-93. ISSN 0-8194-5068-5.

MIKULÍK, Petr; D. LÜBBERT; D. KORYTÁR; P. PERNOT a T. BAUMBACH. Synchrotron area diffractometry as a tool for spatial high-resolution three-dimensional lattice misorientation mapping. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2003, roč. 36, č. 1, s. A74-A78, 5 s. ISSN 0022-3727.

KORYTÁR, D.; Petr MIKULÍK; C. FERRARI; J. HRDÝ; T. BAUMBACH; A. FREUND a Alan KUBĚNA. Two-dimensional x-ray magnification based on a monolithic beam conditioner. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2003, roč. 36, č. 1, s. A65-A68, 4 s. ISSN 0022-3727.

MIKULÍK, Petr; T. BAUMBACH; D. KORYTÁR; P. PERNOT; D. LÜBBERT; L. HELFEN a Ch. LANDESBERGER. Advanced X-ray diffraction imaging techniques for semiconductor wafer characterisation. Materials Structure. Praha: The Czech and Slovak Cryst. Assoc., 2002, roč. 9, č. 2, s. 87-88. ISSN 1211-5894.

KAGANER, V.M.; B. JENICHEN; G. PARIS; K.H. PLOOG; O. KONOVALOV; Petr MIKULÍK a S. ARAI. Strain in buried quantum wires: Analytical calculations and x-ray diffraction study. Phys. Rev. B. USA: The American Phys. Society, 2002, roč. 2002, č. 66, s. 035310-35316. ISSN 0163-1829.

MIKULÍK, Petr; M. JERGEL; T. BAUMBACH; E. MAJKOVÁ; E. PINČÍK; Š. LUBY; L. ORTEGA; R. TUCOULOU; P. HUDEK a I. KOSTIČ. Coplanar and non-coplanar x-ray reflectivity characterization of lateral W/Si multilayer gratings. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2001, roč. 34, 10A, s. A188, 5 s. ISSN 0022-3727.

ULYANENKOV, A.; K. INABA; Petr MIKULÍK; N. DAROWSKI; K. OMOTE; J. GRENZER a A. FORCHEL. X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2001, roč. 34, 10A, s. A179, 4 s. ISSN 0022-3727.

JERGEL, M.; C. FALCONY; Petr MIKULÍK; L. ORTEGA; E. MAJKOVÁ; E. PINČÍK; Š. LUBY; I. KOSTIČ a P. HUDEK. X-ray reflectivity study of a W/Si multilayer grating. Superficies y Vacío. Mexico: Sociedad Mexicana de Ciencia de Superfic, 2001, roč. 2001, č. 13, s. 10-14. ISSN 1665-3521.

JERGEL, M.; Petr MIKULÍK; E. MAJKOVÁ; E. PINČÍK; Š. LUBY; M. BRUNEL; P. HUDEK a I. KOSTIČ. Multilayer gratings for X-UV optics. Acta physica slovaca. Bratislava: Institute of Physics, SAS, 2000, roč. 50, č. 4, s. 427-864. ISSN 0323-0465.

SPRINGHOLZ, G.; J. STANGL; M. PINCZOLITS; Václav HOLÝ; Petr MIKULÍK; P. MAYER; K. WIESAUER; G. BAUER; D. SMILGIES; H.H. KANG a L. SALAMANCA-RIBA. Nearly perfect 3D ordering in IV-VI quantum dot superlattices with ABCABC... vertical stacking sequence. Physica E. Amsterdam, 2000, roč. 2000, č. 7, s. 870-875. ISSN 1386-9477.

STANGL, J.; Václav HOLÝ; A.A. DARHUBER; Petr MIKULÍK; G. BAUER; J. ZHU; K. BRUNNER a G. ABSTREITER. High-resolution x-ray diffraction on self-organized step bunches of Si_1-xGe_x grown on (113)-oriented Si. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing LTd, 1999, roč. 32, č. 9999, s. A71, 4 s. ISSN 0022-3727.

STANGL, J.; Václav HOLÝ; Petr MIKULÍK; G. BAUER; I. KEGEL; T.H. METZGER; O.G. SCHMIDT; C. LANGE a K. EBERL. Self-assembled carbon-induced germanium quantum dots studied by grazing-incidence small-angle x-ray scattering. Applied Physics Letters. USA: American Institute of Physics, 1999, roč. 74, -, s. 3785-3787. ISSN 0003-6951.

ZHUANG, Y.; Václav HOLÝ; J. STANGL; A.A. DARHUBER; Petr MIKULÍK; S. ZERLAUTH; F. SCHÄFFLER; G. BAUER; N. DAROWSKI; D. LÜBBERT a U. PIETSCH. Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high resolution x-ray diffraction and grazing incidence diffraction. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 1999, roč. 32, č. 9999, s. A224, 6 s. ISSN 0022-3727.

JERGEL, M.; Petr MIKULÍK; E. MAJKOVÁ; Š. LUBY; R. SENDERÁK; E. PINČÍK; M. BRUNEL; P. HUDEK; I. KOSTIČ a A. KONEČNÍKOVÁ. Structural characterization of a lamellar W/Si multilayer grating. J. Appl. Phys. USA: American Institute of Physics, 1999, roč. 85, č. 2, s. 1225-1227. ISSN 0021-8979.

JERGEL, M.; Petr MIKULÍK; E. MAJKOVÁ; Š. LUBY; R. SENDERÁK; E. PINČÍK; M. BRUNEL; I. KOSTIČ a A. KONEČNÍKOVÁ. Structural characterization of lamellar multilayer gratings by X-ray reflectivity and scanning electron microscopy. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 1999, roč. 32, č. 9999, s. A220, 4 s. ISSN 0022-3727.

LITZMAN, Otto a Petr MIKULÍK. The crystal truncation rod scattering of neutrons and the multiwave dynamical theory of diffraction. J. Phys. Condens. Matter. IOP Publishing Ltd, 1999, roč. 11, č. 30, s. 5767-5779. ISSN 0953-8984.

LITZMAN, Otto a Petr MIKULÍK. The crystal truncation rod scattering of neutrons and the multiwave dynamical theory of diffraction. J.Phys.: Condens. Matter. Velká Britanie: IOP Publishing Ltd, 1999, roč. 11, č. 9999, s. 5767-5779. ISSN 0953-8984.

ZHUANG, Y.; J. STANGL; A.A. DARHUBER; G. BAUER; Petr MIKULÍK; Václav HOLÝ; N, DAROWSKI a U. PIETSCH. X-ray diffraction from quantum wires and quantum dots. Journal of Materials Science: Materials in Electronics. Great Britain: Kluwer Academic Publishers, 1999, (10)1999, -, s. 215-221. ISSN 0957-4522.

MIKULÍK, Petr a T. BAUMBACH. X-ray reflection by rough multilayer gratings: Dynamical and kinematical scattering. Phys. Rev. B. USA: The American Phys. Society, 1999, roč. 59, č. 11, s. 7632-7643. ISSN 0163-1829.

BAUMBACH, Tilo a Petr MIKULÍK. X-Ray Reflectivity by Rough Multilayers. In X-Ray and Neutron Reflectivity: Principles and Applications. Berlin: Springer, 1999, s. 232-280. Lecture Notes in Physics: 58. ISSN 0940-7677.

DARHUBER, A.A.; Václav HOLÝ; J. STANGL; Petr MIKULÍK; K. BRUNNER; G. ABSTREITER a G. BAUER. Highly regular self-organization of step bunches during growth of SiGe on Si(113). Appl. Phys. Lett. USA: Institute of Physics, 1998, roč. 73(1998), -, s. 1535-1537. ISSN 0003-6951.

MIKULÍK, Petr a Tilo BAUMBACH. X-ray reflection by multilayer surface gratings. Physica B condensed matter. Amsterdam, 1998, roč. 248, č. 9999, s. 381-386. ISSN 0921-4526.

MIKULÍK, Petr. X-ray reflectivity from planar and structured multilayers : Réflectivité des rayons X par des milticouches planaires et structurées (Souběž.) : Rentgenová reflektivita rovinných a strukturovaných multivrstev (Souběž.). 1997, 151 s.

DUB, Petr; Otto LITZMAN a Petr MIKULÍK. Dynamical theory of diffraction of particles: Ewald approach. I. In Dynamical theory of diffraction of particles: Ewald approach. Brno: Masarykova univerzita Brno, 1996, s. 5-38. physics, 24-26. ISBN 80-210-1482-2.

DUB, Petr; Otto LITZMAN a Petr MIKULÍK. Dynamical theory of diffraction of particles: Ewald's approach. I. Scripta Fac. Sci. Nat. Univ. Purk. Brun. 1996, roč. 1996, č. 26, s. 5-38. ISSN 8021009640.

LITZMAN, Otto; Petr MIKULÍK a Petr DUB. Multiple diffraction of particles by a system of point scatterers as an exactly soluble problem using the Ewald concept. J.Phys: Conds Matter. 1996, roč. 8, č. 1, s. 4709. ISSN 0953-8984.

LITZMAN, Otto; Petr MIKULÍK a Petr DUB. Multiple diffraction of particles by a system of point scatterers as an exactly soluble problem using the Ewald concept. J.Phys.: Condens. Matter. Velká Britanie: IOP Publishing Ltd, 1996, roč. 8, č. 9999, s. 4709-4725. ISSN 0953-8984.

HOLÝ, Václav a Petr MIKULÍK. Theoretical description of multiple crystal arrangements. In X-ray and neutron dynamical diffraction: theory and applications. New York: Plenum Press, 1996, s. 259-268. ISBN 0-306-45501-3.

ROBAUT, F.; Petr MIKULÍK; N. CHERIEF; O.F.K. MC GRATH; D. GIVORD; T. BAUMBACH a J.Y. VEUILLEN. Epitaxial growth and characterization of Y₂Co₁₇(0001) thin films deposited on W(110). J. Appl. Phys. USA: American Institute of Physics, 1995, roč. 78, s. 997-1003. ISSN 0021-8979.

MIKULÍK, Petr. Scattering on aperiodic superlattices. In Beyond Quasicrystals. Les Ulis: Les Editions de Physique, 1995, s. 229-247. ISBN 3540592512.

MIKULÍK, Petr; Václav HOLÝ a Josef KUBĚNA. X-ray diffraction on Fibonacci superlattices. Acta Crystallographica A. 1995, roč. 51, č. 9999, s. 825-830.