Masarykova univerzita

Výpis publikací

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Filtrování publikací

    2021

  1. Constitutive equations describing optical activity in theory of dispersion
    FRANTA, Daniel a Jiří VOHÁNKA. Constitutive equations describing optical activity in theory of dispersion. Journal of the Optical Society of America B. Optical Society of America, 2021, roč. 38, č. 2, s. 553-561. ISSN 0740-3224. doi:10.1364/JOSAB.410315.
    Podrobněji: https://is.muni.cz/publication/1765638/cs
  2. Wide spectral range optical characterization of yttrium aluminum garnet (YAG) single crystal by the universal dispersion model
    FRANTA, Daniel a Mihai-George MURESAN. Wide spectral range optical characterization of yttrium aluminum garnet (YAG) single crystal by the universal dispersion model. Optical Materials Express. Optica Publishing Group, 2021, roč. 11, č. 12, s. 3930-3945. ISSN 2159-3930. doi:10.1364/OME.441088.
    Podrobněji: https://is.muni.cz/publication/1812943/cs

    3. 2020

  3. Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry
    VOHÁNKA, Jiří, Štěpán ŠUSTEK, Vilma BURŠÍKOVÁ, Veronika ŠKLÍBOVÁ, Václav ŠULC, Vojtěch HOMOLA, Daniel FRANTA, Martin ČERMÁK, Miloslav OHLÍDAL a Ivan OHLÍDAL. Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry. Applied Surface Science. Elsevier Science, 2020, roč. 534, December 2020, s. 1-10. ISSN 0169-4332. doi:10.1016/j.apsusc.2020.147625.
    Podrobněji: https://is.muni.cz/publication/1692072/cs
  4. Ellipsometric characterization of highly non-uniform thin films with the shape of thickness non-uniformity modeled by polynomials
    VOHÁNKA, Jiří, Daniel FRANTA, Martin ČERMÁK, Vojtěch HOMOLA, Vilma BURŠÍKOVÁ a Ivan OHLÍDAL. Ellipsometric characterization of highly non-uniform thin films with the shape of thickness non-uniformity modeled by polynomials. Optics Express. Washington, D.C.: Optical Society of America, 2020, roč. 28, č. 4, s. 5492-5506. ISSN 1094-4087. doi:10.1364/OE.380657.
    Podrobněji: https://is.muni.cz/publication/1692056/cs
  5. Optical quantities of a multilayer system with randomly rough boundaries and uniaxial anisotropic media calculated using the Rayleigh-Rice theory and Yeh matrix formalism
    ČERMÁK, Martin, Jiří VOHÁNKA, Daniel FRANTA a Ivan OHLÍDAL. Optical quantities of a multilayer system with randomly rough boundaries and uniaxial anisotropic media calculated using the Rayleigh-Rice theory and Yeh matrix formalism. Physica Scripta. Royal Swedish Academy of Sciences, 2020, roč. 95, č. 9, s. 095503-95521. ISSN 0031-8949. doi:10.1088/1402-4896/aba77b.
    Podrobněji: https://is.muni.cz/publication/1692016/cs
  6. Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers
    OHLÍDAL, Ivan, Jiří VOHÁNKA, Vilma BURŠÍKOVÁ, Daniel FRANTA a Martin ČERMÁK. Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers. Optics Express. Washington, D.C.: OPTICAL SOC AMER, 2020, roč. 28, č. 1, s. 160-174. ISSN 1094-4087. doi:10.1364/OE.28.000160.
    Podrobněji: https://is.muni.cz/publication/1598881/cs
  7. Symmetry of linear dielectric response tensors: Dispersion models fulfilling three fundamental conditions
    FRANTA, Daniel. Symmetry of linear dielectric response tensors: Dispersion models fulfilling three fundamental conditions. Journal of applied physics. Melville: American Institute of Physics, 2020, roč. 127, č. 22, s. 1-17. ISSN 0021-8979. doi:10.1063/5.0005735.
    Podrobněji: https://is.muni.cz/publication/1686030/cs

    8. 2019

  8. Approximate methods for the optical characterization of inhomogeneous thin films: Applications to silicon nitride films
    OHLÍDAL, Ivan, Jiří VOHÁNKA, Daniel FRANTA, Martin ČERMÁK, Jaroslav ŽENÍŠEK a Petr VAŠINA. Approximate methods for the optical characterization of inhomogeneous thin films: Applications to silicon nitride films. Journal of Electrical Engineering. Slovenská technická univezita v Bratislavě, 2019, roč. 70, č. 7, s. 16-26. ISSN 1335-3632. doi:10.2478/jee-2019-0037.
    Podrobněji: https://is.muni.cz/publication/1577436/cs
  9. Approximations of reflection and transmission coefficients of inhomogeneous thin films based on multiple-beam interference model
    OHLÍDAL, Ivan, Jiří VOHÁNKA, Jan MISTRÍK, Martin ČERMÁK, František VIŽĎA a Daniel FRANTA. Approximations of reflection and transmission coefficients of inhomogeneous thin films based on multiple-beam interference model. Thin Solid Films. Elsevier, 2019, roč. 692, 31 December 2019, s. 1-17. ISSN 0040-6090. doi:10.1016/j.tsf.2019.03.001.
    Podrobněji: https://is.muni.cz/publication/1598679/cs
  10. Combination of spectroscopic ellipsometry and spectroscopic reflectometry with including light scattering in the optical characterization of randomly rough silicon surfaces covered by native oxide layers
    OHLÍDAL, Ivan, Jiří VOHÁNKA, Martin ČERMÁK a Daniel FRANTA. Combination of spectroscopic ellipsometry and spectroscopic reflectometry with including light scattering in the optical characterization of randomly rough silicon surfaces covered by native oxide layers. Surface Topography: Metrology and Properties. BRISTOL: OP PUBLISHING LTD, 2019, roč. 7, č. 4, s. 1-12. ISSN 2051-672X. doi:10.1088/2051-672x/ab359d.
    Podrobněji: https://is.muni.cz/publication/1577317/cs
  11. Efficient method to calculate the optical quantities of multi-layer systems with randomly rough boundaries using the Rayleigh Rice theory
    VOHÁNKA, Jiří, Martin ČERMÁK, Daniel FRANTA a Ivan OHLÍDAL. Efficient method to calculate the optical quantities of multi-layer systems with randomly rough boundaries using the Rayleigh Rice theory. Physica Scripta. Bristol: IOP Publishing Ltd., 2019, roč. 94, č. 4, s. 1-22. ISSN 0031-8949. doi:10.1088/1402-4896/aafbc1.
    Podrobněji: https://is.muni.cz/publication/1507078/cs
  12. Evaluation of the Dawson function and its antiderivative needed for the Gaussian broadening of piecewise polynomial functions
    VOHÁNKA, Jiří, David NEČAS a Daniel FRANTA. Evaluation of the Dawson function and its antiderivative needed for the Gaussian broadening of piecewise polynomial functions. Journal of Vacuum Science & Technology B. 2019, roč. 37, č. 6, s. "062909-1"-"062909-7", 7 s. ISSN 2166-2746. doi:10.1116/1.5122276.
    Podrobněji: https://is.muni.cz/publication/1598856/cs
  13. Optical characterization of inhomogeneous thin films containing transition layers using the combined method of spectroscopic ellipsometry and spectroscopic reflectometry based on multiple-beam interference model
    OHLÍDAL, Ivan, Jiří VOHÁNKA, Vilma BURŠÍKOVÁ, Jaroslav ŽENÍŠEK, Petr VAŠINA, Martin ČERMÁK a Daniel FRANTA. Optical characterization of inhomogeneous thin films containing transition layers using the combined method of spectroscopic ellipsometry and spectroscopic reflectometry based on multiple-beam interference model. Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics. 2019, roč. 37, č. 6, s. "062921-1"-"062921-10", 10 s. ISSN 2166-2746. doi:10.1116/1.5122014.
    Podrobněji: https://is.muni.cz/publication/1598865/cs
  14. Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects
    VOHÁNKA, Jiří, Ivan OHLÍDAL, Miloslav OHLÍDAL, Štěpán ŠUSTEK, Martin ČERMÁK, Václav ŠULC, Petr VAŠINA, Jaroslav ŽENÍŠEK a Daniel FRANTA. Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects. Coatings. Basel: MDPI, 2019, roč. 9, č. 7, s. 1-21. ISSN 2079-6412. doi:10.3390/coatings9070416.
    Podrobněji: https://is.muni.cz/publication/1549343/cs
  15. Optical properties of the crystalline silicon wafers described using the universal dispersion model
    FRANTA, Daniel, Jiří VOHÁNKA, Martin BRÁNECKÝ, Pavel FRANTA, Martin ČERMÁK, Ivan OHLÍDAL a Vladimír ČECH. Optical properties of the crystalline silicon wafers described using the universal dispersion model. Journal of Vacuum Science & Technology B. New York: A V S AMER INST PHYSICS, 2019, roč. 37, č. 6, s. "062907-1"-"062907-14", 14 s. ISSN 2166-2746. doi:10.1116/1.5122284.
    Podrobněji: https://is.muni.cz/publication/1598876/cs
  16. Temperature dependent dispersion models applicable in solid state physics
    FRANTA, Daniel, Jiří VOHÁNKA, Martin ČERMÁK, Pavel FRANTA a Ivan OHLÍDAL. Temperature dependent dispersion models applicable in solid state physics. Journal of Electrical Engineering. Slovenská technická univezita v Bratislavě, 2019, roč. 70, č. 7, s. 1-15. ISSN 1335-3632. doi:10.2478/jee-2019-0036.
    Podrobněji: https://is.muni.cz/publication/1577498/cs

    17. 2018

  17. Amorphous gallium oxide grown by low-temperature PECVD
    KOBAYASHI, Eiji, Mathieu BOCCARD, Quentin JEANGROS, Nathan RODKEY, Daniel VRESILOVIC, Aïcha HESSLER-WYSER, Max DÖBELI, Daniel FRANTA, Stefaan DE WOLF, Monica MORALES-MASIS a Christophe BALLIF. Amorphous gallium oxide grown by low-temperature PECVD. Journal of Vacuum Science and Technology A. AIP, 2018, roč. 36, č. 2, s. nestránkováno, 7 s. ISSN 0734-2101. doi:10.1116/1.5018800.
    Podrobněji: https://is.muni.cz/publication/1409778/cs
  18. Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region
    FRANTA, Daniel, Pavel FRANTA, Jiří VOHÁNKA, Martin ČERMÁK a Ivan OHLÍDAL. Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region. Journal of Applied Physics. 2018, roč. 123, č. 18, s. 185707-185717. ISSN 0021-8979. doi:10.1063/1.5026195.
    Podrobněji: https://is.muni.cz/publication/1501220/cs
  19. Different theoretical approaches at optical characterization of randomly rough silicon surfaces covered with native oxide layers
    OHLÍDAL, Ivan, Jiří VOHÁNKA, Jan MISTRÍK, Martin ČERMÁK a Daniel FRANTA. Different theoretical approaches at optical characterization of randomly rough silicon surfaces covered with native oxide layers. Surface and Interface Analysis. Wiley, 2018, roč. 50, č. 11, s. 1230-1233. ISSN 0142-2421. doi:10.1002/sia.6463.
    Podrobněji: https://is.muni.cz/publication/1472996/cs
  20. Ellipsometry of Layered Systems
    OHLÍDAL, Ivan, Jiří VOHÁNKA, Martin ČERMÁK a Daniel FRANTA. Ellipsometry of Layered Systems. In Olaf Stenzel, Miloslav Ohlídal. Optical Characterization of Thin Solid Films. Cham: Springer, 2018. s. 233-267. Springer Series in Surface Sciences, volume 64. ISBN 978-3-319-75324-9. doi:10.1007/978-3-319-75325-6_9.
    Podrobněji: https://is.muni.cz/publication/1472962/cs
  21. Measurement of doping profiles by a contactless method of IR reflectance under grazing incidence
    HOLOVSKÝ, Jakub, Zdeněk REMEŠ, Aleš PORUBA, Daniel FRANTA, Briana CONRAD, Lucie ABELOVÁ a David BUŠEK. Measurement of doping profiles by a contactless method of IR reflectance under grazing incidence. Review of Scientific Instruments. 2018, roč. 89, č. 6, s. 063114-63119. ISSN 0034-6748. doi:10.1063/1.5015988.
    Podrobněji: https://is.muni.cz/publication/1501223/cs
  22. Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory
    ČERMÁK, Martin, Jiří VOHÁNKA, Ivan OHLÍDAL a Daniel FRANTA. Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory. Journal of modern optics. Taylor & Francis, 2018, roč. 65, č. 14, s. 1720-1736. ISSN 0950-0340. doi:10.1080/09500340.2018.1457187.
    Podrobněji: https://is.muni.cz/publication/1434656/cs
  23. Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range
    FRANTA, Daniel, Jiří VOHÁNKA a Martin ČERMÁK. Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range. In Olaf Stenzel, Miloslav Ohlídal. Optical Characterization of Thin Solid Films. Cham: Springer, 2018. s. 31-82. Springer Series in Surface Sciences, volume 64. ISBN 978-3-319-75324-9. doi:10.1007/978-3-319-75325-6_3.
    Podrobněji: https://is.muni.cz/publication/1472965/cs
  24. Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization
    VOHÁNKA, Jiří, Ivan OHLÍDAL, Jaroslav ŽENÍŠEK, Petr VAŠINA, Martin ČERMÁK a Daniel FRANTA. Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization. Surface and Interface Analysis. Wiley, 2018, roč. 50, č. 7, s. 757-765. ISSN 0142-2421. doi:10.1002/sia.6473.
    Podrobněji: https://is.muni.cz/publication/1472976/cs

    25. 2017

  25. Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model
    FRANTA, Daniel, Martin ČERMÁK, Jiří VOHÁNKA a Ivan OHLÍDAL. Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model. Thin Solid Films. LAUSANNE, SWITZERLAND: ELSEVIER SCIENCE SA, 2017, roč. 631, June, s. 12-22. ISSN 0040-6090. doi:10.1016/j.tsf.2017.03.051.
    Podrobněji: https://is.muni.cz/publication/1409198/cs
  26. Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness
    OHLÍDAL, Ivan, Daniel FRANTA a David NEČAS. Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness. Applied Surface Science. AMSTERDAM, NETHERLANDS: Elsevier Science BV, 2017, roč. 421, November, s. 687-696. ISSN 0169-4332. doi:10.1016/j.apsusc.2016.10.186.
    Podrobněji: https://is.muni.cz/publication/1409184/cs
  27. Hafnium oxide thin films as a barrier against copper diffusion in solar absorbers
    KOTILAINEN, Minna Paula Katriina, Richard KRUMPOLEC, Daniel FRANTA, Pavel SOUČEK, Tomáš HOMOLA, David Campbell CAMERON a Petri VUORISTO. Hafnium oxide thin films as a barrier against copper diffusion in solar absorbers. Solar Energy Materials and Solar Cells. AMSTERDAM, NETHERLANDS: ELSEVIER SCIENCE BV, 2017, roč. 166, July, s. 140-146. ISSN 0927-0248. doi:10.1016/j.solmat.2017.02.033.
    Podrobněji: https://is.muni.cz/publication/1378718/cs
  28. Optical characterization of hafnia films deposited by ALD on copper cold-rolled sheets by difference ellipsometry
    FRANTA, Daniel, Minna Paula Katriina KOTILAINEN, Richard KRUMPOLEC a Ivan OHLÍDAL. Optical characterization of hafnia films deposited by ALD on copper cold-rolled sheets by difference ellipsometry. Applied Surface Science. AMSTERDAM: ELSEVIER SCIENCE BV, 2017, roč. 421, November, s. 420-423. ISSN 0169-4332. doi:10.1016/j.apsusc.2016.12.164.
    Podrobněji: https://is.muni.cz/publication/1392856/cs
  29. Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh-Rice theory
    OHLÍDAL, Ivan, Jiří VOHÁNKA, Martin ČERMÁK a Daniel FRANTA. Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh-Rice theory. Applied Surface Science. AMSTERDAM: Elsevier Science, 2017, roč. 419, October, s. 942-956. ISSN 0169-4332. doi:10.1016/j.apsusc.2017.04.211.
    Podrobněji: https://is.muni.cz/publication/1409203/cs
  30. Temperature-dependent dispersion model of float zone crystalline silicon
    FRANTA, Daniel, Adam DUBROKA, Chennan WANG, Angelo GIGLIA, Jiří VOHÁNKA, Pavel FRANTA a Ivan OHLÍDAL. Temperature-dependent dispersion model of float zone crystalline silicon. Applied Surface Science. Amsterdam: Elsevier Science, 2017, roč. 421, November, s. 405-419. ISSN 0169-4332. doi:10.1016/j.apsusc.2017.02.021.
    Podrobněji: https://is.muni.cz/publication/1409192/cs
  31. Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride
    FRANTA, Daniel, David NEČAS, Angelo GIGLIA, Pavel FRANTA a Ivan OHLÍDAL. Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride. Applied Surface Science. Amsterdam: Elsevier Science, 2017, roč. 421, November, s. 424-429. ISSN 0169-4332. doi:10.1016/j.apsusc.2016.09.149.
    Podrobněji: https://is.muni.cz/publication/1409188/cs

    32. 2016

  32. Materials Pushing the Application Limits of Wire Grid Polarizers further into the Deep Ultraviolet Spectral Range
    SIEFKE, Thomas, Stefanie KROKER, Kristin PFEIFFER, Oliver PUFFKY, Kay DIETRICH, Daniel FRANTA, Ivan OHLÍDAL, Adriana SZEGHALMI, Ernst-Bernhard KLEY a Andreas TÜNNERMANN. Materials Pushing the Application Limits of Wire Grid Polarizers further into the Deep Ultraviolet Spectral Range. Advanced Optical Materials. 2016, roč. 4, č. 11, s. 1780-1786. ISSN 2195-1071. doi:10.1002/adom.201600250.
    Podrobněji: https://is.muni.cz/publication/1376392/cs
  33. Optical characterization of SiO2 thin films using universal dispersion model over wide spectral range
    FRANTA, Daniel, David NEČAS, Ivan OHLÍDAL a Angelo GIGLIA. Optical characterization of SiO2 thin films using universal dispersion model over wide spectral range. In Gorecki, C; Asundi, AK; Osten, W. Conference on Optical Micro- and Nanometrology VI. 9890. vyd. BELLINGHAM: SPIE-INT SOC OPTICAL ENGINEERING, 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA, 2016. s. "989014-1"-"989014-15", 15 s. ISBN 978-1-5106-0135-2. doi:10.1117/12.2227580.
    Podrobněji: https://is.muni.cz/publication/1384148/cs
  34. Simultaneous determination of optical constants, local thickness and roughness of ZnSe thin films by imaging spectroscopic reflectometry
    NEČAS, David, Ivan OHLÍDAL, Daniel FRANTA, M. OHLIDAL a J. VODAK. Simultaneous determination of optical constants, local thickness and roughness of ZnSe thin films by imaging spectroscopic reflectometry. Journal of Optics. Bristol: IOP Publishing, 2016, roč. 18, č. 1, s. nestránkováno, 10 s. ISSN 2040-8978. doi:10.1088/2040-8978/18/1/015401.
    Podrobněji: https://is.muni.cz/publication/1375048/cs

    35. 2015

  35. Dělič světla pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm a dopadový úhel 45°±6°
    BŘEZINA, Jaromír a Daniel FRANTA. Dělič světla pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm a dopadový úhel 45°±6°. 2015.
    Podrobněji: https://is.muni.cz/publication/1340469/cs
  36. Dispersion model for optical thin films applicable in wide spectral range
    FRANTA, Daniel, David NEČAS, Ivan OHLÍDAL a Angelo GIGLIA. Dispersion model for optical thin films applicable in wide spectral range. In Duparre, A; Geyl, R. Conference on Optical Systems Design - Optical Fabrication, Testing, and Metrology V. 9628. vyd. BELLINGHAM, USA: SPIE-INT SOC OPTICAL ENGINEERING, 2015. s. "96281U-1"-"96281U-12", 12 s. ISBN 978-1-62841-817-0. doi:10.1117/12.2190104.
    Podrobněji: https://is.muni.cz/publication/1384149/cs
  37. Optická charakterizace povrchů skel SML3103/3/15
    FRANTA, Daniel a Pavel FRANTA. Optická charakterizace povrchů skel SML3103/3/15. Brno: Preciosa a.s., 2015. 18 s.
    Podrobněji: https://is.muni.cz/publication/1342797/cs
  38. Polarizační kostka pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm
    BŘEZINA, Jaromír a Daniel FRANTA. Polarizační kostka pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm. 2015.
    Podrobněji: https://is.muni.cz/publication/1340467/cs
  39. Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films
    OHLÍDAL, Miloslav, Ivan OHLÍDAL, David NEČAS, Jiří VODÁK, Daniel FRANTA, Pavel NÁDASKÝ a František VIŽĎA. Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films. In Duparre, A; Geyl, R. Conference on Optical Systems Design - Optical Fabrication, Testing, and Metrology V. 9628. vyd. BELLINGHAM, USA: SPIE-INT SOC OPTICAL ENGINEERING, 2015. s. "96280R-1"-"96280R-13", 13 s. ISBN 978-1-62841-817-0. doi:10.1117/12.2191052.
    Podrobněji: https://is.muni.cz/publication/1384154/cs
  40. Simultaneous determination of optical constants, local thickness, and local roughness of thin films by imaging spectroscopic reflectometry
    NEČAS, David, Ivan OHLÍDAL, Jiří VODÁK, Miloslav OHLÍDAL a Daniel FRANTA. Simultaneous determination of optical constants, local thickness, and local roughness of thin films by imaging spectroscopic reflectometry. In Duparre, A; Geyl, R. Conference on Optical Systems Design - Optical Fabrication, Testing, and Metrology V. 9628. vyd. BELLINGHAM, USA: SPIE-INT SOC OPTICAL ENGINEERING, 2015. s. "96280C-1"-"96280C-9", 9 s. ISBN 978-1-62841-817-0. doi:10.1117/12.2190091.
    Podrobněji: https://is.muni.cz/publication/1384153/cs
  41. Universal dispersion model for characterization of optical thin films over wide spectral range: Application to hafnia
    FRANTA, Daniel, David NEČAS a Ivan OHLÍDAL. Universal dispersion model for characterization of optical thin films over wide spectral range: Application to hafnia. Applied Optics. 2015, roč. 54, č. 31, s. 9108-9112, 12 s. ISSN 1559-128X. doi:10.1364/AO.54.009108.
    Podrobněji: https://is.muni.cz/publication/1339817/cs
  42. Wide spectral range characterization of antireflective coatings and their optimization
    FRANTA, Daniel, David NEČAS, Ivan OHLÍDAL a Jiří JANKUJ. Wide spectral range characterization of antireflective coatings and their optimization. In Duparre, A; Geyl, R. Conference on Optical Systems Design - Optical Fabrication, Testing, and Metrology V. 9628. vyd. BELLINGHAM, USA: SPIE-INT SOC OPTICAL ENGINEERING, 2015. s. "96280F-1"-"96280F-14", 14 s. ISBN 978-1-62841-817-0. doi:10.1117/12.2190109.
    Podrobněji: https://is.muni.cz/publication/1384151/cs

    43. 2014

  43. Antireflexní vrstva (Al2O3/MgF2) pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm
    BŘEZINA, Jaromír a Daniel FRANTA. Antireflexní vrstva (Al2O3/MgF2) pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm. 2014.
    Podrobněji: https://is.muni.cz/publication/1297282/cs
  44. Antireflexní vrstva (SiO2/Al2O3/MgF2) pro dalekou ultrafialovou (FUV, VUV) oblast spektra na vlnové délce 193nm
    BŘEZINA, Jaromír a Daniel FRANTA. Antireflexní vrstva (SiO2/Al2O3/MgF2) pro dalekou ultrafialovou (FUV, VUV) oblast spektra na vlnové délce 193nm. 2014.
    Podrobněji: https://is.muni.cz/publication/1297287/cs
  45. Antireflexní vrstva z materiálů Al2O3/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm pro úhel dopadu 45°
    BŘEZINA, Jaromír a Daniel FRANTA. Antireflexní vrstva z materiálů Al2O3/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm pro úhel dopadu 45°. 2014.
    Podrobněji: https://is.muni.cz/publication/1297329/cs
  46. Antireflexní vrstva z materiálů HfO2/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm
    BŘEZINA, Jaromír a Daniel FRANTA. Antireflexní vrstva z materiálů HfO2/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm. 2014.
    Podrobněji: https://is.muni.cz/publication/1297331/cs
  47. Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry
    NEČAS, David, Ivan OHLÍDAL, Daniel FRANTA, Vladimír ČUDEK, Miloslav OHLÍDAL, Jiří VODÁK, Lucia SLÁDKOVÁ, Lenka ZAJÍČKOVÁ, Marek ELIÁŠ a František VIZĎA. Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry. Thin Solid Films. Lausanne: Elsevier Science, 2014, roč. 571, november, s. 573-578. ISSN 0040-6090. doi:10.1016/j.tsf.2013.12.036.
    Podrobněji: https://is.muni.cz/publication/1232792/cs
  48. Broadening of dielectric response and sum rule conservation
    FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ a Ivan OHLÍDAL. Broadening of dielectric response and sum rule conservation. Thin Solid Films. Lausanne: Elsevier Science, 2014, roč. 571, November, s. 496-501. ISSN 0040-6090. doi:10.1016/j.tsf.2013.11.148.
    Podrobněji: https://is.muni.cz/publication/1230808/cs
  49. Dispersion model of two-phonon absorption: application to c-Si
    FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ a Ivan OHLÍDAL. Dispersion model of two-phonon absorption: application to c-Si. OPTICAL MATERIALS EXPRESS. WASHINGTON: OPTICAL SOC AMER, 2014, roč. 4, č. 8, s. 1641-1656. ISSN 2159-3930. doi:10.1364/OME.4.001641.
    Podrobněji: https://is.muni.cz/publication/1230792/cs
  50. Improved combination of scalar diffraction theory and Rayleigh-Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces
    OHLÍDAL, Ivan, Daniel FRANTA a David NEČAS. Improved combination of scalar diffraction theory and Rayleigh-Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces. Thin Solid Films. Lausanne: Elsevier Science, 2014, roč. 571, November, s. 695-700. ISSN 0040-6090. doi:10.1016/j.tsf.2014.02.092.
    Podrobněji: https://is.muni.cz/publication/1230700/cs
  51. Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films
    NEČAS, David, Ivan OHLÍDAL, Daniel FRANTA, Miloslav OHLÍDAL, Vladimír ČUDEK a Jiří VODÁK. Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films. Applied Optics. USA: Optical Society of America, 2014, roč. 53, č. 25, s. 5606-5614. ISSN 1559-128X. doi:10.1364/AO.53.005606.
    Podrobněji: https://is.muni.cz/publication/1232510/cs
  52. Utilization of the sum rule for construction of advanced dispersion model of crystalline silicon containing interstitial oxygen
    FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ a Ivan OHLÍDAL. Utilization of the sum rule for construction of advanced dispersion model of crystalline silicon containing interstitial oxygen. Thin Solid Films. Lausanne: Elsevier Science, 2014, roč. 571, november, s. 490-495. ISSN 0040-6090. doi:10.1016/j.tsf.2014.03.059.
    Podrobněji: https://is.muni.cz/publication/1230809/cs

    53. 2013

  53. Advanced modeling for optical characterization of amorphous hydrogenated silicon films
    FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL a Jiří STUCHLÍK. Advanced modeling for optical characterization of amorphous hydrogenated silicon films. Thin Solid Films. Lausanne: Elsevier Science, 2013, roč. 541, Aug, s. 12-16. ISSN 0040-6090. doi:10.1016/j.tsf.2013.04.129.
    Podrobněji: https://is.muni.cz/publication/1161986/cs
  54. Application of sum rule to the dispersion model of hydrogenated amorphous silicon
    FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL, Jiří STUCHLÍK a Dagmar CHVOSTOVA. Application of sum rule to the dispersion model of hydrogenated amorphous silicon. Thin Solid Films. Lausanne: Elsevier Science, 2013, roč. 539, Jul, s. 233-244. ISSN 0040-6090. doi:10.1016/j.tsf.2013.04.012.
    Podrobněji: https://is.muni.cz/publication/1161978/cs
  55. Application of Thomas-Reiche-Kuhn sum rule to construction of advanced dispersion models
    FRANTA, Daniel, David NEČAS a Lenka ZAJÍČKOVÁ. Application of Thomas-Reiche-Kuhn sum rule to construction of advanced dispersion models. Thin Solid Films. Oxford: Elsevier Science, 2013, roč. 534, May, s. 432-441. ISSN 0040-6090. doi:10.1016/j.tsf.2013.01.081.
    Podrobněji: https://is.muni.cz/publication/1161970/cs
  56. Ellipsometric characterization of inhomogeneous non-stoichiometric silicon nitride films
    NEČAS, David, Daniel FRANTA, Ivan OHLÍDAL, Aleš PORUBA a Petr WOSTRÝ. Ellipsometric characterization of inhomogeneous non-stoichiometric silicon nitride films. Surface and Interface Analysis. Hoboken: WILEY-BLACKWELL, 2013, roč. 45, č. 7, s. 1188-1192. ISSN 0142-2421. doi:10.1002/sia.5250.
    Podrobněji: https://is.muni.cz/publication/1113198/cs

    57. 2012

  57. Method of realisation of polyreactions, plasma-chemical polyreactions, their modification and modification of macromolecular substances by the plasma jet with a dielectric capillary enlaced by a hollow cathode
    KLÍMA, Miloš, Milan ALBERTI, Tomáš SVOBODA, Vilma BURŠÍKOVÁ, Pavel SLAVÍČEK, Daniel FRANTA, Michal MAZÍK a Pavel HÁN. Method of realisation of polyreactions, plasma-chemical polyreactions, their modification and modification of macromolecular substances by the plasma jet with a dielectric capillary enlaced by a hollow cathode. 2012. Patent. Číslo: EP2009029. Vydavatel: Evropský patentový úřad. Místo vydání: HV Rijswijk, Netherlands. Název vlastníka: Masarykova univerzita. Datum registrace: 28. 6. 2007. Datum přijetí: 7. 11. 2012.
    Podrobněji: https://is.muni.cz/publication/1093944/cs
  58. MULTIFUNCTIONAL TRANSPARENT PROTECTIVE COATINGS ON POLYCARBONATES PREPARED USING PECVD
    MOCANU, Valentin, Adrian STOICA, Lukáš KELAR, Daniel FRANTA, Vilma BURŠÍKOVÁ, Romana MIKSOVA a Vratislav PERINA. MULTIFUNCTIONAL TRANSPARENT PROTECTIVE COATINGS ON POLYCARBONATES PREPARED USING PECVD. Chem. Listy. 2012, roč. 106/2012, č. 106, s. s1460-s1464, 4 s. ISSN 0009-2770.
    Podrobněji: https://is.muni.cz/publication/1092432/cs

    59. 2011

  59. Anisotropy-enhanced depolarization on transparent film/substrate system
    FRANTA, Daniel, David NEČAS a Ivan OHLÍDAL. Anisotropy-enhanced depolarization on transparent film/substrate system. Thin Solid Films. Elsevier, 2011, roč. 519, č. 9, s. 2637-2640. ISSN 0040-6090. doi:10.1016/j.tsf.2010.12.113.
    Podrobněji: https://is.muni.cz/publication/932462/cs
  60. Combination of Synchrotron Ellipsometry and Table-Top Optical Measurements for Determination of Band Structure of DLC Films
    FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ a Christoph COBET. Combination of Synchrotron Ellipsometry and Table-Top Optical Measurements for Determination of Band Structure of DLC Films. Thin Solid Films. Elsevier, 2011, roč. 519, č. 9, s. 2694-2697. ISSN 0040-6090. doi:10.1016/j.tsf.2010.12.059.
    Podrobněji: https://is.muni.cz/publication/932461/cs
  61. Dielectric response and structure of amorphous hydrogenated carbon films with nitrogen admixture
    ZAJÍČKOVÁ, Lenka, Daniel FRANTA, David NEČAS, Vilma BURŠÍKOVÁ, Mihai George MURESAN, Vratislav PEŘINA a Christoph COBET. Dielectric response and structure of amorphous hydrogenated carbon films with nitrogen admixture. Thin Solid Films. Elsevier, 2011, roč. 519, č. 13, s. 4299-4308. ISSN 0040-6090. doi:10.1016/j.tsf.2011.02.021.
    Podrobněji: https://is.muni.cz/publication/940456/cs
  62. Ellipsometric characterisation of thin films non-uniform in thickness
    NEČAS, David, Daniel FRANTA, Vilma BURŠÍKOVÁ a Ivan OHLÍDAL. Ellipsometric characterisation of thin films non-uniform in thickness. Thin Solid Films. Elsevier, 2011, roč. 519, č. 9, s. 2715-2717. ISSN 0040-6090. doi:10.1016/j.tsf.2010.12.065.
    Podrobněji: https://is.muni.cz/publication/940454/cs
  63. INFLUENCE OF PLASMA DEPOSITION PARAMETERS ON INCORPORATION OF HYDROGEN OR NITROGEN INTO DLC
    MURESAN, Mihai George, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Daniel FRANTA, David NEČAS, Vratislav PEŘINA a Romana MIKŠOVÁ. INFLUENCE OF PLASMA DEPOSITION PARAMETERS ON INCORPORATION OF HYDROGEN OR NITROGEN INTO DLC. In 12th International Balkan Workshop on Applied Physics, 2011. 2011.
    Podrobněji: https://is.muni.cz/publication/953441/cs
  64. Mechanical Properties of Ultrananocrystalline Thin Films Deposited Using Dual Frequency Discharges
    BURŠÍKOVÁ, Vilma, Olga BLÁHOVÁ, Monika KARÁSKOVÁ, Lenka ZAJÍČKOVÁ, Ondřej JAŠEK, Daniel FRANTA, Petr KLAPETEK a Jiří BURŠÍK. Mechanical Properties of Ultrananocrystalline Thin Films Deposited Using Dual Frequency Discharges. CHEMICKÉ LISTY. Praha: Česká společnost chemická, 2011, roč. 105, CHLSAC 105, s. 98 - 101. ISSN 0009-2770.
    Podrobněji: https://is.muni.cz/publication/966868/cs
  65. Multilayered films based on DLC, DLC:N and SiOx grown by PECVD on stainless steel
    MURESAN, Mihai George, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Daniel FRANTA, David NEČAS a Vratislav PEŘINA. Multilayered films based on DLC, DLC:N and SiOx grown by PECVD on stainless steel. In E-MRS 2011 Spring Meeting. 2011.
    Podrobněji: https://is.muni.cz/publication/953439/cs
  66. Optical characterisation of SiOxCyHz thin films non-uniform in thickness using spectroscopic ellipsometry, spectroscopic reflectometry and spectroscopic imaging reflectometry
    OHLÍDAL, Ivan, Miloslav OHLÍDAL, David NEČAS, Daniel FRANTA a Vilma BURŠÍKOVÁ. Optical characterisation of SiOxCyHz thin films non-uniform in thickness using spectroscopic ellipsometry, spectroscopic reflectometry and spectroscopic imaging reflectometry. Thin Solid Films. Elsevier, 2011, roč. 519, č. 9, s. 2874-2876. ISSN 0040-6090. doi:10.1016/j.tsf.2010.12.069.
    Podrobněji: https://is.muni.cz/publication/940438/cs
  67. Optical characterization of HfO2 thin films
    FRANTA, Daniel, Ivan OHLÍDAL, David NEČAS, František VIŽĎA, Ondřej CAHA, Martin HASOŇ a Pavel POKORNÝ. Optical characterization of HfO2 thin films. Thin Solid Films. Oxford, UK: Elsevier, 2011, roč. 519, č. 18, s. 6085–6091. ISSN 0040-6090. doi:10.1016/j.tsf.2011.03.128.
    Podrobněji: https://is.muni.cz/publication/966962/cs
  68. Variable-angle spectroscopic ellipsometry of considerably non-uniform thin films
    NEČAS, David, Ivan OHLÍDAL a Daniel FRANTA. Variable-angle spectroscopic ellipsometry of considerably non-uniform thin films. Journal of Optics. Bristol: IOP Publishing, 2011, roč. 13, č. 8, s. "nestránkováno", 10 s. ISSN 2040-8978. doi:10.1088/2040-8978/13/8/085705.
    Podrobněji: https://is.muni.cz/publication/966931/cs

    69. 2010

  69. Band structure of diamond-like carbon films assessed from optical measurements in wide spectral range
    FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ a Christoph COBET. Band structure of diamond-like carbon films assessed from optical measurements in wide spectral range. Diamond and Related Materials. Amsterdam: Elsevier, 2010, roč. 19, 2-3, s. 114-122. ISSN 0925-9635.
    Podrobněji: https://is.muni.cz/publication/895717/cs
  70. Comparative study on hydrogenated and deuterated amorphous carbon films deposited by RF PECVD
    STOICA, Adrian, Valentin MOCANU, Magdaléna KADLEČÍKOVÁ, Vratislav PEŘINA, Petr KLAPETEK, Daniel FRANTA, David NEČAS, Pavel SLAVÍČEK a Vilma BURŠÍKOVÁ. Comparative study on hydrogenated and deuterated amorphous carbon films deposited by RF PECVD. In E-MRS 2010 Spring Meeting Book of Abstracts. 2010.
    Podrobněji: https://is.muni.cz/publication/918551/cs
  71. Deposition of hard thin films from HMDSO in atmospheric pressure dielectric barrier discharge
    TRUNEC, David, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Filip STUDNIČKA, Pavel SŤAHEL, Vadym PRYSIAZHNYI, Vratislav PEŘINA, Jana HOUDKOVÁ, Zdeněk NAVRÁTIL a Daniel FRANTA. Deposition of hard thin films from HMDSO in atmospheric pressure dielectric barrier discharge. Journal of Physics D: Applied Physics. Bristol, England: IOP Publishing Ltd., 2010, roč. 43, č. 22, s. 225403-225410. ISSN 0022-3727.
    Podrobněji: https://is.muni.cz/publication/883750/cs
  72. Development of transparent protective coatings on polycarbonate substrates using PECVD
    MOCANU, Valentin, Vilma BURŠÍKOVÁ, Adrian STOICA, Vratislav PEŘINA, Daniel FRANTA, David NEČAS, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL a Miloslav OHLÍDAL. Development of transparent protective coatings on polycarbonate substrates using PECVD. In Twelfth International Conference on Plasma Surface Engineering, 2010. 2010.
    Podrobněji: https://is.muni.cz/publication/918434/cs
  73. Diamond-Like Carbon film for protective use on glass and polymer surfaces
    MURESAN, Mihai George, Lenka ZAJÍČKOVÁ, Daniel FRANTA a David NEČAS. Diamond-Like Carbon film for protective use on glass and polymer surfaces. In Potential and applications of surface nanotreatment of polymers and glass. 2010.
    Podrobněji: https://is.muni.cz/publication/930234/cs
  74. Effect of nitrogen incorporation on mechanical properties of DLC coatings on metallic substrates
    MURESAN, Mihai George, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Daniel FRANTA, David NEČAS a Vratislav PEŘINA. Effect of nitrogen incorporation on mechanical properties of DLC coatings on metallic substrates. In Material Science and Engineering. 2010.
    Podrobněji: https://is.muni.cz/publication/930230/cs
  75. Effect of Nitrogen Incorporation on Optical Properties of DLC Layers
    MURESAN, Mihai George, Lenka ZAJÍČKOVÁ, Daniel FRANTA a David NEČAS. Effect of Nitrogen Incorporation on Optical Properties of DLC Layers. In 19th Annual Student Conference - Week of Doctoral Students 2010. 2010.
    Podrobněji: https://is.muni.cz/publication/930229/cs
  76. Multilayered transparent polymer protective coatings using PECVD
    MOCANU, Valentin, Adrian STOICA, Vilma BURŠÍKOVÁ a Daniel FRANTA. Multilayered transparent polymer protective coatings using PECVD. In 11th International Balkan Workshop on Applied Physics, 2010. 2010. ISBN 978-973-614-554-4.
    Podrobněji: https://is.muni.cz/publication/918526/cs
  77. Optical and mechanical characterization of ultrananocrystalline diamond films prepared in dual frequency discharges
    KARÁSKOVÁ, Monika, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Daniel FRANTA, David NEČAS, Olga BLÁHOVÁ a Jiří ŠPERKA. Optical and mechanical characterization of ultrananocrystalline diamond films prepared in dual frequency discharges. Surface & coatings technology. Elsevier Science, 2010, roč. 204, 12-13, s. 1997–2001. ISSN 0257-8972.
    Podrobněji: https://is.muni.cz/publication/895715/cs
  78. OPTICAL PROPERTIES OF PECVD DEPOSITED DLC:N FILMS
    MURESAN, Mihai George, Lenka ZAJÍČKOVÁ, Daniel FRANTA a David NEČAS. OPTICAL PROPERTIES OF PECVD DEPOSITED DLC:N FILMS. In 11th International Balkan Workshop on Applied Physics 2010. 2010. ISBN 978-973-614-554-4.
    Podrobněji: https://is.muni.cz/publication/930176/cs
  79. PREPARATION AND CHARACTERIZATION OF DLC:N FILMS
    MURESAN, Mihai George, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Daniel FRANTA a David NEČAS. PREPARATION AND CHARACTERIZATION OF DLC:N FILMS. In TANGER Ltd. 2nd International Conference Nanocon 2010. 1st. Olomouc: TANGER Ltd., 2010. s. 434-440. ISBN 978-80-87294-19-2.
    Podrobněji: https://is.muni.cz/publication/930213/cs
  80. Preparation of multifunctional layered materials
    MOCANU, Valentin, Adrian STOICA, Vilma BURŠÍKOVÁ a Daniel FRANTA. Preparation of multifunctional layered materials. In European Materials Research Society. 2010.
    Podrobněji: https://is.muni.cz/publication/918461/cs
  81. Study on the properties of modified amorphous carbon thin films deposited by PECVD.
    STOICA, Adrian, Valentin MOCANU, Magdaléna KADLEČÍKOVÁ, Vratislav PEŘINA, Petr KLAPETEK, Daniel FRANTA, David NEČAS, Pavel SLAVÍČEK a Vilma BURŠÍKOVÁ. Study on the properties of modified amorphous carbon thin films deposited by PECVD. In Twefth International Conference on Plasma Surface Engineering. 2010.
    Podrobněji: https://is.muni.cz/publication/918569/cs

    82. 2009

  82. Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films
    FRANTA, Daniel, David NEČAS, Ivan OHLÍDAL, Martin HRDLIČKA, Martin PAVLIŠTA, Miloslav FRUMAR a Miloslav OHLÍDAL. Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films. Journal of Optoelectronics and Advanced Materials. Bucharest: INOE & INFM, 2009, roč. 11, č. 12, s. 1891-1898. ISSN 1454-4164.
    Podrobněji: https://is.muni.cz/publication/879780/cs
  83. Characterization of non-uniform diamond-like carbon films by spectroscopic ellipsometry
    OHLÍDAL, Ivan, David NEČAS, Daniel FRANTA a Vilma BURŠÍKOVÁ. Characterization of non-uniform diamond-like carbon films by spectroscopic ellipsometry. Diamond and Related Materials. New York: Elsevier Science S.A., 2009, roč. 18, 2-3, s. 364-367. ISSN 0925-9635. doi:10.1016/j.diamond.2008.09.003.
    Podrobněji: https://is.muni.cz/publication/808473/cs
  84. Limitations and possible improuvements of DLC dielectric response model based on parameterization of density of states
    FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ a Vilma BURŠÍKOVÁ. Limitations and possible improuvements of DLC dielectric response model based on parameterization of density of states. Diamond and Related Materials. New York: Elsevier Science S.A., 2009, roč. 18, 2-3, s. 413–418. ISSN 0925-9635.
    Podrobněji: https://is.muni.cz/publication/808451/cs
  85. Modeling of dielectric response of GexSbyTez (GST) materials
    FRANTA, Daniel, David NEČAS a Miloslav FRUMAR. Modeling of dielectric response of GexSbyTez (GST) materials. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2009, roč. 5, č. 5, s. 1324-1327. ISSN 1610-1634.
    Podrobněji: https://is.muni.cz/publication/879784/cs
  86. Optical Characterization of Ultra-Thin Iron and Iron Oxide Films
    NEČAS, David, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Pavel SŤAHEL, Petr MIKULÍK, Mojmír MEDUŇA a Miroslav VALTR. Optical Characterization of Ultra-Thin Iron and Iron Oxide Films. e-Journal of Surface Science and Nanotechnology. Tokyo: The Surface Science Society of Japan, 2009, roč. 7, březen, s. 486-490. ISSN 1348-0391.
    Podrobněji: https://is.muni.cz/publication/836841/cs
  87. Reflectance of non-uniform thin films
    NEČAS, David, Ivan OHLÍDAL a Daniel FRANTA. Reflectance of non-uniform thin films. Journal of Optics A: Pure and Applied Optics. Bristol, GB: IOP Publishing Ltd, 2009, roč. 11, č. 4, s. 1-9. ISSN 1464-4258.
    Podrobněji: https://is.muni.cz/publication/824022/cs

    88. 2008

  88. Composition and functional properties of organosilicon plasma polymers from hexamethyldisiloxane and octamethylcyclotetrasiloxane
    ZAJÍČKOVÁ, Lenka, Zuzana KUČEROVÁ, Vilma BURŠÍKOVÁ, Daniel FRANTA, Vratislav PEŘINA a Anna MACKOVÁ. Composition and functional properties of organosilicon plasma polymers from hexamethyldisiloxane and octamethylcyclotetrasiloxane. In ORGANIC/INORGANIC HYBRID MATERIALS - 2007. WARRENDALE: MATERIALS RESEARCH SOCIETY, 2008. s. 159-164. ISBN 978-1-55899-967-1.
    Podrobněji: https://is.muni.cz/publication/839392/cs
  89. Deposition of Nanostructured Diamond-Like Carbon Films in Dual Frequency Capacitive Discharge
    BURŠÍKOVÁ, Vilma, Vratislav PEŘINA, Jaroslav SOBOTA, Petr KLAPETEK, Pavel DVOŘÁK, Adrian STOICA, Jiří BURŠÍK a Daniel FRANTA. Deposition of Nanostructured Diamond-Like Carbon Films in Dual Frequency Capacitive Discharge. In 19th Europhysics Conference on the Atomic and Molecular Physics of Ionized Gases. 19. vyd. Cordoba, Spain: European Physical Society, 2008. 2 s. ISBN 2-914771-04-5.
    Podrobněji: https://is.muni.cz/publication/777914/cs
  90. Characterization of nanostructured diamond-like carbon coatings deposited in single and dual frequency capacitive discharges
    BURSIKOVA, Vilma, Vratislav PERINA, Jaroslav SOBOTA, Jan GROSSMAN, Petr KLAPETEK, Jiri BURSIK, Daniel FRANTA, Ivan OHLIDAL, Lenka ZAJICKOVA, Josef HAVEL a Jan JANCA. Characterization of nanostructured diamond-like carbon coatings deposited in single and dual frequency capacitive discharges. In 2nd conference on New Diamond and Nano Carbons 2008. 2008.
    Podrobněji: https://is.muni.cz/publication/808478/cs
  91. Influence of cross-correlation effects on the optical quantities of rough films
    FRANTA, Daniel, Ivan OHLÍDAL a David NEČAS. Influence of cross-correlation effects on the optical quantities of rough films. Optics Express. elektronicky: Optical Society of America, 2008, roč. 16, č. 11, s. 7789–7803. ISSN 1094-4087.
    Podrobněji: https://is.muni.cz/publication/806290/cs
  92. Modeling of optical constants of diamond-like carbon
    FRANTA, Daniel, Vilma BURŠÍKOVÁ, David NEČAS a Lenka ZAJÍČKOVÁ. Modeling of optical constants of diamond-like carbon. Diamond and Related Materials. New York: Elsevier, 2008, roč. 17, č. 1, s. 705–708. ISSN 0925-9635.
    Podrobněji: https://is.muni.cz/publication/806285/cs
  93. NUCLEATION AND PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION OF ULTRANANOCRYSTALLINE DIAMOND FILMS ON DIFFERENT SUBSTRATES
    KARÁSKOVÁ, Monika, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Ondřej JAŠEK, Daniel FRANTA, Jiřina MATĚJKOVÁ a Petr KLAPETEK. NUCLEATION AND PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION OF ULTRANANOCRYSTALLINE DIAMOND FILMS ON DIFFERENT SUBSTRATES. In CESPC II Book Of Extended Abstracts. 1. vyd. Brno: Masarykova Univerzita, 2008. s. 159-160.
    Podrobněji: https://is.muni.cz/publication/808173/cs
  94. Optical characterization of diamond-like carbon thin films non-uniform in thickness using spectroscopic reflectometry
    OHLÍDAL, Ivan, David NEČAS, Vilma BURŠÍKOVÁ, Daniel FRANTA a Miloslav OHLÍDAL. Optical characterization of diamond-like carbon thin films non-uniform in thickness using spectroscopic reflectometry. Diamond and Related Materials. New York: Elsevier, 2008, roč. 17, č. 1, s. 709–712. ISSN 0925-9635.
    Podrobněji: https://is.muni.cz/publication/806287/cs
  95. Optical characterization of non-stoichiometric silicon nitride films
    NEČAS, David, Vratislav PEŘINA, Daniel FRANTA, Ivan OHLÍDAL a Josef ZEMEK. Optical characterization of non-stoichiometric silicon nitride films. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, roč. 5, č. 5, s. 1320-1323. ISSN 1610-1634.
    Podrobněji: https://is.muni.cz/publication/775835/cs
  96. Optical characterization of phase changing Ge2Sb2Te5 chalcogenide films
    FRANTA, Daniel, Martin HRDLIČKA, David NEČAS, Miloslav FRUMAR, Ivan OHLÍDAL a Martin PAVLIŠTA. Optical characterization of phase changing Ge2Sb2Te5 chalcogenide films. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, roč. 5, č. 5, s. 1324-1327. ISSN 1610-1634.
    Podrobněji: https://is.muni.cz/publication/798278/cs
  97. Optical Characterization of Ultrananocrystalline Diamond Films
    FRANTA, Daniel, Lenka ZAJÍČKOVÁ, Monika KARÁSKOVÁ, Ondřej JAŠEK, David NEČAS, Petr KLAPETEK a Miroslav VALTR. Optical Characterization of Ultrananocrystalline Diamond Films. Diamond and Related Materials. New York: Elsevier, 2008, roč. 17, č. 1, s. 1278–1282. ISSN 0925-9635.
    Podrobněji: https://is.muni.cz/publication/806283/cs
  98. Optical quantities of rough films calculated by Rayleigh-Rice theory
    FRANTA, Daniel, Ivan OHLÍDAL a David NEČAS. Optical quantities of rough films calculated by Rayleigh-Rice theory. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, roč. 5, č. 5, s. 1395–1398. ISSN 1610-1634.
    Podrobněji: https://is.muni.cz/publication/798388/cs
  99. Optimization of the performance of graded amorphous carbon coatings to steel substrates using PECVD
    SOBOTA, Jaroslav, Vilma BURSIKOVA, Jan GROSSMAN, Tomas FORT, Petr KLAPETEK, Jiri BURSIK, Daniel FRANTA a Vratislav PERINA. Optimization of the performance of graded amorphous carbon coatings to steel substrates using PECVD. In 2nd conference on New Diamond and Nano Carbons 2008. 2008.
    Podrobněji: https://is.muni.cz/publication/808454/cs
  100. Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies
    OHLÍDAL, Ivan, David NEČAS a Daniel FRANTA. Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, roč. 5, č. 5, s. 1399–1402. ISSN 1610-1634.
    Podrobněji: https://is.muni.cz/publication/798460/cs
  101. Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge
    VALTR, Miroslav, Petr KLAPETEK, Vilma BURŠÍKOVÁ, Ivan OHLÍDAL a Daniel FRANTA. Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge. In 2nd Central European Symposium on Plasma Chemistry. 2008.
    Podrobněji: https://is.muni.cz/publication/813598/cs
  102. Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge
    VALTR, Miroslav, Petr KLAPETEK, Vilma BURŠÍKOVÁ, Ivan OHLÍDAL a Daniel FRANTA. Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge. Chem. listy. Praha: Česká společnost chemická, 2008, roč. 102, č. 16, s. 1529-1532. ISSN 0009-2770.
    Podrobněji: https://is.muni.cz/publication/798200/cs

    103. 2007

  103. Comparative Study of Films Deposited from HMDSO/O2 in Continuous Wave and Pulsed rf Discharges
    ZAJÍČKOVÁ, Lenka, Vilma BURŠÍKOVÁ, Daniel FRANTA, Angelique BOUSQUET, Agnes GRANIER, Antoine GOULLET a Jiří BURŠÍK. Comparative Study of Films Deposited from HMDSO/O2 in Continuous Wave and Pulsed rf Discharges. Plasma processes and polymers. Weinheim: Wiley-VCH, 2007, roč. 4, S1, s. S287-S293, 7 s. ISSN 1612-8850.
    Podrobněji: https://is.muni.cz/publication/720151/cs
  104. Correlation of thermal stability of the mechanical and optical properties of diamond-like carbon films
    FRANTA, Daniel, Vilma BURŠÍKOVÁ, Ivan OHLÍDAL, Pavel SŤAHEL, Miloslav OHLÍDAL a David NEČAS. Correlation of thermal stability of the mechanical and optical properties of diamond-like carbon films. Diamond and Related Materials. New York: Elsevier, 2007, roč. 16, 4-7, s. 1331–1335. ISSN 0925-9635.
    Podrobněji: https://is.muni.cz/publication/755055/cs
  105. Deposition and analysis of thin films produced in atmospheric pressure glow discharge
    ŠÍRA, Martin, Vilma BURŠÍKOVÁ, Daniel FRANTA a David TRUNEC. Deposition and analysis of thin films produced in atmospheric pressure glow discharge. In Proceedings of XXVIII International Conference on Phenomena in Ionized Gases. Praha: J.Schmidt, M. Šimek, S.Pekárek, V.Prukner, 2007. s. 713-716. ISBN 978-80-87026-01-4.
    Podrobněji: https://is.muni.cz/publication/724090/cs
  106. Deposition and Characterization of Nanostructured Silicon-Oxide Containing Diamond-Like Carbon Coatings
    BURŠÍKOVÁ, Vilma, Pavel DVOŘÁK, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Jan JANČA, Jiří BURŠÍK, Jaroslav SOBOTA, Petr KLAPETEK, Olga BLÁHOVÁ a Vratislav PEŘINA. Deposition and Characterization of Nanostructured Silicon-Oxide Containing Diamond-Like Carbon Coatings. Optoelectronics and Advanced Materials - Rapid Communications. Bucharest: INOE & INFM, 2007, roč. 1, č. 10, s. 491-495. ISSN 1842-6573.
    Podrobněji: https://is.muni.cz/publication/747817/cs
  107. Deposition of protective coatings in rf organosilicon discharges
    ZAJÍČKOVÁ, Lenka, Vilma BURŠÍKOVÁ, Zuzana KUČEROVÁ, Daniel FRANTA, Pavel DVOŘÁK, Radek ŠMÍD, Vratislav PEŘINA a Anna MACKOVÁ. Deposition of protective coatings in rf organosilicon discharges. Plasma Sources Science and Technology. Bristol: Institute of Physics Publishing, 2007, roč. 16, č. 1, s. S123-S132, 10 s. ISSN 0963-0252.
    Podrobněji: https://is.muni.cz/publication/720366/cs
  108. Importance of Nucleation Phase in Microwave PECVD of Ultra-Nanocrystalline Diamond Films
    ZAJÍČKOVÁ, Lenka, Monika KARÁSKOVÁ, Ondřej JAŠEK, Vilma BURŠÍKOVÁ, Daniel FRANTA, Jiřina MATĚJKOVÁ a Petr KLAPETEK. Importance of Nucleation Phase in Microwave PECVD of Ultra-Nanocrystalline Diamond Films. In New Perspectives of Plasma Science and Technology CD. 1. vyd. Brno: VUT Brno, 2007. 1 s.
    Podrobněji: https://is.muni.cz/publication/747143/cs
  109. Models of dielectric response in disordered solids
    FRANTA, Daniel, David NEČAS a Lenka ZAJÍČKOVÁ. Models of dielectric response in disordered solids. Optics Express. elektronicky: Optical Society of America, 2007, roč. 15, č. 24, s. 16230-16244. ISSN 1094-4087.
    Podrobněji: https://is.muni.cz/publication/747634/cs
  110. Plasma enhanced CVD of thin films using hexamethyldisiloxane and octamethyltetrasiloxane monomers
    ZAJÍČKOVÁ, Lenka, Zuzana KUČEROVÁ, Daniel FRANTA, Vilma BURŠÍKOVÁ, Jiří BURŠÍK, Pavel SŤAHEL a Petr KLAPETEK. Plasma enhanced CVD of thin films using hexamethyldisiloxane and octamethyltetrasiloxane monomers. In 18th International Symposium on Plasma Chemistry. Kyoto: International Plasma Chemistry Society, 2007. s. 459.
    Podrobněji: https://is.muni.cz/publication/747827/cs
  111. Studium DLC vrstev na plastových substrátech
    BURŠÍKOVÁ, Vilma, Jiří BURŠÍK, Lukáš KELAR, Daniel FRANTA, Petr KLAPETEK a Vratislav PEŘINA. Studium DLC vrstev na plastových substrátech. In VI. ročník konferencie Vrstvy a povlaky 2007. 2007. vyd. Rožnov pod Radhoštěm: LISS a.s., 2007. s. 1-4. ISBN 978-80-969310-4-0.
    Podrobněji: https://is.muni.cz/publication/755431/cs
  112. Study of Mechanical Properties of NCD Coatings
    BURŠÍKOVÁ, Vilma, Jiří BURŠÍK, Monika KARÁSKOVÁ, Ondřej JAŠEK, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Petr KLAPETEK a Olga BLÁHOVÁ. Study of Mechanical Properties of NCD Coatings. In VI. ročník konferencie Vrstvy a povlaky 2007. 1. vyd. Rožnov pod Radhoštěm: Liss a.s., 2007. s. 1-4. ISBN 978-80-969310-4-0.
    Podrobněji: https://is.muni.cz/publication/755433/cs
  113. Studying an influence of a nucleation phase on nanocrystalline diamond film properties
    KARÁSKOVÁ, Monika, Lenka ZAJÍČKOVÁ, Ondřej JAŠEK, Vilma BURŠÍKOVÁ, Daniel FRANTA, Jiřina MATĚJKOVÁ a Petr KLAPETEK. Studying an influence of a nucleation phase on nanocrystalline diamond film properties. Acta Metallurgica Slovaca. Košice, Sloveská republika: Technická univerzita, Košice, 2007, roč. 13, č. 6, s. 204-208. ISSN 1335-1532.
    Podrobněji: https://is.muni.cz/publication/756447/cs
  114. Studying an influence of a nucleation phase on nanocrystalline diamond film properties
    KARÁSKOVÁ, Monika, Lenka ZAJÍČKOVÁ, Ondřej JAŠEK, Vilma BURŠÍKOVÁ, Daniel FRANTA, Jiřina MATĚJKOVÁ a Petr KLAPETEK. Studying an influence of a nucleation phase on nanocrystalline diamond film properties. Košice, Sloveská republika: Hutnicka fakulta - Technická univerzita v Košiciach, 2007. 321 s. 6. ISSN 1335-1532.
    Podrobněji: https://is.muni.cz/publication/806840/cs
  115. Studying an Influence of a Nucleation Phase on Nanocrystalline Diamond Film Properties
    KARÁSKOVÁ, Monika, Lenka ZAJÍČKOVÁ, Ondřej JAŠEK, Vilma BURŠÍKOVÁ, Daniel FRANTA, Jiřina MATĚJKOVÁ a Petr KLAPETEK. Studying an Influence of a Nucleation Phase on Nanocrystalline Diamond Film Properties. In Abstract Booklet of Inernational Conference NANO 07. 1. vyd. Brno: VUT Brno, 2007. s. 59-59. ISBN 978-80-214-3460-8.
    Podrobněji: https://is.muni.cz/publication/747210/cs
  116. UV light enhanced oxidation of a-C:H thin film in air: A study of thickness reduction
    VALTR, Miroslav, Petr KLAPETEK, Ivan OHLÍDAL a Daniel FRANTA. UV light enhanced oxidation of a-C:H thin film in air: A study of thickness reduction. Optoelectronics and Advanced Materials - Rapid Communications. Bucharest: INOE & INFM, 2007, roč. 1, č. 11, s. 620-624. ISSN 1842-6573.
    Podrobněji: https://is.muni.cz/publication/746839/cs
  117. Způsob realizace polyreakcí, plazmo-chemických polyreakcí, jejich modifikace a modifikace makromolekulárních látek plazmovou tryskou s dielektrickou kapilárou obepnutou dutou katodou
    KLÍMA, Miloš, Milan ALBERTI, Tomáš SVOBODA, Vilma BURŠÍKOVÁ, Pavel SLAVÍČEK, Daniel FRANTA, Michal MAZÍK a Pavel HÁN. Způsob realizace polyreakcí, plazmo-chemických polyreakcí, jejich modifikace a modifikace makromolekulárních látek plazmovou tryskou s dielektrickou kapilárou obepnutou dutou katodou. 2007. Patent. Číslo: EP 07466017. Vydavatel: European Patent Office. Místo vydání: HV Rijswijk, Netherlands. Název vlastníka: Masarykova univerzita. Datum registrace: 28. 6. 2007. Datum přijetí: 28. 6. 2007.
    Podrobněji: https://is.muni.cz/publication/726034/cs

    118. 2006

  118. Comparison of dispersion models in the optical characterization of As-S chalcogenide thin films
    OHLÍDAL, Ivan, Daniel FRANTA, Martin ŠILER, František VIŽĎA, Miloslav FRUMAR, Jaroslav JEDELSKÝ a Jaroslav OMASTA. Comparison of dispersion models in the optical characterization of As-S chalcogenide thin films. Journal of Non-Crystalline Solids. NORTH-HOLLAND, 2006, roč. 352, 52-54, s. 5633-5641, 8 s. ISSN 0022-3093.
    Podrobněji: https://is.muni.cz/publication/712430/cs
  119. Deposition and Characterisation of Nanostructured silicon-oxide Containing Diamond-like Carbon Coatings
    BURŠÍKOVÁ, Vilma, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Jan JANČA, Jiří BURŠÍK, Petr KLAPETEK, Olga BLÁHOVÁ, Vratislav PEŘINA a Vladislav NAVRÁTIL. Deposition and Characterisation of Nanostructured silicon-oxide Containing Diamond-like Carbon Coatings. In 7th International Balkan Workshop on Applied Physics - Abstracts. 1. vyd. Constanta, Romania: Ovidius University, 2006. s. 101-102, 1 s. ISBN 978-80-214-3460-8.
    Podrobněji: https://is.muni.cz/publication/699216/cs
  120. Deposition of organic polymers at higher substrate temperatures in atmospheric pressure glow discharge
    ŠÍRA, Martin, David TRUNEC, Pavel SŤAHEL, Vilma BURŠÍKOVÁ a Daniel FRANTA. Deposition of organic polymers at higher substrate temperatures in atmospheric pressure glow discharge. Czechoslovak Journal of Physics. Praha: Academia Praha, 2006, roč. 56, B, s. 1377-1382. ISSN 0011-4626.
    Podrobněji: https://is.muni.cz/publication/707318/cs
  121. Deposition of protective couatings in RF organosilicon discharges
    ZAJÍČKOVÁ, Lenka, Vilma BURŠÍKOVÁ, Daniel FRANTA, Zuzana KUČEROVÁ, Angelique BOUSQUET, Antoine GOULLET a Agnes GRANIER. Deposition of protective couatings in RF organosilicon discharges. In In Abstracts of Invited Lectures and Contributed Papers, 18th Europhysics Conference on Atomic and Molecular Physics of Ionized Gases. Piacenza, Italy: European Physical Society, 2006. s. 51-54. ISBN 2-914771-38-X.
    Podrobněji: https://is.muni.cz/publication/708986/cs
  122. Deposition of thin films at higher substrate temperatures in atmospheric pressure glow discharge
    TRUNEC, David, Martin ŠÍRA, Pavel SŤAHEL, Vilma BURŠÍKOVÁ a Daniel FRANTA. Deposition of thin films at higher substrate temperatures in atmospheric pressure glow discharge. In 10th International Symposium on High Pressure Low Temperature Plasma Chemistry. Saga, Japan: Saga University, 2006. s. 331-334.
    Podrobněji: https://is.muni.cz/publication/707510/cs
  123. Depozice nanokrystalických diamantových vrstev metodou PECVD v mikrovlnném reaktoru typu ASTEX
    JAŠEK, Ondřej, Monika KARÁSKOVÁ, Vilma BURŠÍKOVÁ, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Zdeněk FRGALA, Jiřina MATĚJKOVÁ, Antonín REK, Petr KLAPETEK a Jiří BURŠÍK. Depozice nanokrystalických diamantových vrstev metodou PECVD v mikrovlnném reaktoru typu ASTEX. In Moderní trendy ve fyzice plazmatu a pevných látek II. 1. vyd. Brno: Masarykova univerzita, 2006. s. 133-138. ISBN 80-210-4195-1.
    Podrobněji: https://is.muni.cz/publication/705269/cs
  124. Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy
    FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Růžena NEPUSTILOVÁ a Svatopluk BAJER. Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy. Surface and Interface Analysis. USA: John Wiley & Sons, 2006, roč. 38, č. 4, s. 842-846. ISSN 0142-2421.
    Podrobněji: https://is.muni.cz/publication/711185/cs
  125. Influence of lateral dimensions of the irregularities on the optical quantities of rough surfaces
    FRANTA, Daniel a Ivan OHLÍDAL. Influence of lateral dimensions of the irregularities on the optical quantities of rough surfaces. Journal of Optics A: Pure and Applied Optics. Bristol, GB: IOP Publishing Ltd, 2006, roč. 8, č. 9, s. 763-774. ISSN 1464-4258.
    Podrobněji: https://is.muni.cz/publication/711191/cs
  126. Mechanical properties of nanostructured composite diamond films prepared by PECVD enhanced by RF induced DC self bias
    BURŠÍKOVÁ, Vilma, Zdeněk FRGALA, Jiří BURŠÍK, Ondřej JAŠEK, Lenka ZAJÍČKOVÁ, Monika KARÁSKOVÁ, Jiřina MATĚJKOVÁ, Antonín REK, Daniel FRANTA a Petr KLAPETEK. Mechanical properties of nanostructured composite diamond films prepared by PECVD enhanced by RF induced DC self bias. In E-MRS 2006 Fall meeting. 1. vyd. Warsaw: EMRS, 2006. s. 14-14. ISBN 83-89-585-09-X.
    Podrobněji: https://is.muni.cz/publication/699195/cs
  127. Mechanické vlastnosti nanokrystalických diamantových vrstev
    BURŠÍKOVÁ, Vilma, Zdeněk FRGALA, Ondřej JAŠEK, Monika KARÁSKOVÁ, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Jiří BURŠÍK, Olga BLÁHOVÁ, Petr KLAPETEK a Jiřina MATĚJKOVÁ. Mechanické vlastnosti nanokrystalických diamantových vrstev. In Vrstvy a povlaky 2006. 1. vyd. Rožnov pod Radhoštěm: Liss a.s., 2006. s. 1-6. ISBN 80-969310-2-4.
    Podrobněji: https://is.muni.cz/publication/699236/cs
  128. Microwave PECVD of nanocrystalline diamond with rf induced bias nucleation
    FRGALA, Zdeněk, Ondřej JAŠEK, Monika KARÁSKOVÁ, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Daniel FRANTA, Jiřina MATĚJKOVÁ, Antonin REK, Petr KLAPETEK a Jiří BURŠÍK. Microwave PECVD of nanocrystalline diamond with rf induced bias nucleation. Czechoslovak Journal of Physics B. Praha: Institute of Physics, AV ČR, 2006, roč. 56, č. 1, s. B1218-B1223, 6 s. ISSN 0011-4626.
    Podrobněji: https://is.muni.cz/publication/698650/cs
  129. Modeling of DLC Optical Properties Based on Parameterization of Density of States
    FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ a Vilma BURŠÍKOVÁ. Modeling of DLC Optical Properties Based on Parameterization of Density of States. In Application of Nanocrystalline Diamond and Diamond Like Carbon Materials. Kolkata, India: Nihar Ranjan Ray, 2006. s. 39-50.
    Podrobněji: https://is.muni.cz/publication/708573/cs
  130. Modeling of optical constants of organosilicon thin films by parameterization of denstity of states
    FRANTA, Daniel, Lenka ZAJÍČKOVÁ, Thomas BEGOU, Angelique BOUSQUET, Agnes GRANIER, Bruno BECHE a Antoine GOULLET. Modeling of optical constants of organosilicon thin films by parameterization of denstity of states. In 4th Workshop Ellipsometry. 2006. vyd. Berlin: Uwe Beck, 2006. s. 110-111, 1 s. ISBN 3-00-018751-0.
    Podrobněji: https://is.muni.cz/publication/710460/cs
  131. Optical characterization of carbon films prepared by PECVD using ellipsometry and reflectometry
    VALTR, Miroslav, Ivan OHLÍDAL a Daniel FRANTA. Optical characterization of carbon films prepared by PECVD using ellipsometry and reflectometry. Czech. J. Phys. Praha: Institute of Physics Academy of Sciences, 2006, roč. 56/2006, Suppl. B, s. 1103 - 1109. ISSN 0011-4626.
    Podrobněji: https://is.muni.cz/publication/694025/cs
  132. Silicon-oxide Containing Diamond-like Carbon Coatings Prepared Using Plasma Enhanced Chemical Vapor Deposition
    BURŠÍKOVÁ, Vilma, Pavel DVOŘÁK, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Jan JANČA, Jiří BURŠÍK, O. BLÁHOVÁ, V. PEŘINA a P. KLAPETEK. Silicon-oxide Containing Diamond-like Carbon Coatings Prepared Using Plasma Enhanced Chemical Vapor Deposition. In Application of Nanocrystalline Diamond and Diamond Like Carbon Materials. Kolkata, India: Nihar Ranjan Ray, 2006. s. 311-315.
    Podrobněji: https://is.muni.cz/publication/708581/cs
  133. Study od Mechanocal Properties of Diamond-like Crabon and Nanocomposite Diamond Coatings Prepared by Several Different Deposition Techniques
    BURŠÍKOVÁ, Vilma, Nihar Ranjan RAY, O. BLÁHOVÁ, J. JAŠEK, Z. FRGALA, L. ZAJÍČKOVÁ, D. FRANTA, J. BURŠÍK a P. KLAPETEK. Study od Mechanocal Properties of Diamond-like Crabon and Nanocomposite Diamond Coatings Prepared by Several Different Deposition Techniques. In Application of Nanocrystalline Diamond and Diamond Like Carbon Materials. Kolkata, India: Nihar Ranjan Ray, 2006. s. 27-37.
    Podrobněji: https://is.muni.cz/publication/708564/cs

    134. 2005

  134. Combination of optical methods and atomic force microscopy at characterization of thin film systems
    OHLÍDAL, Ivan, Daniel FRANTA a Petr KLAPETEK. Combination of optical methods and atomic force microscopy at characterization of thin film systems. Acta physica slovaca. Bratislava: Institute of Physics, SAS, 2005, roč. 55, č. 3, s. 271-294. ISSN 0323-0465.
    Podrobněji: https://is.muni.cz/publication/621521/cs
  135. Comparison of effective medium approximation and Rayleigh-Rice theory concerning ellipsometric characterization of rough surfaces
    FRANTA, Daniel a Ivan OHLÍDAL. Comparison of effective medium approximation and Rayleigh-Rice theory concerning ellipsometric characterization of rough surfaces. Optics Communications. Amsterdam: Elsevier Science, 2005, roč. 248, č. 1, s. 459-467. ISSN 0030-4018.
    Podrobněji: https://is.muni.cz/publication/621520/cs
  136. Ellipsometry in characterization of thin films
    OHLÍDAL, Ivan, Daniel FRANTA a Petr KLAPETEK. Ellipsometry in characterization of thin films. In Proceedings of the SREN 2005. Bratislava, Slovakia: Comenius University, 2005. s. 81-111. ISBN 80-223-2099-4.
    Podrobněji: https://is.muni.cz/publication/630449/cs
  137. Characterization of optical thin films exhibiting defects
    FRANTA, Daniel a Ivan OHLÍDAL. Characterization of optical thin films exhibiting defects. In Advances in Optical Thin Films II. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2005. s. 59632H-1-59632H-12, 12 s. ISBN 0-8194-5981-X.
    Podrobněji: https://is.muni.cz/publication/621764/cs
  138. Influence of silicon, oxygen and nitrogen admixtures on the properies of plasma deposited amorphous diamond-like carbon coating
    BURŠÍKOVÁ, Vilma, Lenka ZAJÍČKOVÁ, Pavel DVOŘÁK, Daniel FRANTA, Vratislav PEŘINA a Jan JANČA. Influence of silicon, oxygen and nitrogen admixtures on the properies of plasma deposited amorphous diamond-like carbon coating. In International Conference ELMECO-5, Book of Abstracts. Lublin, Poland: Lublin University of Technology, 2005. s. 18. ISBN 83-89868-23-7.
    Podrobněji: https://is.muni.cz/publication/575941/cs
  139. Influence of technological conditions on mechanical stresses inside diamond-like carbon films
    OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA, Vlastimil ČUDEK, Vilma BURŠÍKOVÁ, Petr KLAPETEK a Kateřina PÁLENÍKOVÁ. Influence of technological conditions on mechanical stresses inside diamond-like carbon films. Diamond and Related Materials. New York: Elsevier Science S.A., 2005, roč. 14, 11-12, s. 1835-1838. ISSN 0925-9635.
    Podrobněji: https://is.muni.cz/publication/593787/cs
  140. Influence of the temperature on properties of plasma polymerised organosilicon coatings
    KUČEROVÁ, Zuzana, Vilma BURŠÍKOVÁ, Vratislav PEŘINA, Daniel FRANTA, Lenka ZAJÍČKOVÁ, Jan ČECH a Jana FRANCLOVÁ. Influence of the temperature on properties of plasma polymerised organosilicon coatings. In 15th Symposium on applications of plasma processes. Bratislava: Univerzita Komenského, 2005. s. 197-198. ISBN 80-223-2018-8.
    Podrobněji: https://is.muni.cz/publication/568106/cs
  141. Měření mechanického napětí v tenkých vrstvách pomocí kombinované optické metody
    OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA, Vlastimil ČUDEK, Vilma BURŠÍKOVÁ a Martin ŠILER. Měření mechanického napětí v tenkých vrstvách pomocí kombinované optické metody. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 2005, roč. 50, č. 3, s. 72-75. ISSN 0447-6441.
    Podrobněji: https://is.muni.cz/publication/588304/cs
  142. Měření nanodrsnosti pomocí optických metod a mikroskopie atomové síly
    OHLÍDAL, Ivan, Daniel FRANTA a Petr KLAPETEK. Měření nanodrsnosti pomocí optických metod a mikroskopie atomové síly. In Kvalita a GPS 2005. Brno: Subkomise metrologie při TNK 7, 2005. s. 131-139. ISBN 80-214-3033-8.
    Podrobněji: https://is.muni.cz/publication/630447/cs
  143. Optical characterization of double layers containing epitaxial ZnSe and ZnTe films
    ŠILER, Martin, Ivan OHLÍDAL, Daniel FRANTA, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Optical characterization of double layers containing epitaxial ZnSe and ZnTe films. Journal of Modern Optics. London, UK: Taylor and Francis, LtD, 2005, roč. 52, č. 4, s. 583-602. ISSN 0950-0340.
    Podrobněji: https://is.muni.cz/publication/605344/cs
  144. Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions
    FRANTA, Daniel, Ivan OHLÍDAL, Jan MISTÍK, Tomuo YAMAGUCHI, Gu Jin HU a Ning DAI. Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 338-342. ISSN 0169-4332.
    Podrobněji: https://is.muni.cz/publication/621464/cs
  145. Optical Characterization of TiO2 Thin Films by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Photometry
    FRANTA, Daniel, Ivan OHLÍDAL a David PETRÝDES. Optical Characterization of TiO2 Thin Films by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Photometry. Vacuum. USA: ELSEVIER (PERGAMON), 2005, roč. 80, 1-3, s. 159-162. ISSN 0042-207X.
    Podrobněji: https://is.muni.cz/publication/621749/cs
  146. Optical measurement of mechanical stresses in diamond-like carbon films
    OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA, Vladimír ČUDEK, Vilma BURŠÍKOVÁ a Petr KLAPETEK. Optical measurement of mechanical stresses in diamond-like carbon films. In 8-th International Symposium on Laser Metrology. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2005. s. 717-728. ISBN 0-8194-5757-4.
    Podrobněji: https://is.muni.cz/publication/605326/cs
  147. Optical properties of NiO thin films prepared by pulsed laser deposition technique
    FRANTA, Daniel, Beatrice NEGULESCU, Luc THOMAS, Pierre Richard DAHOO, Marcel GUYOT, Ivan OHLÍDAL, Jan MISTRÍK a Tomuo YAMAGUCHI. Optical properties of NiO thin films prepared by pulsed laser deposition technique. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 426-430. ISSN 0169-4332.
    Podrobněji: https://is.muni.cz/publication/621484/cs
  148. Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry
    MISTRÍK, Jan, Tomuo YAMAGUCHI, Daniel FRANTA, Ivan OHLÍDAL, Gu Jin HU a Ning DAI. Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 431-434. ISSN 0169-4332.
    Podrobněji: https://is.muni.cz/publication/621519/cs
  149. Spectroscopic ellipsometry of sinusoidal surface-relief gratings
    ANTOŠ, Roman, Ivan OHLÍDAL, Daniel FRANTA, Petr KLAPETEK, Jan MISTÍK, Tomuo YAMAGUCHI a Štefan VIŠŇOVSKÝ. Spectroscopic ellipsometry of sinusoidal surface-relief gratings. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 221-224. ISSN 0169-4332.
    Podrobněji: https://is.muni.cz/publication/621445/cs
  150. Thermal stability of the optical properties of plasma deposited diamond-like carbon thin films
    FRANTA, Daniel, Vilma BURŠÍKOVÁ, Ivan OHLÍDAL, Lenka ZAJÍČKOVÁ a Pavel SŤAHEL. Thermal stability of the optical properties of plasma deposited diamond-like carbon thin films. Diamond and Related Materials. New York: Elsevier Science S.A., 2005, roč. 14, 11-12, s. 1795-1798. ISSN 0925-9635.
    Podrobněji: https://is.muni.cz/publication/593764/cs

    151. 2004

  151. Complete Characterization of Rough Polymorphous Silicon Films by Atomic Force Microscopy and the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry
    FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK a Pere ROCA I CABARROCAS. Complete Characterization of Rough Polymorphous Silicon Films by Atomic Force Microscopy and the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry. Thin Solid Films. Oxford, UK: Elsevier science, 2004, roč. 455-456, č. 1, s. 399-403. ISSN 0040-6090.
    Podrobněji: https://is.muni.cz/publication/555840/cs
  152. Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy
    FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK a Miloslav OHLÍDAL. Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy. Surface and Interface Analysis. USA: John Wiley & Sons., 2004, roč. 36, č. 8, s. 1203-1206. ISSN 0142-2421.
    Podrobněji: https://is.muni.cz/publication/562878/cs
  153. Influence of Composition, Exposure and Thermal Annealing on Optical Properties of As-S Chalcogenide Thin Films
    OHLÍDAL, Ivan, Daniel FRANTA, Miroslav FRUMAR, Jaroslav JEDELSKÝ a Jaroslav OMASTA. Influence of Composition, Exposure and Thermal Annealing on Optical Properties of As-S Chalcogenide Thin Films. Journal of Optoelectronics and Advanced Materials. Bucharest: INOE & INFM, 2004, roč. 6, č. 1, s. 139-148. ISSN 1454-4164.
    Podrobněji: https://is.muni.cz/publication/555827/cs
  154. Mechanical stresses studied by optical methods in diamond-like carbon films containing Si and O
    OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA, Vladimír ČUDEK, Vilma BURŠÍKOVÁ a Martin ŠILER. Mechanical stresses studied by optical methods in diamond-like carbon films containing Si and O. In SPIE's 49th Annual Meeting. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2004. s. 139-147. ISBN 0-8194-5465-6.
    Podrobněji: https://is.muni.cz/publication/565712/cs
  155. Optical Properties of Diamond-Like Carbon Films Containing SiOx Studied by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry
    FRANTA, Daniel, Ivan OHLÍDAL, Vilma BURŠÍKOVÁ a Lenka ZAJÍČKOVÁ. Optical Properties of Diamond-Like Carbon Films Containing SiOx Studied by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry. Thin Solid Films. Oxford, UK: Elsevier science, 2004, roč. 455-456, č. 1, s. 393-398. ISSN 0040-6090.
    Podrobněji: https://is.muni.cz/publication/555829/cs
  156. Optical properties of ZnTe films prepared by molecular beam epitaxy
    FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Optical properties of ZnTe films prepared by molecular beam epitaxy. Thin Solid Films. Oxford, UK: Elsevier, 2004, roč. 468, 1-2, s. 193-202. ISSN 0040-6090.
    Podrobněji: https://is.muni.cz/publication/562879/cs

    157. 2003

  157. Aplikace mikroskopie atomové síly při analýze tenkých vrstev ZnSe a ZnTe
    OHLÍDAL, Ivan, Petr KLAPETEK a Daniel FRANTA. Aplikace mikroskopie atomové síly při analýze tenkých vrstev ZnSe a ZnTe. Československý časopis pro fyziku. Praha: Fyzikální ústav AV ČR, 2003, roč. 53, č. 2, s. 97-100. ISSN 0009-0700.
    Podrobněji: https://is.muni.cz/publication/487577/cs
  158. Atomic force microscopy characterization of ZnTe epitaxial films
    KLAPETEK, Petr, Ivan OHLÍDAL, Daniel FRANTA, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial films. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 2003, roč. 53, č. 3, s. 223-230. ISSN 0323-0465.
    Podrobněji: https://is.muni.cz/publication/489711/cs
  159. Expression of the optical constants of chalcogenide thin films using the new parameterization dispersion model
    FRANTA, Daniel, Ivan OHLÍDAL, Miloslav FRUMAR a Jaroslav JEDELSKÝ. Expression of the optical constants of chalcogenide thin films using the new parameterization dispersion model. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2003, roč. 212-213, č. 1, s. 116-121. ISSN 0169-4332.
    Podrobněji: https://is.muni.cz/publication/487590/cs
  160. New Dispersion Model of the Optical Constants of the DLC Films
    FRANTA, Daniel, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ a Ivan OHLÍDAL. New Dispersion Model of the Optical Constants of the DLC Films. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 2003, roč. 53, č. 5, s. 373-384. ISSN 0323-0465.
    Podrobněji: https://is.muni.cz/publication/489710/cs
  161. Optical constants of ZnTe and ZnSe epitaxial thin films
    FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Optical constants of ZnTe and ZnSe epitaxial thin films. Acta Physica Slovaca. Bratislava: Institute of Physics SAS, 2003, roč. 53, č. 2, s. 95-104. ISSN 0323-0465.
    Podrobněji: https://is.muni.cz/publication/487588/cs
  162. Optical characterization of ZnSe thin films
    FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Optical characterization of ZnSe thin films. In 19th Congress of the International Commission for Optics: Optics for the Quality of Life. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2003. s. 831-832. ISBN 0-8194-4596-7.
    Podrobněji: https://is.muni.cz/publication/491338/cs
  163. Optical properties of diamond-like carbon films containing SiOx
    FRANTA, Daniel, Ivan OHLÍDAL, Vilma BURŠÍKOVÁ a Lenka ZAJÍČKOVÁ. Optical properties of diamond-like carbon films containing SiOx. Diamond and Related Materials. Amsterdam: Elsevier, 2003, roč. 12, č. 9, s. 1532-1538. ISSN 0925-9635.
    Podrobněji: https://is.muni.cz/publication/489708/cs

    164. 2002

  164. Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method
    KLAPETEK, Petr, Ivan OHLÍDAL, Daniel FRANTA a Pavel POKORNÝ. Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method. Surface and Interface Analysis. USA: John Wiley & Sons, 2002, roč. 34, č. 1, s. 559-564. ISSN 0142-2421.
    Podrobněji: https://is.muni.cz/publication/404727/cs
  165. Applications of atomic force microscopy for thin film boundary measurements
    KLAPETEK, Petr, Ivan OHLÍDAL a Daniel FRANTA. Applications of atomic force microscopy for thin film boundary measurements. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 2002, roč. 47, 6-7, s. 195-199. ISSN 0447-6441.
    Podrobněji: https://is.muni.cz/publication/404728/cs
  166. Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods
    FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK a Pavel POKORNÝ. Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods. Surface and Interface Analysis. USA: John Wiley & Sons, 2002, roč. 34, č. 1, s. 759-762. ISSN 0142-2421.
    Podrobněji: https://is.muni.cz/publication/407667/cs
  167. Influence of overlayers on determination of the optical constants of ZnSe thin films
    FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Influence of overlayers on determination of the optical constants of ZnSe thin films. Journal of Applied Physics. USA: American institute of physics, 2002, roč. 92, č. 4, s. 1873-1880. ISSN 0021-8979.
    Podrobněji: https://is.muni.cz/publication/407666/cs
  168. Optical characterization of diamond like carbon films using multi-sample modification of variable angle spectroscopic ellipsometry
    FRANTA, Daniel, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL, Jan JANČA a Kateřina VELTRUSKÁ. Optical characterization of diamond like carbon films using multi-sample modification of variable angle spectroscopic ellipsometry. Diamond and Related Materials. Amsterdam: Elsevier, 2002, roč. 11, č. 1, s. 105-117. ISSN 0925-9635.
    Podrobněji: https://is.muni.cz/publication/392491/cs
  169. Optical characterization of thin films non-uniform in thickness by a multiple-wavelength reflectance method
    OHLÍDAL, Miloslav, Ivan OHLÍDAL, Daniel FRANTA, Tomáš KRÁLÍK, Miloš JÁKL a Marek ELIÁŠ. Optical characterization of thin films non-uniform in thickness by a multiple-wavelength reflectance method. Surface and Interface Analysis. USA: John Wiley & Sons, 2002, roč. 34, č. 1, s. 660-663. ISSN 0142-2421.
    Podrobněji: https://is.muni.cz/publication/407704/cs

    170. 2001

  170. Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy
    FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Pavel POKORNÝ a Miloslav OHLÍDAL. Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy. Surface and Interface Analysis. USA: John Wiley & Sons, 2001, roč. 32, č. 1, s. 91-94. ISSN 0142-2421.
    Podrobněji: https://is.muni.cz/publication/367252/cs
  171. Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation
    FRANTA, Daniel a Ivan OHLÍDAL. Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation. In 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2001. s. 207-212. ISBN 0-8194-4047-7.
    Podrobněji: https://is.muni.cz/publication/360731/cs
  172. Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method
    OHLÍDAL, Ivan, Daniel FRANTA, Miroslav FRUMAR, Jaroslav JEDELSKÝ a Karel NAVRÁTIL. Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method. Journal of Optoelectronics and Advanced Materials. Bucharest: INOE & INFM, 2001, roč. 3, č. 4, s. 873-878. ISSN 1454-4164.
    Podrobněji: https://is.muni.cz/publication/387372/cs
  173. Determination of Thicknesses and Spectral Dependences of Refractive Indices of Non-Absorbing and Weakly Absorbing Thin Films Using the Wavelengths Related to Extrema in Spectral Reflectances
    OHLÍDAL, Ivan, Daniel FRANTA, Miloslav OHLÍDAL a Karel NAVRÁTIL. Determination of Thicknesses and Spectral Dependences of Refractive Indices of Non-Absorbing and Weakly Absorbing Thin Films Using the Wavelengths Related to Extrema in Spectral Reflectances. Vacuum. USA: ELSEVIER (PERGAMON), 2001, roč. 61, č. 1, s. 285-289. ISSN 0042-207X.
    Podrobněji: https://is.muni.cz/publication/366094/cs
  174. Měření základních statistických veličin náhodné povrchové drsnosti pomocí mikroskopie atomové síly
    OHLÍDAL, Ivan, Daniel FRANTA a Petr KLAPETEK. Měření základních statistických veličin náhodné povrchové drsnosti pomocí mikroskopie atomové síly. Československý časopis pro fyziku. Praha: Fyzikální ústav AV ČR, 2001, roč. 51, č. 1, s. 16-21. ISSN 0009-0700.
    Podrobněji: https://is.muni.cz/publication/366173/cs
  175. Optical Characterization of Diamond-like Carbon Films
    FRANTA, Daniel, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL a Jan JANČA. Optical Characterization of Diamond-like Carbon Films. Vacuum. USA: ELSEVIER (PERGAMON), 2001, roč. 61, 2-4, s. 279-283. ISSN 0042-207X.
    Podrobněji: https://is.muni.cz/publication/366093/cs
  176. Optical characterization of DLC:Si films prepared by PECVD
    FRANTA, Daniel, Vilma BURŠÍKOVÁ a Lenka ZAJÍČKOVÁ. Optical characterization of DLC:Si films prepared by PECVD. In Proceedings of 13th Symposium on Application of Plasma Processes. Bratislava (Slovakia): Dept. of Plasma Physics & Inst. of Physics, Comenius University Bratislava (Slovakia), 2001. s. 87-88. ISBN 80-223-157.
    Podrobněji: https://is.muni.cz/publication/374773/cs
  177. Optical Characterization of Chalcogenide Thin Films
    FRANTA, Daniel, Ivan OHLÍDAL, Miloslav FRUMAR a Jaroslav JEDELSKÝ. Optical Characterization of Chalcogenide Thin Films. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2001, roč. 175-176, č. 1, s. 555-561. ISSN 0169-4332.
    Podrobněji: https://is.muni.cz/publication/366091/cs
  178. Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances
    OHLÍDAL, Ivan, Daniel FRANTA, Miloslav OHLÍDAL a Karel NAVRÁTIL. Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances. Applied Optics. USA: Optical Society of America, 2001, roč. 40, č. 31, s. 5711-5717. ISSN 0003-6935.
    Podrobněji: https://is.muni.cz/publication/378151/cs
  179. Study of Thin Film Defects by Atomic Force Microscopy
    KLAPETEK, Petr, Daniel FRANTA a Ivan OHLÍDAL. Study of Thin Film Defects by Atomic Force Microscopy. In Proceedings of the 4th Seminar on Quantitative Microscopy and 1st Seminar on Nanoscale Calibration Standards and Methods. Braunschweig: Physikalisch-Technische Bundesanstalt, 2001. s. 107-117. ISBN 3-89701-840-3.
    Podrobněji: https://is.muni.cz/publication/401791/cs
  180. Vliv diskrétní Fourierovy transformace na zpracování AFM dat
    KLAPETEK, Petr, Ivan OHLÍDAL a Daniel FRANTA. Vliv diskrétní Fourierovy transformace na zpracování AFM dat. Československý časopis pro fyziku. Praha: Fyzikální ústav AV ČR, 2001, roč. 51, č. 1, s. 49-51. ISSN 0009-0700.
    Podrobněji: https://is.muni.cz/publication/366226/cs
  181. XPS and Ellipsometric Study of DLC/Silicon Interface
    ZAJÍČKOVÁ, Lenka, Kateřina VELTRUSKÁ, Nataliya TSUD a Daniel FRANTA. XPS and Ellipsometric Study of DLC/Silicon Interface. Vacuum. USA: ELSEVIER (PERGAMON), 2001, roč. 61, 2-4, s. 269-273. ISSN 0042-207X.
    Podrobněji: https://is.muni.cz/publication/366095/cs

    182. 2000

  182. Analysis of Slightly Rough Thin Films by Optical Methods and AFM
    FRANTA, Daniel, Ivan OHLÍDAL a Petr KLAPETEK. Analysis of Slightly Rough Thin Films by Optical Methods and AFM. Mikrochim. Acta. Wien: Springer-Verlag, 2000, roč. 132, č. 1, s. 443-447. ISSN 0026-3672.
    Podrobněji: https://is.muni.cz/publication/313891/cs
  183. Analysis of thin films by optical multi-sample methods
    FRANTA, Daniel a Ivan OHLÍDAL. Analysis of thin films by optical multi-sample methods. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 2000, roč. 50, č. 4, s. 411-421. ISSN 0323-0465.
    Podrobněji: https://is.muni.cz/publication/329671/cs
  184. Atomic force microscopy measurements of surface roughness quantities important in optics of surfaces and thin films
    OHLÍDAL, Ivan, Daniel FRANTA a Petr KLAPETEK. Atomic force microscopy measurements of surface roughness quantities important in optics of surfaces and thin films. In Proceedings of the 4th Seminar on Quantitative Microscopy. Braunschweig: Physikalisch-Technische Bundesanstalt, 2000. s. 124-131. ISBN 3-89701-503-X.
    Podrobněji: https://is.muni.cz/publication/321011/cs
  185. Ellipsometry of Thin Film Systems
    OHLÍDAL, Ivan a Daniel FRANTA. Ellipsometry of Thin Film Systems. In Progress in Optics, Vol. 41 (Ed. E. Wolf). 1. vyd. Amsterdam: Elsevier, 2000. s. 181-282. ISBN 0-444-568-7.
    Podrobněji: https://is.muni.cz/publication/345405/cs
  186. Matrix formalism for imperfect thin films
    OHLÍDAL, Ivan a Daniel FRANTA. Matrix formalism for imperfect thin films. Acta physica slovaca. Bratislava: Institute of Physics, SAS, 2000, roč. 50, č. 4, s. 489-500. ISSN 0323-0465.
    Podrobněji: https://is.muni.cz/publication/329651/cs
  187. Optical characterization of inhomogeneous thin films of ZrO2 by spectroscopic ellipsometry and spectroscopic reflectometry
    FRANTA, Daniel a Ivan OHLÍDAL. Optical characterization of inhomogeneous thin films of ZrO2 by spectroscopic ellipsometry and spectroscopic reflectometry. Surface and Interface Analysis. USA: John Wiley & Sons, 2000, roč. 30, č. 1, s. 574-579. ISSN 0142-2421.
    Podrobněji: https://is.muni.cz/publication/334911/cs
  188. Optical characterization of thin films with randomly rough boundaries using the photovoltage method
    PAVELKA, Radek, Ivan OHLÍDAL, Jan HLÁVKA, Daniel FRANTA a Helmut SITTER. Optical characterization of thin films with randomly rough boundaries using the photovoltage method. Thin Solid Films. UK Oxford: Elsevier science, 2000, roč. 366, č. 1, s. 43-50. ISSN 0040-6090.
    Podrobněji: https://is.muni.cz/publication/329691/cs

    189. 1999

  189. Comparison of optical and non-optical methods for measuring surface roughness
    OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA a Miroslav TYKAL. Comparison of optical and non-optical methods for measuring surface roughness. In Proceedings of SPIE 3820, 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1999. s. 456-467. ISBN 0-8194-3306-3.
    Podrobněji: https://is.muni.cz/publication/207571/cs
  190. Complete Optical Characterization of the SiO2/Si System by Spectroscopic Ellipsometry Spectroscopic Reflectometry and Atomic Force Microscopy
    OHLÍDAL, Ivan, Daniel FRANTA, Emil PINČÍK a Miloslav OHLÍDAL. Complete Optical Characterization of the SiO2/Si System by Spectroscopic Ellipsometry Spectroscopic Reflectometry and Atomic Force Microscopy. Surface and Interface Analysis. USA: John Wiley & Sons, 1999, roč. 28, č. 1, s. 240-244. ISSN 0142-2421.
    Podrobněji: https://is.muni.cz/publication/208731/cs
  191. Determination of the basic parameters characterizing the roughness of metal surfaces by laser light scattering
    OHLÍDAL, Miloslav, Marek UNČOVSKÝ, Ivan OHLÍDAL a Daniel FRANTA. Determination of the basic parameters characterizing the roughness of metal surfaces by laser light scattering. Journal of modern optics. Londýn: Taylor & Francis Ltd., 1999, roč. 46, č. 2, s. 279-293. ISSN 0950-0340.
    Podrobněji: https://is.muni.cz/publication/206064/cs
  192. Characterisation of DLC Films Prepared by PECVD
    FRANTA, Daniel a Lenka ZAJÍČKOVÁ. Characterisation of DLC Films Prepared by PECVD. In Proceedings of 12th Symposium on Application of Plasma Processes. Bratislava: Comenius University, Bratislava, Slovakia, 1999. s. 158-159. ISBN 80-223-1370-X.
    Podrobněji: https://is.muni.cz/publication/234131/cs
  193. Relationship Between AFM and Optical Measurements at Analyzing Surface Roughness
    OHLÍDAL, Ivan, Daniel FRANTA, Petr KLAPETEK a Martin VIČAR. Relationship Between AFM and Optical Measurements at Analyzing Surface Roughness. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 1999, roč. 44, č. 10, s. 307-311. ISSN 0447-6441.
    Podrobněji: https://is.muni.cz/publication/211391/cs
  194. The influence of substrate emissivity on plasma enhanced CVD of diamond-like carbon films
    ZAJÍČKOVÁ, Lenka, Vilma BURŠÍKOVÁ a Daniel FRANTA. The influence of substrate emissivity on plasma enhanced CVD of diamond-like carbon films. Czechoslovak Journal of Physics. Praha, 1999, roč. 49, č. 8, s. 1213-1228. ISSN 0011-4626.
    Podrobněji: https://is.muni.cz/publication/207851/cs

    195. 1998

  195. Analysis of thin films with slightly rough boundaries
    OHLÍDAL, Ivan, Daniel FRANTA, Jaroslav HORA, Karel NAVRÁTIL, Jan WEBER a Pavel JANDA. Analysis of thin films with slightly rough boundaries. Mikrochim. Acta. Wien: Springer-Verlag, 1998, Suppl. 15, č. 1, s. 177-180. ISSN 0026-3672.
    Podrobněji: https://is.muni.cz/publication/200406/cs
  196. Comparison of AFM and optical methods at measuring nanometric surface roughness
    OHLÍDAL, Ivan, Daniel FRANTA, Miloslav OHLÍDAL, Martin VIČAR a Petr KLAPETEK. Comparison of AFM and optical methods at measuring nanometric surface roughness. In Proceedings of the 3th Seminar on Quantitative Microscopy. Braunschweig, SRN: Physikalisch-Technische Bundesanstalt, 1998. s. 123-129. ISBN 3-89701-280-4.
    Podrobněji: https://is.muni.cz/publication/206012/cs
  197. Ellipsometric parameters and reflectances of thin films with slightly rough boundaries
    FRANTA, Daniel a Ivan OHLÍDAL. Ellipsometric parameters and reflectances of thin films with slightly rough boundaries. Journal of modern optics. Londýn: Taylor & Francis Ltd., 1998, roč. 45, č. 5, s. 903-934. ISSN 0950-0340.
    Podrobněji: https://is.muni.cz/publication/206016/cs
  198. Ellipsometry of thin films
    OHLÍDAL, Ivan a Daniel FRANTA. Ellipsometry of thin films. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 1998, roč. 48, č. 4, s. 459-468. ISSN 0323-0465.
    Podrobněji: https://is.muni.cz/publication/200399/cs
  199. Rubidium lodide (RbI)
    OHLÍDAL, Ivan a Daniel FRANTA. Rubidium lodide (RbI). In Handbook of Optical Constants of Solids III. San Diego, USA: Academic Press, 1998. s. 857-870. ISBN 0-12-544423-0.
    Podrobněji: https://is.muni.cz/publication/197819/cs
  200. Srovnání výsledků měření drsnosti povrchu dosažených vybranými optickými metodami a metodou profilometrickou
    OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA, Miroslav TYKAL, Dominik PRAŽÁK a Aleš MICHÁLEK. Srovnání výsledků měření drsnosti povrchu dosažených vybranými optickými metodami a metodou profilometrickou. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 1998, roč. 43, č. 4, s. 130-136. ISSN 0447-6441.
    Podrobněji: https://is.muni.cz/publication/200581/cs
  201. Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries
    FRANTA, Daniel a Ivan OHLÍDAL. Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries. Optics Communications. Amsterdam: Elsevier Science, 1998, roč. 147, č. 1, s. 349-358. ISSN 0030-4018.
    Podrobněji: https://is.muni.cz/publication/206015/cs

    202. 1997

  202. Analysis of single layers placed on slightly rough surfaces by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy
    OHLÍDAL, Ivan, Daniel FRANTA, Bohuslav REZEK a Miloslav OHLÍDAL. Analysis of single layers placed on slightly rough surfaces by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy. In ECASIA 97 - 7th European Conference on Applications of Surface and Interface Analysis. Chichester, England, UK: John Willey & Sons, 1997. s. 1051-1054. ISBN 0-471-97827-2.
    Podrobněji: https://is.muni.cz/publication/197818/cs

    203. 1996

  203. Method of shearing interferometry for characterizing non-gaussian randomly rough surfaces
    OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA a Aleš MICHÁLEK. Method of shearing interferometry for characterizing non-gaussian randomly rough surfaces. In Specification, Production, and Testing of Optical Components and Systems. USA: SPIE - The International Society for Optical Engineering, 1996. s. 442-451. ISBN 0-8194-2160-X.
    Podrobněji: https://is.muni.cz/publication/197821/cs
  204. Spectroscopic Ellipsometry of Slightly Rough Surfaces Covered by Layers
    OHLÍDAL, Ivan, Daniel FRANTA a Jaroslav HORA. Spectroscopic Ellipsometry of Slightly Rough Surfaces Covered by Layers. In ECASIA 95 - 6th European Conference on Applications of Surface and Interface Analysis. Chichester, England, UK: John Willey & Sons, 1996. s. 823-826. ISBN 0-471-95899-9.
    Podrobněji: https://is.muni.cz/publication/197476/cs
  205. Spektroskopická elipsometrie slabě drsných povrchů
    FRANTA, Daniel, Ivan OHLÍDAL, Jaroslav HORA a Karel NAVRÁTIL. Spektroskopická elipsometrie slabě drsných povrchů. In 12. konference českých a slovenských fyziků. Ostrava: Fyzikální vědecká sekce Jednoty českých matematiků a fyziků, 1996. s. 482-485.
    Podrobněji: https://is.muni.cz/publication/484630/cs

    206. 1995

  206. A method of shearing interferometry for determining the statistical quantities of randomly rough surfaces of solids
    OHLÍDAL, Miloslav, Ivan OHLÍDAL, Miloslav DRUCKMÜLLER a Daniel FRANTA. A method of shearing interferometry for determining the statistical quantities of randomly rough surfaces of solids. Pure Appl. Opt. UK: Publishing Ltd, 1995, roč. 4, č. 5, s. 599-616. ISSN 0963-9659.
    Podrobněji: https://is.muni.cz/publication/197252/cs
  207. Interferometry of Randomly Rough Surfaces
    OHLÍDAL, Miloslav, Ivan OHLÍDAL, Miloslav DRUCKMÜLLER a Daniel FRANTA. Interferometry of Randomly Rough Surfaces. In Photonics '95. Czech Republic: European Optical Society, 1995. s. 109-111.
    Podrobněji: https://is.muni.cz/publication/206281/cs
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