Masarykova univerzita

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Filtrování publikací

    2020

  1. OHLÍDAL, Ivan, Jiří VOHÁNKA, Vilma BURŠÍKOVÁ, Daniel FRANTA a Martin ČERMÁK. Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers. Optics Express, Washington, D.C.: OPTICAL SOC AMER, 2020, roč. 28, č. 1, s. 160-174. ISSN 1094-4087. doi:10.1364/OE.28.000160.
  2. 2019

  3. OHLÍDAL, Ivan, Jiří VOHÁNKA, Daniel FRANTA, Martin ČERMÁK, Jaroslav ŽENÍŠEK a Petr VAŠINA. Approximate methods for the optical characterization of inhomogeneous thin films: Applications to silicon nitride films. Journal of Electrical Engineering, Slovenská technická univezita v Bratislavě, 2019, roč. 70, č. 7, s. 16-26. ISSN 1335-3632. doi:10.2478/jee-2019-0037.
  4. OHLÍDAL, Ivan, Jiří VOHÁNKA, Jan MISTRÍK, Martin ČERMÁK, František VIŽĎA a Daniel FRANTA. Approximations of reflection and transmission coefficients of inhomogeneous thin films based on multiple-beam interference model. Thin Solid Films, Elsevier, 2019, roč. 692, 31 December 2019, s. 1-17. ISSN 0040-6090. doi:10.1016/j.tsf.2019.03.001.
  5. OHLÍDAL, Ivan, Jiří VOHÁNKA, Martin ČERMÁK a Daniel FRANTA. Combination of spectroscopic ellipsometry and spectroscopic reflectometry with including light scattering in the optical characterization of randomly rough silicon surfaces covered by native oxide layers. Surface Topography: Metrology and Properties, BRISTOL: OP PUBLISHING LTD, 2019, roč. 7, č. 4, s. 1-12. ISSN 2051-672X. doi:10.1088/2051-672x/ab359d.
  6. VOHÁNKA, Jiří, Martin ČERMÁK, Daniel FRANTA a Ivan OHLÍDAL. Efficient method to calculate the optical quantities of multi-layer systems with randomly rough boundaries using the Rayleigh Rice theory. Physica Scripta, Bristol: IOP Publishing Ltd., 2019, roč. 94, č. 4, s. 1-22. ISSN 0031-8949. doi:10.1088/1402-4896/aafbc1.
  7. OHLÍDAL, Ivan, Jiří VOHÁNKA, Vilma BURŠÍKOVÁ, Jaroslav ŽENÍŠEK, Petr VAŠINA, Martin ČERMÁK a Daniel FRANTA. Optical characterization of inhomogeneous thin films containing transition layers using the combined method of spectroscopic ellipsometry and spectroscopic reflectometry based on multiple-beam interference model. Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics, 2019, roč. 37, č. 6, s. "062921-1"-"062921-10". ISSN 2166-2746. doi:10.1116/1.5122014.
  8. VOHÁNKA, Jiří, Ivan OHLÍDAL, Miloslav OHLÍDAL, Štěpán ŠUSTEK, Martin ČERMÁK, Václav ŠULC, Petr VAŠINA, Jaroslav ŽENÍŠEK a Daniel FRANTA. Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects. Coatings, Basel: MDPI, 2019, roč. 9, č. 7, s. 1-21. ISSN 2079-6412. doi:10.3390/coatings9070416.
  9. FRANTA, Daniel, Jiří VOHÁNKA, Martin BRÁNECKÝ, Pavel FRANTA, Martin ČERMÁK, Ivan OHLÍDAL a Vladimír ČECH. Optical properties of the crystalline silicon wafers described using the universal dispersion model. Journal of Vacuum Science & Technology B, New York: A V S AMER INST PHYSICS, 2019, roč. 37, č. 6, s. "062907-1"-"062907-14". ISSN 2166-2746. doi:10.1116/1.5122284.
  10. FRANTA, Daniel, Jiří VOHÁNKA, Martin ČERMÁK, Pavel FRANTA a Ivan OHLÍDAL. Temperature dependent dispersion models applicable in solid state physics. Journal of Electrical Engineering, Slovenská technická univezita v Bratislavě, 2019, roč. 70, č. 7, s. 1-15. ISSN 1335-3632. doi:10.2478/jee-2019-0036.
  11. 2018

  12. FRANTA, Daniel, Pavel FRANTA, Jiří VOHÁNKA, Martin ČERMÁK a Ivan OHLÍDAL. Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region. Journal of Applied Physics, 2018, roč. 123, č. 18, s. 185707-185717. ISSN 0021-8979. doi:10.1063/1.5026195.
  13. OHLÍDAL, Ivan, Jiří VOHÁNKA, Jan MISTRÍK, Martin ČERMÁK a Daniel FRANTA. Different theoretical approaches at optical characterization of randomly rough silicon surfaces covered with native oxide layers. Surface and Interface Analysis, Wiley, 2018, roč. 50, č. 11, s. 1230-1233. ISSN 0142-2421. doi:10.1002/sia.6463.
  14. OHLÍDAL, Ivan, Jiří VOHÁNKA, Martin ČERMÁK a Daniel FRANTA. Ellipsometry of Layered Systems. In Olaf Stenzel, Miloslav Ohlídal. Optical Characterization of Thin Solid Films. Cham: Springer, 2018. s. 233-267, 35 s. Springer Series in Surface Sciences, volume 64. ISBN 978-3-319-75324-9. doi:10.1007/978-3-319-75325-6_9.
  15. OHLÍDAL, Ivan, Martin ČERMÁK a Jiří VOHÁNKA. Optical Characterization of Thin Films Exhibiting Defects. In Olaf Stenzel, Miloslav Ohlídal. Optical Characterization of Thin Solid Films. Cham: Springer, 2018. s. 271-313, 43 s. Springer Series in Surface Sciences, volume 64. ISBN 978-3-319-75324-9. doi:10.1007/978-3-319-75325-6_10.
  16. ČERMÁK, Martin, Jiří VOHÁNKA, Ivan OHLÍDAL a Daniel FRANTA. Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory. Journal of modern optics, Taylor & Francis, 2018, roč. 65, č. 14, s. 1720-1736. ISSN 0950-0340. doi:10.1080/09500340.2018.1457187.
  17. VOHÁNKA, Jiří, Ivan OHLÍDAL, Jaroslav ŽENÍŠEK, Petr VAŠINA, Martin ČERMÁK a Daniel FRANTA. Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization. Surface and Interface Analysis, Wiley, 2018, roč. 50, č. 7, s. 757-765. ISSN 0142-2421. doi:10.1002/sia.6473.
  18. 2017

  19. VODÁK, Jiří, David NEČAS, Miloslav OHLÍDAL a Ivan OHLÍDAL. Determination of local thickness values of non-uniform thin films by imaging spectroscopic reflectometer with enhanced spatial resolution. Measurement Science and Technology, Bristol: IOP PUBLISHING LTD, 2017, roč. 28, č. 2, s. nestránkováno. ISSN 0957-0233. doi:10.1088/1361-6501/aa5534.
  20. FRANTA, Daniel, Martin ČERMÁK, Jiří VOHÁNKA a Ivan OHLÍDAL. Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model. Thin Solid Films, LAUSANNE, SWITZERLAND: ELSEVIER SCIENCE SA, 2017, roč. 631, June, s. 12-22. ISSN 0040-6090. doi:10.1016/j.tsf.2017.03.051.
  21. OHLÍDAL, Ivan, Daniel FRANTA a David NEČAS. Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness. Applied Surface Science, AMSTERDAM, NETHERLANDS: Elsevier Science BV, 2017, roč. 421, November, s. 687-696. ISSN 0169-4332. doi:10.1016/j.apsusc.2016.10.186.
  22. FRANTA, Daniel, Minna Paula Katriina KOTILAINEN, Richard KRUMPOLEC a Ivan OHLÍDAL. Optical characterization of hafnia films deposited by ALD on copper cold-rolled sheets by difference ellipsometry. Applied Surface Science, AMSTERDAM: ELSEVIER SCIENCE BV, 2017, roč. 421, November, s. 420-423. ISSN 0169-4332. doi:10.1016/j.apsusc.2016.12.164.
  23. OHLÍDAL, Ivan, Jiří VOHÁNKA, Martin ČERMÁK a Daniel FRANTA. Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh-Rice theory. Applied Surface Science, AMSTERDAM: Elsevier Science, 2017, roč. 419, October, s. 942-956. ISSN 0169-4332. doi:10.1016/j.apsusc.2017.04.211.
  24. FRANTA, Daniel, Adam DUBROKA, Chennan WANG, Angelo GIGLIA, Jiří VOHÁNKA, Pavel FRANTA a Ivan OHLÍDAL. Temperature-dependent dispersion model of float zone crystalline silicon. Applied Surface Science, Amsterdam: Elsevier Science, 2017, roč. 421, November, s. 405-419. ISSN 0169-4332. doi:10.1016/j.apsusc.2017.02.021.
  25. FRANTA, Daniel, David NEČAS, Angelo GIGLIA, Pavel FRANTA a Ivan OHLÍDAL. Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride. Applied Surface Science, Amsterdam: Elsevier Science, 2017, roč. 421, November, s. 424-429. ISSN 0169-4332. doi:10.1016/j.apsusc.2016.09.149.
  26. 2016

  27. SIEFKE, Thomas, Stefanie KROKER, Kristin PFEIFFER, Oliver PUFFKY, Kay DIETRICH, Daniel FRANTA, Ivan OHLÍDAL, Adriana SZEGHALMI, Ernst-Bernhard KLEY a Andreas TÜNNERMANN. Materials Pushing the Application Limits of Wire Grid Polarizers further into the Deep Ultraviolet Spectral Range. Advanced Optical Materials, 2016, roč. 4, č. 11, s. 1780-1786. ISSN 2195-1071. doi:10.1002/adom.201600250.
  28. FRANTA, Daniel, David NEČAS, Ivan OHLÍDAL a Angelo GIGLIA. Optical characterization of SiO2 thin films using universal dispersion model over wide spectral range. In Gorecki, C; Asundi, AK; Osten, W. Conference on Optical Micro- and Nanometrology VI. 9890. vyd. BELLINGHAM: SPIE-INT SOC OPTICAL ENGINEERING, 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA, 2016. s. "989014-1"-"989014-15", 15 s. ISBN 978-1-5106-0135-2. doi:10.1117/12.2227580.
  29. NEČAS, David, Ivan OHLÍDAL, Daniel FRANTA, M. OHLIDAL a J. VODAK. Simultaneous determination of optical constants, local thickness and roughness of ZnSe thin films by imaging spectroscopic reflectometry. Journal of Optics, Bristol: IOP Publishing, 2016, roč. 18, č. 1, s. nestránkováno. ISSN 2040-8978. doi:10.1088/2040-8978/18/1/015401.
  30. 2015

  31. FRANTA, Daniel, David NEČAS, Ivan OHLÍDAL a Angelo GIGLIA. Dispersion model for optical thin films applicable in wide spectral range. In Duparre, A; Geyl, R. Conference on Optical Systems Design - Optical Fabrication, Testing, and Metrology V. 9628. vyd. BELLINGHAM, USA: SPIE-INT SOC OPTICAL ENGINEERING, 2015. s. "96281U-1"-"96281U-12", 12 s. ISBN 978-1-62841-817-0. doi:10.1117/12.2190104.
  32. OHLÍDAL, Miloslav, Ivan OHLÍDAL, David NEČAS, Jiří VODÁK, Daniel FRANTA, Pavel NÁDASKÝ a František VIŽĎA. Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films. In Duparre, A; Geyl, R. Conference on Optical Systems Design - Optical Fabrication, Testing, and Metrology V. 9628. vyd. BELLINGHAM, USA: SPIE-INT SOC OPTICAL ENGINEERING, 2015. s. "96280R-1"-"96280R-13", 13 s. ISBN 978-1-62841-817-0. doi:10.1117/12.2191052.
  33. NEČAS, David, Jiří VODÁK, Ivan OHLÍDAL, Miloslav OHLÍDAL, Abhijit MAJUMDAR a Lenka ZAJÍČKOVÁ. Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry. Applied Surface Science, Elsevier, 2015, roč. 350, SEP, s. 149-155. ISSN 0169-4332. doi:10.1016/j.apsusc.2015.01.093.
  34. NEČAS, David, Ivan OHLÍDAL, Jiří VODÁK, Miloslav OHLÍDAL a Daniel FRANTA. Simultaneous determination of optical constants, local thickness, and local roughness of thin films by imaging spectroscopic reflectometry. In Duparre, A; Geyl, R. Conference on Optical Systems Design - Optical Fabrication, Testing, and Metrology V. 9628. vyd. BELLINGHAM, USA: SPIE-INT SOC OPTICAL ENGINEERING, 2015. s. "96280C-1"-"96280C-9", 9 s. ISBN 978-1-62841-817-0. doi:10.1117/12.2190091.
  35. FRANTA, Daniel, David NEČAS a Ivan OHLÍDAL. Universal dispersion model for characterization of optical thin films over wide spectral range: Application to hafnia. Applied Optics, 2015, roč. 54, č. 31, s. 9108-9112. ISSN 1559-128X. doi:10.1364/AO.54.009108.
  36. FRANTA, Daniel, David NEČAS, Ivan OHLÍDAL a Jiří JANKUJ. Wide spectral range characterization of antireflective coatings and their optimization. In Duparre, A; Geyl, R. Conference on Optical Systems Design - Optical Fabrication, Testing, and Metrology V. 9628. vyd. BELLINGHAM, USA: SPIE-INT SOC OPTICAL ENGINEERING, 2015. s. "96280F-1"-"96280F-14", 14 s. ISBN 978-1-62841-817-0. doi:10.1117/12.2190109.
  37. 2014

  38. BŘEZINA, Jaromír a Ivan OHLÍDAL. Antireflexní vrstva z materiálů Al2O3/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm. 2014.
  39. NEČAS, David, Ivan OHLÍDAL, Daniel FRANTA, Vladimír ČUDEK, Miloslav OHLÍDAL, Jiří VODÁK, Lucia SLÁDKOVÁ, Lenka ZAJÍČKOVÁ, Marek ELIÁŠ a František VIZĎA. Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry. Thin Solid Films, Lausanne: Elsevier Science, 2014, roč. 571, november, s. 573-578. ISSN 0040-6090. doi:10.1016/j.tsf.2013.12.036.
  40. FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ a Ivan OHLÍDAL. Broadening of dielectric response and sum rule conservation. Thin Solid Films, Lausanne: Elsevier Science, 2014, roč. 571, November, s. 496-501. ISSN 0040-6090. doi:10.1016/j.tsf.2013.11.148.
  41. NEČAS, David a Ivan OHLÍDAL. Consolidated series for efficient calculation of the reflection and transmission in rough multilayers. Optics Express, WASHINGTON: Optical Socienty of America, 2014, roč. 22, č. 4, s. 4499-4515. ISSN 1094-4087. doi:10.1364/OE.22.004499.
  42. FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ a Ivan OHLÍDAL. Dispersion model of two-phonon absorption: application to c-Si. OPTICAL MATERIALS EXPRESS, WASHINGTON: OPTICAL SOC AMER, 2014, roč. 4, č. 8, s. 1641-1656. ISSN 2159-3930. doi:10.1364/OME.4.001641.
  43. OHLÍDAL, Ivan, Daniel FRANTA a David NEČAS. Improved combination of scalar diffraction theory and Rayleigh-Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces. Thin Solid Films, Lausanne: Elsevier Science, 2014, roč. 571, November, s. 695-700. ISSN 0040-6090. doi:10.1016/j.tsf.2014.02.092.
  44. NEČAS, David, Ivan OHLÍDAL, Daniel FRANTA, Miloslav OHLÍDAL, Vladimír ČUDEK a Jiří VODÁK. Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films. Applied Optics, USA: Optical Society of America, 2014, roč. 53, č. 25, s. 5606-5614. ISSN 1559-128X. doi:10.1364/AO.53.005606.
  45. FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ a Ivan OHLÍDAL. Utilization of the sum rule for construction of advanced dispersion model of crystalline silicon containing interstitial oxygen. Thin Solid Films, Lausanne: Elsevier Science, 2014, roč. 571, november, s. 490-495. ISSN 0040-6090. doi:10.1016/j.tsf.2014.03.059.
  46. 2013

  47. FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL a Jiří STUCHLÍK. Advanced modeling for optical characterization of amorphous hydrogenated silicon films. Thin Solid Films, Lausanne: Elsevier Science, 2013, roč. 541, Aug, s. 12-16. ISSN 0040-6090. doi:10.1016/j.tsf.2013.04.129.
  48. FRANTA, Daniel, David NEČAS, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL, Jiří STUCHLÍK a Dagmar CHVOSTOVA. Application of sum rule to the dispersion model of hydrogenated amorphous silicon. Thin Solid Films, Lausanne: Elsevier Science, 2013, roč. 539, Jul, s. 233-244. ISSN 0040-6090. doi:10.1016/j.tsf.2013.04.012.
  49. NEČAS, David, Daniel FRANTA, Ivan OHLÍDAL, Aleš PORUBA a Petr WOSTRÝ. Ellipsometric characterization of inhomogeneous non-stoichiometric silicon nitride films. Surface and Interface Analysis, Hoboken: WILEY-BLACKWELL, 2013, roč. 45, č. 7, s. 1188-1192. ISSN 0142-2421. doi:10.1002/sia.5250.
  50. 2011

  51. FRANTA, Daniel, David NEČAS a Ivan OHLÍDAL. Anisotropy-enhanced depolarization on transparent film/substrate system. Thin Solid Films, Elsevier, 2011, roč. 519, č. 9, s. 2637-2640. ISSN 0040-6090. doi:10.1016/j.tsf.2010.12.113.
  52. NEČAS, David, Daniel FRANTA, Vilma BURŠÍKOVÁ a Ivan OHLÍDAL. Ellipsometric characterisation of thin films non-uniform in thickness. Thin Solid Films, Elsevier, 2011, roč. 519, č. 9, s. 2715-2717. ISSN 0040-6090. doi:10.1016/j.tsf.2010.12.065.
  53. OHLÍDAL, Miloslav, Ivan OHLÍDAL, Petr KLAPETEK, David NEČAS a Abhijit MAJUMDAR. Measurement of the thickness distribution and optical constants of non-uniform thin films. Measurement Science and Technology, Bristol, England: IOP Publishing, 2011, roč. 22, č. 8, s. "nestránkováno". ISSN 0957-0233. doi:10.1088/0957-0233/22/8/085104.
  54. OHLÍDAL, Ivan, Miloslav OHLÍDAL, David NEČAS, Daniel FRANTA a Vilma BURŠÍKOVÁ. Optical characterisation of SiOxCyHz thin films non-uniform in thickness using spectroscopic ellipsometry, spectroscopic reflectometry and spectroscopic imaging reflectometry. Thin Solid Films, Elsevier, 2011, roč. 519, č. 9, s. 2874-2876. ISSN 0040-6090. doi:10.1016/j.tsf.2010.12.069.
  55. FRANTA, Daniel, Ivan OHLÍDAL, David NEČAS, František VIŽĎA, Ondřej CAHA, Martin HASOŇ a Pavel POKORNÝ. Optical characterization of HfO2 thin films. Thin Solid Films, Oxford, UK: Elsevier, 2011, roč. 519, č. 18, s. 6085–6091. ISSN 0040-6090. doi:10.1016/j.tsf.2011.03.128.
  56. NEČAS, David, Ivan OHLÍDAL a Daniel FRANTA. Variable-angle spectroscopic ellipsometry of considerably non-uniform thin films. Journal of Optics, Bristol: IOP Publishing, 2011, roč. 13, č. 8, s. "nestránkováno". ISSN 2040-8978. doi:10.1088/2040-8978/13/8/085705.
  57. 2010

  58. MOCANU, Valentin, Vilma BURŠÍKOVÁ, Adrian STOICA, Vratislav PEŘINA, Daniel FRANTA, David NEČAS, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL a Miloslav OHLÍDAL. Development of transparent protective coatings on polycarbonate substrates using PECVD. In Twelfth International Conference on Plasma Surface Engineering, 2010. 2010.
  59. 2009

  60. OHLÍDAL, Miloslav, Ivan OHLÍDAL, Petr KLAPETEK, David NEČAS a Vilma BURŠÍKOVÁ. Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond-like carbon films. Diamond and Related Materials, New York: Elsevier Science S.A., 2009, roč. 18, 2-3, s. 384-387. ISSN 0925-9635.
  61. FRANTA, Daniel, David NEČAS, Ivan OHLÍDAL, Martin HRDLIČKA, Martin PAVLIŠTA, Miloslav FRUMAR a Miloslav OHLÍDAL. Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films. Journal of Optoelectronics and Advanced Materials, Bucharest: INOE & INFM, 2009, roč. 11, č. 12, s. 1891-1898. ISSN 1454-4164.
  62. OHLÍDAL, Ivan, David NEČAS, Daniel FRANTA a Vilma BURŠÍKOVÁ. Characterization of non-uniform diamond-like carbon films by spectroscopic ellipsometry. Diamond and Related Materials, New York: Elsevier Science S.A., 2009, roč. 18, 2-3, s. 364-367. ISSN 0925-9635. doi:10.1016/j.diamond.2008.09.003.
  63. VIZDA, Frantisek, Ivan OHLÍDAL a Vojtech HRUBY. Influence of Cross-Correlation of Rough Boundaries on Reflectance of Thin Films on GaAs and Si Substrates. In Caldas, M. J. ; Studart, N.. PHYSICS OF SEMICONDUCTORS. MELVILLE: AMER INST PHYSICS, 2009. s. 19-20, 2 s. ISBN 978-0-7354-0736-7. doi:10.1063/1.3295367.
  64. OHLÍDAL, Miloslav, Ivan OHLÍDAL, Petr KLAPETEK a David NEČAS. Precise measurement of thickness distribution of non-uniform thin films by imaging spectroscopic reflectometry. In Proceedings of IMEKO XIX World Congress. Lisabon: IMEKO, 2009. s. 100-105, 6 s. ISBN 978-963-88410-0-1.
  65. NEČAS, David, Ivan OHLÍDAL a Daniel FRANTA. Reflectance of non-uniform thin films. Journal of Optics A: Pure and Applied Optics, Bristol, GB: IOP Publishing Ltd, 2009, roč. 11, č. 4, s. 1-9. ISSN 1464-4258.
  66. 2008

  67. BURSIKOVA, Vilma, Vratislav PERINA, Jaroslav SOBOTA, Jan GROSSMAN, Petr KLAPETEK, Jiri BURSIK, Daniel FRANTA, Ivan OHLIDAL, Lenka ZAJICKOVA, Josef HAVEL a Jan JANCA. Characterization of nanostructured diamond-like carbon coatings deposited in single and dual frequency capacitive discharges. In 2nd conference on New Diamond and Nano Carbons 2008. 2008.
  68. FRANTA, Daniel, Ivan OHLÍDAL a David NEČAS. Influence of cross-correlation effects on the optical quantities of rough films. Optics Express, elektronicky: Optical Society of America, 2008, roč. 16, č. 11, s. 7789–7803. ISSN 1094-4087.
  69. OHLÍDAL, Ivan a David NEČAS. Influence of shadowing on ellipsometric quantities of randomly rough surfaces and thin films. Journal of modern optics, Londýn: Taylor & Francis Ltd., 2008, roč. 55, č. 7, s. 1077-1099. ISSN 0950-0340.
  70. BURSIKOVA, Vilma, Miroslav VALTR, Petr KLAPETEL, Jiri BURSIK, Olga BLAHOVA a Ivan OHLIDAL. Nanoindentation studies on amorphous carbon films prepared using plasma enchanced chemical vapor deposition. 2008.
  71. OHLÍDAL, Ivan, David NEČAS, Vilma BURŠÍKOVÁ, Daniel FRANTA a Miloslav OHLÍDAL. Optical characterization of diamond-like carbon thin films non-uniform in thickness using spectroscopic reflectometry. Diamond and Related Materials, New York: Elsevier, 2008, roč. 17, č. 1, s. 709–712. ISSN 0925-9635.
  72. NEČAS, David, Vratislav PEŘINA, Daniel FRANTA, Ivan OHLÍDAL a Josef ZEMEK. Optical characterization of non-stoichiometric silicon nitride films. physica status solidi (c), Weinheim: WILEY-VCH Verlag GmbH, 2008, roč. 5, č. 5, s. 1320-1323. ISSN 1610-1634.
  73. FRANTA, Daniel, Martin HRDLIČKA, David NEČAS, Miloslav FRUMAR, Ivan OHLÍDAL a Martin PAVLIŠTA. Optical characterization of phase changing Ge2Sb2Te5 chalcogenide films. physica status solidi (c), Weinheim: WILEY-VCH Verlag GmbH, 2008, roč. 5, č. 5, s. 1324-1327. ISSN 1610-1634.
  74. FRANTA, Daniel, Ivan OHLÍDAL a David NEČAS. Optical quantities of rough films calculated by Rayleigh-Rice theory. physica status solidi (c), Weinheim: WILEY-VCH Verlag GmbH, 2008, roč. 5, č. 5, s. 1395–1398. ISSN 1610-1634.
  75. OHLÍDAL, Ivan, David NEČAS a Daniel FRANTA. Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies. physica status solidi (c), Weinheim: WILEY-VCH Verlag GmbH, 2008, roč. 5, č. 5, s. 1399–1402. ISSN 1610-1634.
  76. VALTR, Miroslav, Petr KLAPETEK, Vilma BURŠÍKOVÁ, Ivan OHLÍDAL a Daniel FRANTA. Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge. In 2nd Central European Symposium on Plasma Chemistry. 2008.
  77. VALTR, Miroslav, Petr KLAPETEK, Vilma BURŠÍKOVÁ, Ivan OHLÍDAL a Daniel FRANTA. Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge. Chem. listy, Praha: Česká společnost chemická, 2008, roč. 102, č. 16, s. 1529-1532. ISSN 0009-2770.
  78. 2007

  79. KLAPETEK, Petr, Ivan OHLÍDAL a Jiří BURŠÍK. Atomic force microscopy studies of cross-sections of columnar films. Measurement Science and Technology, Bristol, England: IOP Publishing, 2007, roč. 18, č. 2, s. 528-531. ISSN 0957-0233.
  80. FRANTA, Daniel, Vilma BURŠÍKOVÁ, Ivan OHLÍDAL, Pavel SŤAHEL, Miloslav OHLÍDAL a David NEČAS. Correlation of thermal stability of the mechanical and optical properties of diamond-like carbon films. Diamond and Related Materials, New York: Elsevier, 2007, roč. 16, 4-7, s. 1331–1335. ISSN 0925-9635.
  81. VALTR, Miroslav, Petr KLAPETEK, Ivan OHLÍDAL a Václav DUCHOŇ. Study of thickness reduction of a-C:H thin film under UV light irradiation. In Proceedings of ICPIG XXVIII Conference. Prague: Institute of Plasma Physics AS CR, 2007. s. 761-764, 4 s. ISBN 978-80-87026-01-4.
  82. VALTR, Miroslav, Petr KLAPETEK, Ivan OHLÍDAL a Daniel FRANTA. UV light enhanced oxidation of a-C:H thin film in air: A study of thickness reduction. Optoelectronics and Advanced Materials - Rapid Communications, Bucharest: INOE & INFM, 2007, roč. 1, č. 11, s. 620-624. ISSN 1842-6573.
  83. 2006

  84. OHLÍDAL, Ivan, Daniel FRANTA, Martin ŠILER, František VIŽĎA, Miloslav FRUMAR, Jaroslav JEDELSKÝ a Jaroslav OMASTA. Comparison of dispersion models in the optical characterization of As-S chalcogenide thin films. Journal of Non-Crystalline Solids, NORTH-HOLLAND, 2006, roč. 352, 52-54, s. 5633-5641. ISSN 0022-3093.
  85. FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Růžena NEPUSTILOVÁ a Svatopluk BAJER. Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy. Surface and Interface Analysis, USA: John Wiley & Sons, 2006, roč. 38, č. 4, s. 842-846. ISSN 0142-2421.
  86. FRANTA, Daniel a Ivan OHLÍDAL. Influence of lateral dimensions of the irregularities on the optical quantities of rough surfaces. Journal of Optics A: Pure and Applied Optics, Bristol, GB: IOP Publishing Ltd, 2006, roč. 8, č. 9, s. 763-774. ISSN 1464-4258.
  87. VALTR, Miroslav, Ivan OHLÍDAL a Daniel FRANTA. Optical characterization of carbon films prepared by PECVD using ellipsometry and reflectometry. Czech. J. Phys., Praha: Institute of Physics Academy of Sciences, 2006, roč. 56/2006, Suppl. B, s. 1103 - 1109. ISSN 0011-4626.
  88. 2005

  89. VALTR, Miroslav, Ivan OHLÍDAL a Petr KLAPETEK. AFM Study of Hydrocarbon Thin Films. In WDS'05 Proceedings of Contributed Papers: Part II - Physics of Plasmas and Ionized Media (ed. J. Safrankova). Praha: Matfyzpress, 2005. s. 391-396, 6 s. ISBN 80-86732-59-2.
  90. KLAPETEK, Petr a Ivan OHLÍDAL. Application of the wavelet transformation in AFM data analysis. Acta Physica Slovaca, Bratislava: Institute of Physics, SAS, 2005, roč. 55, č. 3, s. 295-303. ISSN 0323-0465.
  91. KLAPETEK, Petr, Ivan OHLÍDAL a Jindřich BÍLEK. Atomic Force Microscope Tip Influence on the Fractal and Multi-Fractal Analyses of the Properties of Randomly Rough Surafaces. In Nanoscale Calibration Standards and Methods: Dimensional and Related Measurements in the Micro-and Nanometer Range. Weinheim 2005: Wiley-VCH Verlag GmbH and Co. KGaA, 2005. s. 452-462, 11 s. ISBN 3-527-40502-X.
  92. KLAPETEK, Petr, Ivan OHLÍDAL, Alberto MONTAIGNE RAMIL, Alberta BONNANNI a Helmut SITTER. Atomic force microscopy analysis of morphology of the upper boundaries of GaN thin films prepared by MOCVD. Vacuum, USA: ELSEVIER (PERGAMON), 2005, roč. 80, 1-3, s. 53-57. ISSN 0042-207X.
  93. OHLÍDAL, Ivan, Daniel FRANTA a Petr KLAPETEK. Combination of optical methods and atomic force microscopy at characterization of thin film systems. Acta physica slovaca, Bratislava: Institute of Physics, SAS, 2005, roč. 55, č. 3, s. 271-294. ISSN 0323-0465.
  94. FRANTA, Daniel a Ivan OHLÍDAL. Comparison of effective medium approximation and Rayleigh-Rice theory concerning ellipsometric characterization of rough surfaces. Optics Communications, Amsterdam: Elsevier Science, 2005, roč. 248, č. 1, s. 459-467. ISSN 0030-4018.
  95. OHLÍDAL, Miloslav, L. ŠÍR, M. JÁKL a Ivan OHLÍDAL. Digital two-wavelength holographic interference microscopy for surface roughness measurement. In Proceedings of SPIE 5945, 14th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2005. s. 59450I-1-59450I-8, 8 s. ISBN 0-8194-5958-8.
  96. OHLÍDAL, Ivan, Daniel FRANTA a Petr KLAPETEK. Ellipsometry in characterization of thin films. In Proceedings of the SREN 2005. Bratislava, Slovakia: Comenius University, 2005. s. 81-111, 31 s. ISBN 80-223-2099-4.
  97. JAN, Mistrík, Ivan OHLÍDAL, Roman ANTOŠ, Mitsuru AOYAMA a Tomuo YAMAGUCHI. Evidence of refractive index change in glass substrates induced by high-density reactive ion plating deposition of SiO2 films. Applied Surface Science, USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 51-54. ISSN 0169-4332.
  98. FRANTA, Daniel a Ivan OHLÍDAL. Characterization of optical thin films exhibiting defects. In Advances in Optical Thin Films II. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2005. s. 59632H-1-59632H-12, 12 s. ISBN 0-8194-5981-X.
  99. OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA, Vlastimil ČUDEK, Vilma BURŠÍKOVÁ, Petr KLAPETEK a Kateřina PÁLENÍKOVÁ. Influence of technological conditions on mechanical stresses inside diamond-like carbon films. Diamond and Related Materials, New York: Elsevier Science S.A., 2005, roč. 14, 11-12, s. 1835-1838. ISSN 0925-9635.
  100. OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA, Vlastimil ČUDEK, Vilma BURŠÍKOVÁ a Martin ŠILER. Měření mechanického napětí v tenkých vrstvách pomocí kombinované optické metody. Jemná mechanika a optika, Přerov: Physical Institute, ASCR, 2005, roč. 50, č. 3, s. 72-75. ISSN 0447-6441.
  101. OHLÍDAL, Ivan, Daniel FRANTA a Petr KLAPETEK. Měření nanodrsnosti pomocí optických metod a mikroskopie atomové síly. In Kvalita a GPS 2005. Brno: Subkomise metrologie při TNK 7, 2005. s. 131-139, 9 s. ISBN 80-214-3033-8.
  102. ŠILER, Martin, Ivan OHLÍDAL, Daniel FRANTA, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Optical characterization of double layers containing epitaxial ZnSe and ZnTe films. Journal of Modern Optics, London, UK: Taylor and Francis, LtD, 2005, roč. 52, č. 4, s. 583-602. ISSN 0950-0340.
  103. OHLÍDAL, Miloslav, Vladimír ČUDEK, Ivan OHLÍDAL a Petr KLAPETEK. Optical characterization of non-uniform thin films using imaging spectrophotometry. In Advances in Optical Thin Films II. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2005. s. 596329-1-596329-9, 9 s. ISBN 0-8194-5981-X.
  104. FRANTA, Daniel, Ivan OHLÍDAL, Jan MISTÍK, Tomuo YAMAGUCHI, Gu Jin HU a Ning DAI. Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions. Applied Surface Science, USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 338-342. ISSN 0169-4332.
  105. FRANTA, Daniel, Ivan OHLÍDAL a David PETRÝDES. Optical Characterization of TiO2 Thin Films by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Photometry. Vacuum, USA: ELSEVIER (PERGAMON), 2005, roč. 80, 1-3, s. 159-162. ISSN 0042-207X.
  106. OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA, Vladimír ČUDEK, Vilma BURŠÍKOVÁ a Petr KLAPETEK. Optical measurement of mechanical stresses in diamond-like carbon films. In 8-th International Symposium on Laser Metrology. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2005. s. 717-728, 12 s. ISBN 0-8194-5757-4.
  107. FRANTA, Daniel, Beatrice NEGULESCU, Luc THOMAS, Pierre Richard DAHOO, Marcel GUYOT, Ivan OHLÍDAL, Jan MISTRÍK a Tomuo YAMAGUCHI. Optical properties of NiO thin films prepared by pulsed laser deposition technique. Applied Surface Science, USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 426-430. ISSN 0169-4332.
  108. MISTRÍK, Jan, Tomuo YAMAGUCHI, Daniel FRANTA, Ivan OHLÍDAL, Gu Jin HU a Ning DAI. Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry. Applied Surface Science, USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 431-434. ISSN 0169-4332.
  109. KLAPETEK, Petr, Ivan OHLÍDAL a Jiří BURŠÍK. Scanning thermal microscopy - theory and applications. Jemná mechanika a optika, Přerov: Physical Institute, ASCR, 2005, roč. 50, 11-12, s. 327-329. ISSN 0447-6441.
  110. ANTOŠ, Roman, Ivan OHLÍDAL, Daniel FRANTA, Petr KLAPETEK, Jan MISTÍK, Tomuo YAMAGUCHI a Štefan VIŠŇOVSKÝ. Spectroscopic ellipsometry of sinusoidal surface-relief gratings. Applied Surface Science, USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 221-224. ISSN 0169-4332.
  111. ANTOŠ, Roman, Ivan OHLÍDAL, Jan MISTRÍK, K. MURAKAMI, Tomuo YAMAGUCHI, J. PIŠTORA, M. HORIE a Štefan VIŠŇOVSKÝ. Spectroscopic ellipsometry on lamellar gratings. Applied Surface Science, USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 225-229. ISSN 0169-4332.
  112. ANTOŠ, Roman, Jaromír PIŠTORA, Ivan OHLÍDAL, Kamil POSTAVA, Jan MISTRÍK, Tomuo YAMAGUCHI a Štefan VIŠŇOVSKÝ. Specular spectroscopic ellipsometry for the critical dimension monitoring of gratings fabricated on a thick transparent plate. Journal of Applied Physics, USA: American Institute of Physics, 2005, roč. 97, č. 5, s. 053107-1-053107-7. ISSN 0021-8979.
  113. FRANTA, Daniel, Vilma BURŠÍKOVÁ, Ivan OHLÍDAL, Lenka ZAJÍČKOVÁ a Pavel SŤAHEL. Thermal stability of the optical properties of plasma deposited diamond-like carbon thin films. Diamond and Related Materials, New York: Elsevier Science S.A., 2005, roč. 14, 11-12, s. 1795-1798. ISSN 0925-9635.
  114. 2004

  115. KLAPETEK, Petr, Ivan OHLÍDAL a Karel NAVRÁTIL. Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation. Microchimica Acta, Wien: Springer-Verlag, 2004, roč. 147, č. 3, s. 175-180. ISSN 0026-3672.
  116. FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK a Pere ROCA I CABARROCAS. Complete Characterization of Rough Polymorphous Silicon Films by Atomic Force Microscopy and the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry. Thin Solid Films, Oxford, UK: Elsevier science, 2004, roč. 455-456, č. 1, s. 399-403. ISSN 0040-6090.
  117. FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK a Miloslav OHLÍDAL. Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy. Surface and Interface Analysis, USA: John Wiley & Sons., 2004, roč. 36, č. 8, s. 1203-1206. ISSN 0142-2421.
  118. OHLÍDAL, Ivan, Daniel FRANTA, Miroslav FRUMAR, Jaroslav JEDELSKÝ a Jaroslav OMASTA. Influence of Composition, Exposure and Thermal Annealing on Optical Properties of As-S Chalcogenide Thin Films. Journal of Optoelectronics and Advanced Materials, Bucharest: INOE & INFM, 2004, roč. 6, č. 1, s. 139-148. ISSN 1454-4164.
  119. KLAPETEK, Petr, Ivan OHLÍDAL a Jindřich BÍLEK. Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces. Ultramicroscopy, Amsterdam: Elsevier, 2004, roč. 102, č. 1, s. 51-59. ISSN 0304-3991.
  120. OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA, Vladimír ČUDEK, Vilma BURŠÍKOVÁ a Martin ŠILER. Mechanical stresses studied by optical methods in diamond-like carbon films containing Si and O. In SPIE's 49th Annual Meeting. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2004. s. 139-147, 9 s. ISBN 0-8194-5465-6.
  121. FRANTA, Daniel, Ivan OHLÍDAL, Vilma BURŠÍKOVÁ a Lenka ZAJÍČKOVÁ. Optical Properties of Diamond-Like Carbon Films Containing SiOx Studied by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry. Thin Solid Films, Oxford, UK: Elsevier science, 2004, roč. 455-456, č. 1, s. 393-398. ISSN 0040-6090.
  122. FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Optical properties of ZnTe films prepared by molecular beam epitaxy. Thin Solid Films, Oxford, UK: Elsevier, 2004, roč. 468, 1-2, s. 193-202. ISSN 0040-6090.
  123. 2003

  124. OHLÍDAL, Ivan, Petr KLAPETEK a Daniel FRANTA. Aplikace mikroskopie atomové síly při analýze tenkých vrstev ZnSe a ZnTe. Československý časopis pro fyziku, Praha: Fyzikální ústav AV ČR, 2003, roč. 53, č. 2, s. 97-100. ISSN 0009-0700.
  125. KLAPETEK, Petr, Ivan OHLÍDAL, Daniel FRANTA, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial films. Acta Physica Slovaca, Bratislava: Institute of Physics, SAS, 2003, roč. 53, č. 3, s. 223-230. ISSN 0323-0465.
  126. KLAPETEK, Petr, Ivan OHLÍDAL, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial thin films. Japanese Journal of Applied Physics, Tokyo: Institute of Pure and Applied Physics, 2003, roč. 42, 7B, s. 4706-4709. ISSN 0021-4922.
  127. FRANTA, Daniel, Ivan OHLÍDAL, Miloslav FRUMAR a Jaroslav JEDELSKÝ. Expression of the optical constants of chalcogenide thin films using the new parameterization dispersion model. Applied Surface Science, USA: ELSEVIER (NORTH-HOLLAND), 2003, roč. 212-213, č. 1, s. 116-121. ISSN 0169-4332.
  128. OHLÍDAL, Ivan, Miloslav OHLÍDAL, Petr KLAPETEK, Vladimír ČUDEK a Miloš JÁKL. Characterization of thin films non-uniform in optical parameters by spectroscopic digital reflectometry. Proceedings of SPIE, Bellingham: SPIE, 2003, roč. 5182, č. 2, s. 260-271. ISSN 0277-786X.
  129. ŠILER, Martin, Ivan OHLÍDAL a Petr KLAPETEK. Mikroskopie magnetické síly: Aplikace při studiu pevných disků. Československý časopis pro fyziku, Praha: Fyzikální ústav AV ČR, 2003, roč. 53, č. 2, s. 124-127. ISSN 0009-0700.
  130. FRANTA, Daniel, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ a Ivan OHLÍDAL. New Dispersion Model of the Optical Constants of the DLC Films. Acta Physica Slovaca, Bratislava: Institute of Physics, SAS, 2003, roč. 53, č. 5, s. 373-384. ISSN 0323-0465.
  131. OHLÍDAL, Miloslav, Ivan OHLÍDAL, Petr KLAPETEK, Miloš JÁKL, Vladimír ČUDEK a Marek ELIÁŠ. New Method for the Complete Optical Analysis of Thin Films Nonuniform in Optical Parameters. Japanese Journal of Applied Physics, Tokyo: Institute of Pure and Applied Physics, 2003, roč. 42, 7B, s. 4760-4765. ISSN 0021-4922.
  132. FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Optical constants of ZnTe and ZnSe epitaxial thin films. Acta Physica Slovaca, Bratislava: Institute of Physics SAS, 2003, roč. 53, č. 2, s. 95-104. ISSN 0323-0465.
  133. FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Optical characterization of ZnSe thin films. In 19th Congress of the International Commission for Optics: Optics for the Quality of Life. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2003. s. 831-832, 2 s. ISBN 0-8194-4596-7.
  134. FRANTA, Daniel, Ivan OHLÍDAL, Vilma BURŠÍKOVÁ a Lenka ZAJÍČKOVÁ. Optical properties of diamond-like carbon films containing SiOx. Diamond and Related Materials, Amsterdam: Elsevier, 2003, roč. 12, č. 9, s. 1532-1538. ISSN 0925-9635.
  135. KLAPETEK, Petr a Ivan OHLÍDAL. Srovnání snímků NSOM a AFM při studiu vybraných objektů. Československý časopis pro fyziku, Praha: Fyzikální ústav AV ČR, 2003, roč. 47, 6-7s, s. 79-81. ISSN 0009-0700.
  136. KLAPETEK, Petr a Ivan OHLÍDAL. Theoretical analysis of the atomic force microscopy characterization of columnar thin films. Ultramicroscopy, Amsterdam: Elsevier, 2003, roč. 94, č. 1, s. 19-29. ISSN 0304-3991.
  137. 2002

  138. KLAPETEK, Petr, Ivan OHLÍDAL, Daniel FRANTA a Pavel POKORNÝ. Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method. Surface and Interface Analysis, USA: John Wiley & Sons, 2002, roč. 34, č. 1, s. 559-564. ISSN 0142-2421.
  139. ŠILER, Martin, Petr KLAPETEK a Ivan OHLÍDAL. Aplikace mikroskopie magnetické síly při studiu záznamového prostředí pevných disků. Jemná mechanika a optika, Přerov: Physical Institute, ASCR, 2002, roč. 47, 6-7, s. 216-219. ISSN 0447-6441.
  140. KLAPETEK, Petr, Ivan OHLÍDAL a Daniel FRANTA. Applications of atomic force microscopy for thin film boundary measurements. Jemná mechanika a optika, Přerov: Physical Institute, ASCR, 2002, roč. 47, 6-7, s. 195-199. ISSN 0447-6441.
  141. FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK a Pavel POKORNÝ. Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods. Surface and Interface Analysis, USA: John Wiley & Sons, 2002, roč. 34, č. 1, s. 759-762. ISSN 0142-2421.
  142. FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Influence of overlayers on determination of the optical constants of ZnSe thin films. Journal of Applied Physics, USA: American institute of physics, 2002, roč. 92, č. 4, s. 1873-1880. ISSN 0021-8979.
  143. FRANTA, Daniel, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL, Jan JANČA a Kateřina VELTRUSKÁ. Optical characterization of diamond like carbon films using multi-sample modification of variable angle spectroscopic ellipsometry. Diamond and Related Materials, Amsterdam: Elsevier, 2002, roč. 11, č. 1, s. 105-117. ISSN 0925-9635.
  144. OHLÍDAL, Miloslav, Ivan OHLÍDAL, Daniel FRANTA, Tomáš KRÁLÍK, Miloš JÁKL a Marek ELIÁŠ. Optical characterization of thin films non-uniform in thickness by a multiple-wavelength reflectance method. Surface and Interface Analysis, USA: John Wiley & Sons, 2002, roč. 34, č. 1, s. 660-663. ISSN 0142-2421.
  145. 2001

  146. FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Pavel POKORNÝ a Miloslav OHLÍDAL. Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy. Surface and Interface Analysis, USA: John Wiley & Sons, 2001, roč. 32, č. 1, s. 91-94. ISSN 0142-2421.
  147. FRANTA, Daniel a Ivan OHLÍDAL. Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation. In 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2001. s. 207-212, 6 s. ISBN 0-8194-4047-7.
  148. OHLÍDAL, Ivan, Daniel FRANTA, Miroslav FRUMAR, Jaroslav JEDELSKÝ a Karel NAVRÁTIL. Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method. Journal of Optoelectronics and Advanced Materials, Bucharest: INOE & INFM, 2001, roč. 3, č. 4, s. 873-878. ISSN 1454-4164.
  149. OHLÍDAL, Ivan, Daniel FRANTA, Miloslav OHLÍDAL a Karel NAVRÁTIL. Determination of Thicknesses and Spectral Dependences of Refractive Indices of Non-Absorbing and Weakly Absorbing Thin Films Using the Wavelengths Related to Extrema in Spectral Reflectances. Vacuum, USA: ELSEVIER (PERGAMON), 2001, roč. 61, č. 1, s. 285-289. ISSN 0042-207X.
  150. OHLÍDAL, Ivan, Daniel FRANTA a Petr KLAPETEK. Měření základních statistických veličin náhodné povrchové drsnosti pomocí mikroskopie atomové síly. Československý časopis pro fyziku, Praha: Fyzikální ústav AV ČR, 2001, roč. 51, č. 1, s. 16-21. ISSN 0009-0700.
  151. FRANTA, Daniel, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL a Jan JANČA. Optical Characterization of Diamond-like Carbon Films. Vacuum, USA: ELSEVIER (PERGAMON), 2001, roč. 61, 2-4, s. 279-283. ISSN 0042-207X.
  152. FRANTA, Daniel, Ivan OHLÍDAL, Miloslav FRUMAR a Jaroslav JEDELSKÝ. Optical Characterization of Chalcogenide Thin Films. Applied Surface Science, USA: ELSEVIER (NORTH-HOLLAND), 2001, roč. 175-176, č. 1, s. 555-561. ISSN 0169-4332.
  153. OHLÍDAL, Ivan, Daniel FRANTA, Miloslav OHLÍDAL a Karel NAVRÁTIL. Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances. Applied Optics, USA: Optical Society of America, 2001, roč. 40, č. 31, s. 5711-5717. ISSN 0003-6935.
  154. KLAPETEK, Petr, Daniel FRANTA a Ivan OHLÍDAL. Study of Thin Film Defects by Atomic Force Microscopy. In Proceedings of the 4th Seminar on Quantitative Microscopy and 1st Seminar on Nanoscale Calibration Standards and Methods. Braunschweig: Physikalisch-Technische Bundesanstalt, 2001. s. 107-117, 11 s. ISBN 3-89701-840-3.
  155. KLAPETEK, Petr, Ivan OHLÍDAL a Daniel FRANTA. Vliv diskrétní Fourierovy transformace na zpracování AFM dat. Československý časopis pro fyziku, Praha: Fyzikální ústav AV ČR, 2001, roč. 51, č. 1, s. 49-51. ISSN 0009-0700.
  156. 2000

  157. FRANTA, Daniel, Ivan OHLÍDAL a Petr KLAPETEK. Analysis of Slightly Rough Thin Films by Optical Methods and AFM. Mikrochim. Acta, Wien: Springer-Verlag, 2000, roč. 132, č. 1, s. 443-447. ISSN 0026-3672.
  158. FRANTA, Daniel a Ivan OHLÍDAL. Analysis of thin films by optical multi-sample methods. Acta Physica Slovaca, Bratislava: Institute of Physics, SAS, 2000, roč. 50, č. 4, s. 411-421. ISSN 0323-0465.
  159. OHLÍDAL, Ivan, Daniel FRANTA a Petr KLAPETEK. Atomic force microscopy measurements of surface roughness quantities important in optics of surfaces and thin films. In Proceedings of the 4th Seminar on Quantitative Microscopy. Braunschweig: Physikalisch-Technische Bundesanstalt, 2000. s. 124-131, 8 s. ISBN 3-89701-503-X.
  160. OHLÍDAL, Ivan a Daniel FRANTA. Ellipsometry of Thin Film Systems. In Progress in Optics, Vol. 41 (Ed. E. Wolf). 1. vyd. Amsterdam: Elsevier, 2000. s. 181-282, 102 s. ISBN 0-444-568-7.
  161. OHLÍDAL, Ivan a Daniel FRANTA. Matrix formalism for imperfect thin films. Acta physica slovaca, Bratislava: Institute of Physics, SAS, 2000, roč. 50, č. 4, s. 489-500. ISSN 0323-0465.
  162. FRANTA, Daniel a Ivan OHLÍDAL. Optical characterization of inhomogeneous thin films of ZrO2 by spectroscopic ellipsometry and spectroscopic reflectometry. Surface and Interface Analysis, USA: John Wiley & Sons, 2000, roč. 30, č. 1, s. 574-579. ISSN 0142-2421.
  163. PAVELKA, Radek, Ivan OHLÍDAL, Jan HLÁVKA, Daniel FRANTA a Helmut SITTER. Optical characterization of thin films with randomly rough boundaries using the photovoltage method. Thin Solid Films, UK Oxford: Elsevier science, 2000, roč. 366, č. 1, s. 43-50. ISSN 0040-6090.
  164. 1999

  165. OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA a Miroslav TYKAL. Comparison of optical and non-optical methods for measuring surface roughness. In Proceedings of SPIE 3820, 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1999. s. 456-467. ISBN 0-8194-3306-3.
  166. OHLÍDAL, Ivan, Daniel FRANTA, Emil PINČÍK a Miloslav OHLÍDAL. Complete Optical Characterization of the SiO2/Si System by Spectroscopic Ellipsometry Spectroscopic Reflectometry and Atomic Force Microscopy. Surface and Interface Analysis, USA: John Wiley & Sons, 1999, roč. 28, č. 1, s. 240-244. ISSN 0142-2421.
  167. OHLÍDAL, Miloslav, Marek UNČOVSKÝ, Ivan OHLÍDAL a Daniel FRANTA. Determination of the basic parameters characterizing the roughness of metal surfaces by laser light scattering. Journal of modern optics, Londýn: Taylor & Francis Ltd., 1999, roč. 46, č. 2, s. 279-293. ISSN 0950-0340.
  168. OHLÍDAL, Miloslav, Ivan OHLÍDAL, Miroslav TYKAL, Dominik PRAŽÁK a Marek UNČOVSKÝ. Měření drsnosti povrchu ve strojírenství vybranými metodami koherenční optiky. Jemná mechanika a optika, Přerov: Physical Institute, ASCR, 1999, roč. 44, č. 9, s. 259-267. ISSN 0447-6441.
  169. OHLÍDAL, Miloslav, Josef VRÁNA, Aleš MICHÁLEK, Dominik PRAŽÁK, Miloš JÁKL a Ivan OHLÍDAL. New Ways od Observing Optical Inhomogeneities in Glass. In Proceedings of the 5th ESG Conference: Glass Science and Technology for the 21st Century. Prague, Czech Republic: The Czech Glass Society, 1999. s. 107-111. ISBN 80-238-3861-x.
  170. OHLÍDAL, Ivan, František VIŽĎA a Miloslav OHLÍDAL. Optical characterization of multilayer systems with randomly rough boundaries. In 18th Congress of the International Commision for Optics: Optics for the Next Millennium. Billingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1999. s. 150-151. SPIE Volume 3749. ISBN 0-8194-3234-2.
  171. OHLÍDAL, Ivan. Optical methods for surface characterization. In 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1999. s. 429-440. SPIE Proceeding Series, Volume 3820. ISBN 0-8194-3306-3.
  172. OHLÍDAL, Ivan a František VIŽĎA. Optical quantities of multilayer systems with correlated randomly rough boundaries. Journal of modern optics, Londýn: Taylor & Francis Ltd., 1999, roč. 46, č. 14, s. 2043-2062. ISSN 0950-0340.
  173. OHLÍDAL, Ivan, Daniel FRANTA, Petr KLAPETEK a Martin VIČAR. Relationship Between AFM and Optical Measurements at Analyzing Surface Roughness. Jemná mechanika a optika, Přerov: Physical Institute, ASCR, 1999, roč. 44, č. 10, s. 307-311. ISSN 0447-6441.
  174. OHLÍDAL, Ivan. Úplná optická charakterizace neabsorbujících dvojvrstev a trojvrstev pomocí víceúhlové elipsometrie. Jemná mechanika a optika, Přerov: Physical Institute, ASCR, 1999, roč. 1999, č. 2, s. 53-57. ISSN 0447-6441.
  175. 1998

  176. OHLÍDAL, Ivan, Daniel FRANTA, Jaroslav HORA, Karel NAVRÁTIL, Jan WEBER a Pavel JANDA. Analysis of thin films with slightly rough boundaries. Mikrochim. Acta, Wien: Springer-Verlag, 1998, Suppl. 15, č. 1, s. 177-180. ISSN 0026-3672.
  177. OHLÍDAL, Ivan, Daniel FRANTA, Miloslav OHLÍDAL, Martin VIČAR a Petr KLAPETEK. Comparison of AFM and optical methods at measuring nanometric surface roughness. In Proceedings of the 3th Seminar on Quantitative Microscopy. Braunschweig, SRN: Physikalisch-Technische Bundesanstalt, 1998. s. 123-129. ISBN 3-89701-280-4.
  178. FRANTA, Daniel a Ivan OHLÍDAL. Ellipsometric parameters and reflectances of thin films with slightly rough boundaries. Journal of modern optics, Londýn: Taylor & Francis Ltd., 1998, roč. 45, č. 5, s. 903-934. ISSN 0950-0340.
  179. OHLÍDAL, Ivan a Daniel FRANTA. Ellipsometry of thin films. Acta Physica Slovaca, Bratislava: Institute of Physics, SAS, 1998, roč. 48, č. 4, s. 459-468. ISSN 0323-0465.
  180. PAVELKA, Radek, Jan HLÁVKA, Ivan OHLÍDAL a Helmut SITTER. Optical parameter analysis of thin absorbing films measured by the photovoltage method. Acta physica polonica A, Jaszowiec, Polsko: Intern.School on Physics of Semicond.Com, 1998, roč. 94, č. 3, s. 468-472.
  181. OHLÍDAL, Ivan a Miloslav OHLÍDAL. Rubidium Bromide (RbBr). In Handbook of Optical Constants of Solids III. San Diego: Academic Press, 1998. s. 845-855. ISBN 0-12-544423-0.
  182. OHLÍDAL, Ivan a Daniel FRANTA. Rubidium lodide (RbI). In Handbook of Optical Constants of Solids III. San Diego, USA: Academic Press, 1998. s. 857-870. ISBN 0-12-544423-0.
  183. OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA, Miroslav TYKAL, Dominik PRAŽÁK a Aleš MICHÁLEK. Srovnání výsledků měření drsnosti povrchu dosažených vybranými optickými metodami a metodou profilometrickou. Jemná mechanika a optika, Přerov: Physical Institute, ASCR, 1998, roč. 43, č. 4, s. 130-136. ISSN 0447-6441.
  184. FRANTA, Daniel a Ivan OHLÍDAL. Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries. Optics Communications, Amsterdam: Elsevier Science, 1998, roč. 147, č. 1, s. 349-358. ISSN 0030-4018.
  185. 1997

  186. OHLÍDAL, Ivan, Daniel FRANTA, Bohuslav REZEK a Miloslav OHLÍDAL. Analysis of single layers placed on slightly rough surfaces by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy. In ECASIA 97 - 7th European Conference on Applications of Surface and Interface Analysis. Chichester, England, UK: John Willey & Sons, 1997. s. 1051-1054. ISBN 0-471-97827-2.
  187. OHLÍDAL, Ivan a Karel NAVRÁTIL. Optical analysis of weakly absorbing inhomogeneous thin films by means of the envelope method of spectroscopic reflectometry. Jemná mechanika a optika, Přerov: Physical Institute, ASCR, 1997, roč. 42, č. 3, s. 76-79. ISSN 0447-6441.
  188. 1996

  189. OHLÍDAL, Ivan, Miloslav OHLÍDAL, Daniel FRANTA a Aleš MICHÁLEK. Method of shearing interferometry for characterizing non-gaussian randomly rough surfaces. In Specification, Production, and Testing of Optical Components and Systems. USA: SPIE - The International Society for Optical Engineering, 1996. s. 442-451. ISBN 0-8194-2160-X.
  190. HLÁVKA, Jan, Ivan OHLÍDAL a František VIŽĎA. New Technique of Measurement of Optical Parameters of thin Films. Thin Solid Films, Oxford, UK: Elsevier science, 1996, roč. 279, s. 209-212. ISSN 0040-6090.
  191. ZAJÍČKOVÁ, Lenka, Ivan OHLÍDAL a Jan JANČA. Plasma Enhanced Chemical Vapour Deposition of Thin Films from Tetraethoxysilane and Methanol: Optical Properties and XPS Analyses. Thin Solid Films, UK Oxford: Elsevier science, 1996, roč. 1996, č. 280, s. 26-36. ISSN 0040-6090.
  192. OHLÍDAL, Ivan, Daniel FRANTA a Jaroslav HORA. Spectroscopic Ellipsometry of Slightly Rough Surfaces Covered by Layers. In ECASIA 95 - 6th European Conference on Applications of Surface and Interface Analysis. Chichester, England, UK: John Willey & Sons, 1996. s. 823-826, 4 s. ISBN 0-471-95899-9.
  193. FRANTA, Daniel, Ivan OHLÍDAL, Jaroslav HORA a Karel NAVRÁTIL. Spektroskopická elipsometrie slabě drsných povrchů. In 12. konference českých a slovenských fyziků. Ostrava: Fyzikální vědecká sekce Jednoty českých matematiků a fyziků, 1996. s. 482-485.
  194. 1995

  195. OHLÍDAL, Miloslav, Ivan OHLÍDAL, Miloslav DRUCKMÜLLER a Daniel FRANTA. A method of shearing interferometry for determining the statistical quantities of randomly rough surfaces of solids. Pure Appl. Opt., UK: Publishing Ltd, 1995, roč. 4, č. 5, s. 599-616. ISSN 0963-9659.
  196. OHLÍDAL, Miloslav, Ivan OHLÍDAL, Miloslav DRUCKMÜLLER a Daniel FRANTA. Interferometry of Randomly Rough Surfaces. In Photonics '95. Czech Republic: European Optical Society, 1995. s. 109-111.
  197. OHLÍDAL, Ivan, František VIŽĎA a Miloslav OHLÍDAL. Optical analysis by means of spectroscopic reflectometry of single and double layers with correlated randomly rough boundaries. Optical Engineering, 1995, roč. 34, č. 6, s. 1761-1768. ISSN 0091-3286.
  198. OHLÍDAL, Ivan, Karel NAVRÁTIL a Miloslav OHLÍDAL. Scattering of Light from Multilayer Systems with Rough Boundaries. In Progress in Optics, Vol. 34 (Ed. E. Wolf). Amsterdam: Elsevier, 1995. s. 249-331. ISBN 0 444 82140 6.
  199. 1994

  200. OHLÍDAL, Ivan a Karel NAVRÁTIL. Characterization of the basic statistical properties of very rough surfaces of transparent solids by immersion shearing interferometry. Applied Optics, USA: Optical Society of America, 1994, roč. 33(1994), č. 34, s. 7838-7945. ISSN 0003-6935.
  201. OHLÍDAL, Ivan a František VIŽĎA. Optical characterization of single and double layers with correlated randomly rough boundaries. In Optical Interference Coatings. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1994. s. 1143-1151. SPIE Proceedings Series, Volume 2253. ISBN 0-8194-1562-6.
  202. 1993

  203. OHLÍDAL, Ivan. Approximate formulas for the reflectance, transmittance and scattering losses of nonabsorbing multilayers systems with randomly rough boundaries. J. Opt. Soc. Am. A, USA: Optical Society of America, 1993, roč. 10(1993), č. 1, s. 158-171. ISSN 0740-3233.
  204. MUSILOVÁ, Jana a Ivan OHLÍDAL. Influence of defects of thin films on determining their thickness by the method based on white light interference. J. Phys. D: Appl. Phys., 1993, roč. 25(1992), č. 1, s. 1131-1138. ISSN 0022-3727.
  205. HOLÝ, Václav, Josef KUBĚNA a Ivan OHLÍDAL. The diffuse x-ray scattering in real periodical superlatices. Superlattices and Microstructures, 1993, roč. 12, č. 1, s. 25-35. ISSN 0749-6036.
  206. HOLÝ, Václav, Josef KUBĚNA a Ivan OHLÍDAL. X-ray reflection from rough layered systems. Phys. Rev. B, 1993, roč. 47, č. 23, s. 15896-16798. ISSN 0163-1829.
  207. 1991

  208. OHLÍDAL, Ivan a Karel NAVRÁTIL. Sodium Fluoride (NaF). In Handbook of Optical Constants of Solids II. San Diego: Academic Press, 1991. s. 1021-1034. ISBN 0-12-544422-2.
  209. OHLÍDAL, Ivan a Karel NAVRÁTIL. Thorium Fluoride (ThF4). In Handbook of Optical Constants of Solids II. San Diego: Academic Press, 1991. s. 1049-1058. ISBN 0-12-544422-2.
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